公开(公告)号：US07863915B2

公开(公告)日：2011-01-04

申请号：US12547260

申请日：2009-08-25

Applicant: Charles A. Miller

Inventor： Charles A. Miller

IPC: G01R31/02

CPC classification number: G01R31/2875 ,  G01R1/06727 ,  G01R1/07385 ,  G01R31/2886 ,  G01R31/2891

Abstract: A probe card cooling assembly for use in a test system includes a package with one or more dies cooled by direct cooling. The cooled package includes one or more dies with active electronic components and at least one coolant port that allows a coolant to enter the high-density package and directly cool the active electronic components of the dies during a testing operation.

Abstract translation: 用于测试系统的探针卡冷却组件包括具有通过直接冷却冷却的一个或多个模具的封装。 冷却的包装包括具有有源电子部件的一个或多个模具和允许冷却剂进入高密度封装并且在测试操作期间直接冷却模具的有效电子部件的至少一个冷却剂端口。

公开(公告)号：US07825652B2

公开(公告)日：2010-11-02

申请号：US12273408

申请日：2008-11-18

Applicant: Charles A. Miller

Inventor： Charles A. Miller

IPC: G01R31/28

CPC classification number: G01R31/3008

Abstract: A system is provided to enable leakage current measurement or parametric tests to be performed with an isolation buffer provided in a channel line. Multiple such isolation buffers are used to connect a single signal channel to multiple lines. Leakage current measurement is provided by providing a buffer bypass element, such as a resistor or transmission gate, between the input and output of each buffer. The buffer bypass element can be used to calibrate buffer delay out of the test system by using TDR measurements to determine the buffer delay based on reflected pulses through the buffer bypass element. Buffer delay can likewise be calibrated out by comparing measurements of a buffered and non-buffered channel line, or by measuring a device having a known delay.

Abstract translation: 提供了一种系统，用于使泄漏电流测量或参数测试能够与通道线中提供的隔离缓冲器一起进行。 多个这样的隔离缓冲器用于将单个信号通道连接到多条线路。 泄漏电流测量通过在每个缓冲器的输入和输出之间提供缓冲旁路元件（例如电阻器或传输门）来提供。 缓冲旁路元件可用于通过使用TDR测量来确定缓冲器延迟，以通过缓冲旁路元件反射的脉冲来校准测试系统中的缓冲延迟。 同样可以通过比较缓冲和非缓冲通道线的测量值，或通过测量具有已知延迟的器件来校准缓冲器延迟。

公开(公告)号：USD620353S1

公开(公告)日：2010-07-27

申请号：US29327125

申请日：2008-10-31

Applicant: Steven J. Block ,  Brad Burlison ,  Charles A. Miller ,  Paul Richardson ,  Raymond L. Zacher

Designer： Steven J. Block ,  Brad Burlison ,  Charles A. Miller ,  Paul Richardson ,  Raymond L. Zacher

公开(公告)号：US20100017662A1

公开(公告)日：2010-01-21

申请号：US12569584

申请日：2009-09-29

Applicant: Charles A. Miller

Inventor： Charles A. Miller

IPC: G06F11/00

CPC classification number: G01R35/005 ,  G01R31/3016 ,  G01R31/31723 ,  G01R31/318511 ,  G01R31/3191 ,  G01R31/31937

Abstract: A series of pulses may be driven down each drive channel, which creates a series of composite pulses at the output of the buffer. Each composite pulse is a composition of the individual pulses driven down the drive channels. Timing offsets associated with the drive channels may be adjusted until the individual pulses of the composite pulse align or closely align. Those timing offsets calibrate and/or deskew the drive channels, compensating for differences in the propagation delays through the drive channels. The composite pulse may be feed back to the tester through compare channels, and offsets associated with compare signals for each compare channel may be aligned to the composite pulse, which calibrates and/or deskews the compare channels.

