公开(公告)号：US10990063B2

公开(公告)日：2021-04-27

申请号：US16552988

申请日：2019-08-27

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： Jeho Nam

IPC: G01B9/021 ,  G03H1/22 ,  G06T7/00

Abstract: The present description may provide a method of generating a hologram measurement pattern for measuring image quality of holographic display, including: generating a test pattern and a common pattern including at least one grayscale bar; generating measurement pattern data by combining the common pattern with a frame of the test pattern; and generating the hologram measurement pattern by inserting a random phase into the measurement pattern data and an apparatus applied thereto, thereby more accurately measuring the quality of the 3D holographic image reproduced by the holographic display.

公开(公告)号：US10606214B2

公开(公告)日：2020-03-31

申请号：US15987704

申请日：2018-05-23

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： Jeho Nam ,  Jin Woong Kim

IPC: G03H1/22 ,  H04N17/04

Abstract: An apparatus for measuring a spatial resolution of a hologram reconstructed image optically reconstructed on a space is provided. The apparatus for measuring a spatial resolution of a hologram reconstructed image includes: a measuring unit measuring first spatial frequency resolving powers for a horizontal direction of the hologram reconstructed image and second spatial frequency resolving powers for a vertical direction of the hologram reconstructed image at first spatial positions having a predetermined interval in horizontal and vertical directions within a viewing angle range of the hologram reconstructed image; and an evaluating unit evaluating the spatial resolution of the hologram reconstructed image using the first spatial frequency resolving powers and the second spatial frequency resolving powers measured at each of the first spatial positions.