公开(公告)号：US20240144512A1

公开(公告)日：2024-05-02

申请号：US18494906

申请日：2023-10-26

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： Hye Jin S. KIM ,  Ji Yeon SON

IPC: G06T7/62 ,  G01C3/02 ,  G06T7/50

CPC classification number: G06T7/62 ,  G01C3/02 ,  G06T7/50 ,  G06T2207/20081

Abstract: Disclosed are an apparatus and method for measuring a dimension. The method of measuring a dimension according to an aspect of the present invention includes photographing a target object and generating an image, normalizing the image of the target object, generating normalized estimated dimension information about the target object from the normalized image of the target object using a pre-trained dimension prediction model, and converting the normalized estimated dimension information of the target object into estimated dimension information of the target object.