公开(公告)号：US20220193831A1

公开(公告)日：2022-06-23

申请号：US17554357

申请日：2021-12-17

Applicant: CORNING INCORPORATED

Inventor： Andreas Simon Gaab ,  Richard Anthony Gaona ,  Nicolai Martin Haenel ,  Dale Humphrey ,  Ralf Joachim Terbrueggen ,  John Eric Tyler

IPC: B23K26/53 ,  B23K26/00 ,  B23K26/70

Abstract: A method of forming a plurality of defects within a substrate with a laser beam focal line using a laser beam, each defect of the plurality of defects being a damage track within the substrate with a diameter of about 10 microns or less, the plurality of defects forming a contour line on the substrate. The substrate having a first surface and a second surface that is opposite from the first surface. The method further includes exerting (i) a first force on the first surface of the substrate at a location that is adjacent to the contour line and (ii) a second force on the second surface of the substrate at a location that is on the contour line. Additionally, the method includes breaking the substrate along the contour line and into a first substrate portion and a second substrate portion.