Abstract:
A method and apparatus for stabilizing the widths of particle pulses produced by a Coulter type scanning aperture. The apparatus includes circuitry for sensing the widths of the particle pulses and a comparator for comparing each sensed width with a signal representative of a desired pulse width. Based upon the width comparison, an error signal is produced and coupled to control structure which varies the flow of particles through the scanning aperture, such that the error signal is reduced.
Abstract:
Apparatus which receives a train of electrical pulses from a particle analyzing device such as one which is operated in accordance with the Coulter principle, derives statistical indices from such train of pulses, stores the same in suitable storage means, receives a second train of pulses and derives the same indices from the second train of pulses, and compares the two indices. A readout device provides the comparison information. In this manner indices from one particulate system, such as for example a known sample, may be obtained and thereafter the same indices from an unknown sample may be obtained and compared with the indices from the known sample for study and analysis of the unknown particulate system.
Abstract:
Apparatus for use with apparatus operating in accordance with the principles of the Coulter electronic particle studying device, for discriminating between signals from particles passing on axial or near axial paths through an aperture and particles passing off center on the basis of their differing durations. The pulse duration of a portion of the pulse is measured and only those which meet the criteria of duration established by the sensor circuitry are permitted to pass for use in pulse height analysis apparatus following the sensor. The other pulses are discarded on the basis of their greater durations. The apparatus provides structure for deriving a duration-measuring pulse whose duration extends in one case from the peak of a particle pulse to a fractional amplitude thereof, and in another case from the time of maximum slope of the leading edge to the time of maximum slope of the trailing edge. In each case the duration-measuring pulse is converted into a signal which has an amplitude proportional to duration and the latter signal is compared with a certain maximum signal level to oprate gating means for rejecting the longer duration pulses and passing the shorter duration ones. Multiple peak pulses are also discarded by means of suitable circuitry.
Abstract:
A sensor for use with apparatus operating in accordance with the principles of the Coulter electronic particle studying device for differentiating between particles passing on axial or nearly axial paths through the aperture of the Coulter device and particles passing off center. The particle pulse duration is measured at two or more fractions of the amplitude of each individual particle pulse. The pulse durations so measured are converted to voltages which are compared with reference voltages derived from similar measurements made on previously processed particle pulses. If the duration of the particle pulse being processed is within specified tolerances of the reference voltages so derived at all of the fractional heights considered, a reconstructed pulse having the amplitude of the accepted pulse is impressed upon the output of the sensor apparatus for use in subsequent pulse height analysis apparatus. All pulses which cannot satisfy the criteria are discarded. Since only those pulses are accepted which have their durations at specified fractional amplitudes which are within a specified tolerance of the reference voltage levels, the acceptance or rejection of a particle pulse is based upon the shape and duration of said particle pulse, as referred to the criteria derived from pulses occurring in the immediate past history of the train of pulses being furnished to the sensor apparatus. The apparatus of the invention provides structure for deriving a duration-measuring pulse at each fractional amplitude, converting this signal into one which has an amplitude proportional to each fractional height duration, and then subjecting the resulting set of signals to multiple criteria of duration established by voltage levels to operate gating means automatically for rejecting the pulses having improper shapes or durations as determined by these criteria. A preferred embodiment uses as the said reference level a voltage level which represents a chosen percentile of the duration-measuring pulses, i.e., a voltage level such that, for instance, 25 percent of the duration-measuring pulses are smaller than, and 75 percent of the duration-measuring pulses are larger than the reference level.
Abstract:
A sensor used with apparatus operating in accordance with the principles of the Coulter electronic particle studying device, for differentiating between pulses produced by particles passing on axial or nearly axial paths through an aperture and particles passing off center. The pulse duration is measured at some fraction of the individual pulse amplitudes and only those which meet the criteria of duration established by the electronic circuitry are permitted to pass for use in pulse height analysis apparatus following the sensor. The other pulses are discarded on the basis of their greater durations. The apparatus of the invention provides structure for deriving a duration-measuring pulse whose duration is that of the particle pulse at its fractional amplitude, converting the signal into one which has an amplitude proportional to duration, and then subjecting the latter signal to the criteria of duration established as amplitude levels to operate gating means automatically for rejecting the longer duration pulses and passing the shorter duration pulses.
