公开(公告)号：US20230360720A1

公开(公告)日：2023-11-09

申请号：US18193351

申请日：2023-03-30

Applicant: DEEPX CO., LTD.

Inventor： Lok Won KIM ,  Jeong Kyun YIM

IPC: G11C29/00 ,  G11C29/10

CPC classification number: G11C29/78 ,  G11C29/10

Abstract: A neural processing unit (NPU) for testing a component during runtime is provided. The NPU may include a plurality of functional components including a first functional component and a second functional component. At least one of the plurality of functional components may be driven for calculation of an artificial neural network. Another one of the plurality of functional components may be selected as a component under test (CUT). A scan test may be performed on the at least one functional component selected as the CUT. A tester for detecting a defect of an NPU is also provided. The tester may include a component tester configured to communicate with at least one functional component of the NPU, select the at least one functional component as a CUT, and perform a scan test for the selected CUT.

公开(公告)号：US20240321384A1

公开(公告)日：2024-09-26

申请号：US18678072

申请日：2024-05-30

Applicant: DEEPX CO., LTD.

Inventor： Lok Won KIM ,  Jeong Kyun YIM

IPC: G11C29/00 ,  G05B19/418 ,  G06F11/26 ,  G11C29/10

CPC classification number: G11C29/78 ,  G05B19/41875 ,  G06F11/26 ,  G11C29/10 ,  G05B2219/32368 ,  G05B2219/45031

Abstract: A neural processing unit (NPU) for testing a component during runtime is provided. The NPU may include a plurality of functional components including a first functional component and a second functional component. At least one of the plurality of functional components may be driven for calculation of an artificial neural network. Another one of the plurality of functional components may be selected as a component under test (CUT). A scan test may be performed on the at least one functional component selected as the CUT. A tester for detecting a defect of an NPU is also provided. The tester may include a component tester configured to communicate with at least one functional component of the NPU, select the at least one functional component as a CUT, and perform a scan test for the selected CUT.

公开(公告)号：US20240274224A1

公开(公告)日：2024-08-15

申请号：US18628041

申请日：2024-04-05

Applicant: DEEPX CO., LTD.

Inventor： Lok Won KIM ,  Jeong Kyun YIM

IPC: G11C29/00 ,  G05B19/418 ,  G06F11/26 ,  G11C29/10

CPC classification number: G11C29/78 ,  G05B19/41875 ,  G06F11/26 ,  G11C29/10 ,  G05B2219/32368 ,  G05B2219/45031

Abstract: A neural processing unit (NPU) is capable of testing a component of the NPU in a running system, i.e., during runtime. The NPU includes a plurality of functional components, each of which includes an electronic circuit; at least one wrapper connected to at least one of the functional components; and an in-system component tester (ICT). The ICT performs a selection of one of the at least one functional component, in an idle state, as a component under test (CUT) and performs a test, via the at least one wrapper, of the selected functional component. The ICT may monitor states of the plurality of the functional components via the at least one wrapper, stop the test based on a detection of a collision due to an access to the selected functional component, and return a connection of the selected functional component to the at least one wrapper according to the stop.

公开(公告)号：US20230360719A1

公开(公告)日：2023-11-09

申请号：US18193313

申请日：2023-03-30

Applicant: DEEPX CO., LTD.

Inventor： Lok Won KIM ,  Jeong Kyun YIM

IPC: G11C29/00 ,  G11C29/10

CPC classification number: G11C29/78 ,  G11C29/10

Abstract: A neural processing unit (NPU) for testing a component during runtime is provided. The NPU may include a plurality of functional components including a first functional component and a second functional component. At least one of the plurality of functional components may be driven for calculation of an artificial neural network. Another one of the plurality of functional components may be selected as a component under test (CUT). A scan test may be performed on the at least one functional component selected as the CUT. A tester for detecting a defect of an NPU is also provided. The tester may include a component tester configured to communicate with at least one functional component of the NPU, select the at least one functional component as a CUT, and perform a scan test for the selected CUT.

公开(公告)号：US20230359180A1

公开(公告)日：2023-11-09

申请号：US17849667

申请日：2022-06-26

Applicant: DEEPX CO., LTD.

Inventor： Lok Won KIM ,  Jeong Kyun YIM

IPC: G05B19/418

CPC classification number: G05B19/41875 ,  G05B2219/32368 ,  G05B2219/45031

Abstract: A neural processing unit (NPU) is capable of testing a component of the NPU in a running system, i.e., during runtime. The NPU includes a plurality of functional components, each of which includes an electronic circuit; at least one wrapper connected to at least one of the functional components; and an in-system component tester (ICT). The ICT performs a selection of one of the at least one functional component, in an idle state, as a component under test (CUT) and performs a test, via the at least one wrapper, of the selected functional component. The ICT may monitor states of the plurality of the functional components via the at least one wrapper, stop the test based on a detection of a collision due to an access to the selected functional component, and return a connection of the selected functional component to the at least one wrapper according to the stop.