-
公开(公告)号:US10078068B2
公开(公告)日:2018-09-18
申请号:US15672131
申请日:2017-08-08
Applicant: Brechtel Manufacturing, Inc.
Inventor: Fredrick J Brechtel , Xerxes Lopez-Yglesias
CPC classification number: G01N27/66 , G01N27/624 , G01R29/24 , H01J27/02 , H01J49/145 , H01J49/161
Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.
-
公开(公告)号:US09759685B2
公开(公告)日:2017-09-12
申请号:US14800410
申请日:2015-07-15
Applicant: Brechtel Manufacturing, Inc.
Inventor: Fredrick J Brechtel , Xerxes Lopez-Yglesias
CPC classification number: G01N27/66 , G01N27/624 , G01R29/24 , H01J27/02 , H01J49/145 , H01J49/161
Abstract: A system and method comprising an ion production chamber having a ultra-violet light source disposed towards said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.
-
公开(公告)号:US10261049B2
公开(公告)日:2019-04-16
申请号:US16032874
申请日:2018-07-11
Applicant: Brechtel Manufacturing, Inc.
Inventor: Fredrick J Brechtel , Xerxes Lopez-Yglesias
Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.
-
公开(公告)号:US09753013B2
公开(公告)日:2017-09-05
申请号:US14280582
申请日:2014-05-17
Applicant: Brechtel Manufacturing, Inc.
Inventor: Fredrick J Brechtel , David A. Horsley , Gerardo Jaramillo
CPC classification number: G01N27/66 , G01N27/624 , G01R29/24 , H01J27/02 , H01J49/145 , H01J49/161
Abstract: A system and method comprising a charger for ionizing aerosols; a spectrometer coupled to the charger and operable to select for a predetermined particle size; a porous charge collector coupled to the spectrometer, and a MEMS electrometer. In some embodiments the charge collector may be a metal frit electrically coupled to the electrometer. The electrometer may include a comb drive actuator coupled to a moving shuttle supported on flexures.
-
公开(公告)号:US09018598B2
公开(公告)日:2015-04-28
申请号:US14279800
申请日:2014-05-16
Applicant: Brechtel Manufacturing, Inc.
Inventor: Fredrick J Brechtel
CPC classification number: G01N27/66 , G01N27/624 , G01R29/24 , H01J27/02 , H01J49/145 , H01J49/161
Abstract: A system and method comprising an ion production chamber having a plasma source disposed in said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.
Abstract translation: 一种系统和方法,包括具有设置在所述室中的等离子体源的离子产生室,设置成从入口流到出口的收集气体和射流,所述射流可操作以将样品引入收获气流 。 在一些实施方案中,该系统包括使用氦气作为收获气体。 某些实施方案包括引入垂直于收获气体流的样品并使用多个样品引入喷嘴以提高混合效率。 电荷样本可以耦合到基于MEMS的静电计。
-
-
-
-