公开(公告)号：US20180321190A1

公开(公告)日：2018-11-08

申请号：US16032874

申请日：2018-07-11

Applicant: Brechtel Manufacturing, Inc.

Inventor： Fredrick J. Brechtel ,  Xerxes Lopez-Yglesias

IPC: G01N27/66 ,  H01J27/02 ,  H01J49/14 ,  G01N27/62 ,  G01R29/24 ,  H01J49/16

CPC classification number: G01N27/66 ,  G01N27/624 ,  G01R29/24 ,  H01J27/02 ,  H01J49/145 ,  H01J49/161

Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.

公开(公告)号：US20170356879A1

公开(公告)日：2017-12-14

申请号：US15672131

申请日：2017-08-08

Applicant: Brechtel Manufacturing, Inc.

Inventor： Fredrick J. Brechtel ,  Xerxes Lopez-Yglesias

IPC: G01N27/66 ,  G01R29/24 ,  H01J27/02 ,  G01N27/62 ,  H01J49/16 ,  H01J49/14

CPC classification number: G01N27/66 ,  G01N27/624 ,  G01R29/24 ,  H01J27/02 ,  H01J49/145 ,  H01J49/161

Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.