METHOD FOR MEASURING AN OPTICAL SYSTEM
    1.
    发明申请
    METHOD FOR MEASURING AN OPTICAL SYSTEM 有权
    测量光学系统的方法

    公开(公告)号:US20130271749A1

    公开(公告)日:2013-10-17

    申请号:US13913212

    申请日:2013-06-07

    IPC分类号: G01M11/02

    摘要: First test beams (464a-d), after passing through an optical system on optical paths that differ in pairs, impinge on a first measurement region (461) at angles that differ in pairs with respect to the measurement plane. Second test beams (465a-d), after passing through the optical system on optical paths that differ in pairs, impinge on a second measurement region (462) at angles that differ in pairs, wherein the second region differs from the first. A value of a first measurement variable of the test beam at the first region is detected for each of the first test beams, and comparably for a second measurement variable at the second region for the second test beams. Impingement regions (467a-d) on reference surface(s) (466, 471) of the optical system are determined and a spatial diagnosis distribution of a property of the reference surface(s) for each test beam is calculated.

    摘要翻译: 第一测试光束(464a-d)在通过成对不同的光路上的光学系统之后,以相对于测量平面成对不同的角度照射在第一测量区域(461)上。 第二测试光束(465a-d)在穿过成对不同的光路上的光学系统之后,以成对不同的角度撞击第二测量区域(462),其中第二区域与第一区域不同。 对于第一测试光束中的每一个检测第一区域处的测试光束的第一测量变量的值,并且针对第二测试光束的第二测量变量的第二测量变量进行比较。 确定光学系统的参考表面(466,471)上的冲击区域(467a-d),并且计算每个测试光束的参考表面的属性的空间诊断分布。