Resist underlayer composition and method for forming pattern using same
    1.
    发明授权
    Resist underlayer composition and method for forming pattern using same 有权
    抗蚀剂底层组合物和使用其形成图案的方法

    公开(公告)号:US09416296B2

    公开(公告)日:2016-08-16

    申请号:US14779769

    申请日:2014-03-24

    摘要: An under-layer composition of resist having superior thermal stability, etching resistance, gap-filling property and void-preventing property, and a method for forming pattern using the same are disclosed. The under-layer composition of resist comprises: an aromatic ring containing polymer having the repeating unit of the following Formula 1; a compound of the following Formula 4; and an organic solvent. in Formula 1, R1 is a monocyclic or polycyclic aromatic hydrocarbon group having 5 to 20 carbon atoms, R2 and R3 is independently a monocyclic or polycyclic aromatic hydrocarbon group having 4 to 14 carbon atoms, a is an integer of 1 to 3, and b is an integer of 0 to 2. in Formula 4, n is an integer of 1 to 250.

    摘要翻译: 公开了具有优异的热稳定性,耐蚀刻性,间隙填充性和防空气性的抗蚀剂的底层组合物,以及使用其形成图案的方法。 抗蚀剂的底层组合物包含:含有下式1的重复单元的含芳环的聚合物; 下式4的化合物; 和有机溶剂。 在式1中,R 1为碳原子数为5〜20的单环或多环芳香族烃基,R 2和R 3独立地为碳原子数4〜14的单环或多环芳香族烃基,a为1〜3的整数,b为1〜 是0〜2的整数。在式4中,n为1〜250的整数。