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公开(公告)号:US10281330B2
公开(公告)日:2019-05-07
申请号:US15517809
申请日:2015-10-08
Inventor: Valerio Pini , Priscila Monteiro Kosaka , Francisco Javier Tamayo De Miguel , Montserrat Calleja Gomez , Daniel Ramos Vega , Oscar Malvar Vidal , Jose Jaime Ruz Martinez , Mario Encinar Del Pozo
Abstract: The invention relates to a spectrophotometer, especially a spectrophotometer that can carry out simultaneous analysis at different points on the same sample (4), with a high spatial resolution and without requiring a mechanical system for physical scanning along the sample. This is obtained by the provision of means for processing the light received by the photodetectors (5), said processing means having a correlation wherein each of the photodetectors (5) corresponds to a spatial point on the sample (4).In the case of dark field applications, the present invention ensures the standardization of the data using the same measure.