Abstract:
The scanner element or aperture tube of a Coulter particle apparatus has a wafer in which the aperture is formed, the wafer being made of a material which has electrical insulating properties but high heat conductivity. The tube is of glass and the wafer is set into the side wall of the tube. The result is a scanner element of increased sensitivity. In one form of the invention, the surfaces of the tube, at least in the vicinity of the wafer, are covered by a coating of highly conductive material coming close to but not engaging within the aperture of the wafer. The coating inside and outside of the tube will comprise electrodes in the bodies of liquid respectively disposed on opposite sides of the tube wall.
Abstract:
A sensor for use with apparatus operating in accordance with the principles of the Coulter electronic particle studying device, for discriminating between signals from particles passing on axial or near axial paths through an aperture and particles passing off center on the basis of their differing durations. The pulse duration of a portion of the pulse is measured and only those which meet the criteria of duration established by the electronic circuitry are permitted to pass for use in pulse height analysis apparatus following the sensor. The other pulses are discarded on the basis of their greater durations. The apparatus provides structure for deriving a duration-measuring pulse whose duration extends in one case from the peak of a particle pulse to a fractional amplitude thereof, and in another case from the time of maximum slope of the leading edge to the time of maximum slope of the trailing edge. In each case the duration-measuring pulse is converted into a signal which has an amplitude proportional to duration and the latter signal is compared with a certain maximum signal level to operate gating means for rejecting the longer duration pulses and passing the shorter duration ones. Multiple peak pulses are also discarded by means of suitable circuitry.
Abstract:
An axial trajectory sensor for use with an electronic particle study apparatus, for differentiating between particles passing on or nearly on axial paths through the detecting zone of the apparatus and particles passing displaced from such an axial path. The sensor derives a duration-measuring pulse for each particle, with such duration being that of the particle generated pulse at a fractional amplitude of the particle pulse. The sensor establishes a duration criteria, subjects each duration-measuring pulse to that criteria, and responds to each duration-measuring pulse by distinguishing between those longer and shorter than the duration criteria.
Abstract:
Apparatus and method for measuring particle concentration in a fluid suspension by obtaining signals from a sensing zone and relating the duration of time occupied by the particles in suspension while traversing the sensing zone to the total time. Concentration is proportional to the percentage of time particles are in the sensing zone. The apparatus includes means for measuring the duration of a predetermined portion of each particle pulse between two ascertainable points thereof, such as for example, at some fraction of its amplitude and deriving thereby a plurality of duration-measuring pulses. The direct current component of these duration-measuring pulses averaged over the time during which they occurred is obtained in a d.c. meter and is proportional to concentration. The meter indication may be calibrated in terms of concentration. The apparatus and method are particularly applicable in connection with a Coulter particle analyzing device in which the sensing zone is the aperture of the Coulter device.
Abstract:
The apparatus includes (1) a Coulter type particle analyzing device for producing a particle pulse each time a particle is in a sensing zone, each particle pulse having poorly defined leading and trailing edges and a duration related to the time the particle is in the sensing zone, (2) electrical circuitry connected to the output of the particle analyzing device for producing, upon sensing each particle pulse above a predetermined threshold level, an output pulse having a selected clearly defined duration established between (a) a clearly defined leading edge of the output pulse occurring at a time substantially equal to the time of inflection of the slope of the leading edge of the particle pulse and (b) a clearly defined trailing edge of the output pulse occurring at substantially the same time that the instantaneous value of the trailing edge of the particle pulse falls below the level of the instantaneous value of the leading edge of the particle pulse at the time of inflection of the slope of the leading edge of the particle pulse, and (3) apparatus for measuring and displaying the duty factor of a train of the output pulses. The method includes the steps of: initiating an output pulse for each particle pulse at a time substantially equal to the time of inflection of the slope of the leading edge of the particle pulse, terminating each output pulse at substantially the same time that the instantaneous value of the trailing edge of the particle pulse falls below the level of the instantaneous value of the leading edge of the particle pulse at the time of inflection of the slope of the leading edge of the particle pulse, and measuring the duty factor of a train of the output pulses. This duty factor is closely proportional to particle concentration.