Abstract translation: 可以沿着每个驱动通道驱动一系列脉冲，这在缓冲器的输出端产生一系列复合脉冲。 每个复合脉冲是从驱动通道驱动的各个脉冲的组合。 可以调整与驱动通道相关联的定时偏移，直到复合脉冲的各个脉冲对准或紧密对准。 这些定时偏移校准和/或校正驱动通道，补偿通过驱动通道传播延迟的差异。 复合脉冲可以通过比较通道反馈给测试仪，并且与每个比较通道的比较信号相关的偏移量可以与校准和/或对比比较通道的复合脉冲对准。

公开(公告)号：US20090251162A1

公开(公告)日：2009-10-08

申请号：US12485677

申请日：2009-06-16

Applicant: Igor Y. Khandros ,  Benjamin N. Eldridge ,  Charles A. Miller ,  A. Nicholas Sporck

Inventor： Igor Y. Khandros ,  Benjamin N. Eldridge ,  Charles A. Miller ,  A. Nicholas Sporck

IPC: G01R31/02

CPC classification number: G01R1/0491 ,  G01R1/073 ,  G01R31/3025

Abstract: A base controller disposed in a test cassette receives test data for testing a plurality of electronic devices. The base controller wirelessly transmits the test data to a plurality of wireless test control chips, which write the test data to each of the electronic devices. The wireless test control chips then read response data generated by the electronic devices, and the wireless test control chips wirelessly transmit the response data to the base controller.

Abstract translation: 设置在测试盒中的基本控制器接收用于测试多个电子设备的测试数据。 基站控制器将测试数据无线传输到多个无线测试控制芯片，其将测试数据写入每个电子设备。 然后，无线测试控制芯片读取由电子设备产生的响应数据，无线测试控制芯片将响应数据无线发送到基本控制器。

公开(公告)号：US07579847B2

公开(公告)日：2009-08-25

申请号：US11112034

申请日：2005-04-22

Applicant: Charles A. Miller

Inventor： Charles A. Miller

IPC: G01R31/02 ,  G01R31/26

CPC classification number: G01R31/2875 ,  G01R1/06727 ,  G01R1/07385 ,  G01R31/2886 ,  G01R31/2891

Abstract: A probe card cooling assembly for use in a test system includes a package with one or more dies cooled by direct cooling. The cooled package includes one or more dies with active electronic components and at least one coolant port that allows a coolant to enter the high-density package and directly cool the active electronic components of the dies during a testing operation.

Abstract translation: 用于测试系统的探针卡冷却组件包括具有通过直接冷却冷却的一个或多个模具的封装。 冷却的包装包括具有有源电子部件的一个或多个模具和允许冷却剂进入高密度封装并且在测试操作期间直接冷却模具的有效电子部件的至少一个冷却剂端口。

公开(公告)号：US20090134895A1

公开(公告)日：2009-05-28

申请号：US12259785

申请日：2008-10-28

Applicant: Charles A. Miller

Inventor： Charles A. Miller

IPC: G01R31/02 ,  H01R43/00 ,  G01R1/067

CPC classification number: G01R31/2889 ,  G01R1/07314 ,  G01R1/07378 ,  G01R31/31905 ,  Y10T29/49117

Abstract: A probe system for providing signal paths between an integrated circuit (IC) tester and input/output, power and ground pads on the surfaces of ICs to be tested includes a probe board assembly, a flex cable and a set of probes arranged to contact the IC's I/O pads. The probe board assembly includes one or more rigid substrate layers with traces and vias formed on or within the substrate layers providing relatively low bandwidth signal paths linking the tester to probes accessing some of the IC's pads. The flex cable provides relatively high bandwidth signal paths linking the tester to probes accessing others of the IC's pads.

Abstract translation: 用于在集成电路（IC）测试器和要测试的IC的表面上的输入/输出，电源和接地焊盘之间提供信号路径的探针系统包括探针板组件，柔性电缆和一组探针， IC的I / O焊盘。 探针板组件包括一个或多个刚性衬底层，其具有形成在衬底层上或衬底层内的迹线和通孔，其提供将测试器连接到访问IC的一些衬垫的探针的相对低带宽的信号路径。 柔性电缆提供相对高带宽的信号路径，将测试仪连接到访问IC其他焊盘的探针。

公开(公告)号：US07245134B2

公开(公告)日：2007-07-17

申请号：US11048167

申请日：2005-01-31

Applicant: Dane C. Granicher ,  Roy J. Henson ,  Charles A. Miller

Inventor： Dane C. Granicher ,  Roy J. Henson ,  Charles A. Miller

IPC: G01R31/02

CPC classification number: G01R31/31926 ,  G01R1/07385 ,  G01R31/2889

Abstract: A probe card of a wafer test system includes one or more programmable ICs, such as FPGAs, to provide routing from individual test signal channels to one of multiple probes. The programmable ICs can be placed on a base PCB of the probe card, or on a daughtercard attached to the probe card. With programmability, the PCB can be used to switch limited test system channels away from unused probes. Programmability further enables a single probe card to more effectively test devices having the same pad array, but having different pin-outs for different device options. Reprogrammability also allows test engineers to re-program as they are debugging a test program. Because the programmable IC typically includes buffers that introduce an unknown delay, in one embodiment measurement of the delay is accomplished by first programming the programmable IC to provide a loop back path to the test system so that buffer delay can be measured, and then reprogramming the programmable IC now with a known delay to connect to a device being tested.

Abstract translation: 晶片测试系统的探针卡包括一个或多个可编程IC（例如FPGA），以提供从各个测试信号通道到多个探针之一的路由。 可编程IC可以放置在探针卡的基板上，也可以放置在与探针卡相连的子卡上。 具有可编程性，PCB可用于将有限的测试系统通道切换为未使用的探头。 可编程性进一步使单个探针卡能够更有效地测试具有相同焊盘阵列但具有针对不同器件选项的不同引脚的器件。 可重编程序还允许测试工程师在调试测试程序时进行重新编程。 因为可编程IC通常包括引入未知延迟的缓冲器，在一个实施例中，通过首先对可编程IC进行编程以提供到测试系统的回送路径来实现延迟的测量，从而可以测量缓冲器延迟，然后重新编程 可编程IC现在具有已知的延迟以连接到被测试的设备。

公开(公告)号：US07239220B2

公开(公告)日：2007-07-03

申请号：US11422565

申请日：2006-06-06

Applicant: Charles A. Miller

Inventor： Charles A. Miller

IPC: H01P9/00

CPC classification number: H01P9/00 ,  G01R31/2822

Abstract: A transmission line includes a signal conductor and at least one varactor diode capacitively coupled to the signal conductor. The transmission line's signal path delay is a function of its shunt capacitance, and the varactor's capacitance forms a part of the transmission line's shunt capacitance. The transmission line's signal path delay is adjusted by adjusting a control voltage across the varactor diode thereby to adjust the varactor diode's capacitance.

Abstract translation: 传输线包括电容耦合到信号导体的信号导体和至少一个变容二极管。 传输线的信号路径延迟是其分流电容的函数，变容二极管的电容构成传输线分流电容的一部分。 通过调整变容二极管两端的控制电压来调整传输线的信号路径延迟，从而调整变容二极管的电容。

公开(公告)号：US07218094B2

公开(公告)日：2007-05-15

申请号：US10690170

申请日：2003-10-21

Applicant: Igor Y. Khandros ,  Benjamin N. Eldridge ,  A. Nicholas Sporck ,  Charles A. Miller

Inventor： Igor Y. Khandros ,  Benjamin N. Eldridge ,  A. Nicholas Sporck ,  Charles A. Miller

IPC: G01R31/28

CPC classification number: G01R31/3025 ,  G01R31/31907 ,  G01R31/31908

Abstract: One or more testers wirelessly communicate with one or more test stations. The wireless communication may include transmission of test commands and/or test vectors to a test station, resulting in testing of one or more electronic devices at the test station. The wireless communication may also include transmission of test results to a tester. Messages may also be wirelessly exchanged.

Abstract translation: 一个或多个测试人员与一个或多个测试台无线通信。 无线通信可以包括将测试命令和/或测试向量发送到测试站，导致测试台上的一个或多个电子设备的测试。 无线通信还可以包括将测试结果传输给测试者。 消息也可以被无线地交换。