公开(公告)号：US20190215668A1

公开(公告)日：2019-07-11

申请号：US15865483

申请日：2018-01-09

申请人： Boaz Kenane

发明人： Boaz Kenane

IPC分类号： H04W4/44 ,  G08G1/0967 ,  B60W40/06 ,  G05D1/00

摘要： Apparatuses and methods of operating the same are described. A sensor system including a sensor, a processor, and a communication subsystem. The sensor may measure a defined area of a path located below the sensor system to obtain a sensor measurement. The processor may be coupled to the sensor. The processor may determine at least one of environmental condition information within the defined area or characteristic information associated with an object within the defined area using the sensor measurement. The communication subsystem may be coupled to the processor. The communication subsystem may send at least one of the environmental condition information or the characteristic information to a communication system of a vehicle.

公开(公告)号：US10334412B1

公开(公告)日：2019-06-25

申请号：US15865483

申请日：2018-01-09

申请人： Boaz Kenane

发明人： Boaz Kenane

IPC分类号： G05D1/00 ,  H04W4/44 ,  B60W40/06 ,  G08G1/0967

CPC分类号： H04W4/44 ,  B60W40/06 ,  B60W2550/12 ,  B60W2550/402 ,  G05D1/0088 ,  G08G1/096708 ,  G08G1/096783

摘要： Apparatuses and methods of operating the same are described. A sensor system including a sensor, a processor, and a communication subsystem. The sensor may measure a defined area of a path located below the sensor system to obtain a sensor measurement. The processor may be coupled to the sensor. The processor may determine at least one of environmental condition information within the defined area or characteristic information associated with an object within the defined area using the sensor measurement. The communication subsystem may be coupled to the processor. The communication subsystem may send at least one of the environmental condition information or the characteristic information to a communication system of a vehicle.

公开(公告)号：US20120326060A1

公开(公告)日：2012-12-27

申请号：US13526809

申请日：2012-06-19

申请人： Boaz Kenane ,  Xiaolan Chen

发明人： Boaz Kenane ,  Xiaolan Chen

IPC分类号： G01J1/04

CPC分类号： G01J3/502 ,  G01J3/0216 ,  G01J3/513 ,  G01J2001/4252

摘要： The current application is directed to an apparatus and a method for parallel testing and sorting of LED dies on a substrate wafer. The apparatus includes a moving stage and a chuck for the wafer, a wafer prober, collecting and imaging optics, sorting and separating optics, and a linear or rectangular array of light detectors. The method of testing includes moving an LED wafer or a test device on an XY stage, connecting the prober to a line of multiple LED dies or several lines of multiple LED dies, referred to as an “array of devices under test” (“ADUT”), measuring the electrical characteristics of the individual devices under test (“DUT”) in parallel, and collecting light from, and identifying the intensity and wavelength distribution of, the individual DUT in parallel.

摘要翻译： 目前的应用涉及用于在衬底晶片上并行测试和分类LED管芯的装置和方法。 该装置包括用于晶片的移动台和卡盘，晶片探测器，收集和成像光学器件，分类和分离光学器件以及光检测器的线性或矩形阵列。 测试方法包括在XY平台上移动LED晶片或测试装置，将探测器连接到多个LED管芯或多条LED管的线路，称为被测设备阵列（ADUT），测量 被测设备（DUT）的并联电气特性，并且并行地收集来自各个DUT的光并识别各个DUT的强度和波长分布。

公开(公告)号：US08283644B2

公开(公告)日：2012-10-09

申请号：US13070306

申请日：2011-03-23

申请人： Eugene Smargiassi ,  Boaz Kenane ,  James Lee ,  Xiaolan Chen

发明人： Eugene Smargiassi ,  Boaz Kenane ,  James Lee ,  Xiaolan Chen

IPC分类号： H01L21/30 ,  G03F7/00

CPC分类号： G01N21/33 ,  H01L21/67115 ,  H01L21/67248

摘要： Provided are improved apparatus and methods for radiative treatment. In some embodiments, a semiconductor processing apparatus for radiative cure includes a process chamber and a radiation assembly external to the process chamber. The radiation assembly transmits radiation into the chamber on a substrate holder through a chamber window. A radiation detector measures radiation intensity from time to time. The assembly includes a gas inlet and exhaust operable to flow a radiation-activatable cooling gas through the radiation assembly.

摘要翻译： 提供了用于辐射治疗的改进的装置和方法。 在一些实施例中，用于辐射固化的半导体处理装置包括处理室和处理室外部的辐射组件。 辐射组件通过腔室窗口将辐射传播到衬底保持器上的腔室中。 辐射探测器不时地测量辐射强度。 组件包括可操作以使可辐射致冷的冷却气体流过辐射组件的气体入口和排气口。

公开(公告)号：US20120161021A1

公开(公告)日：2012-06-28

申请号：US13070306

申请日：2011-03-23

申请人： Eugene Smargiassi ,  Boaz Kenane ,  James Lee ,  Xiaolan Chen

发明人： Eugene Smargiassi ,  Boaz Kenane ,  James Lee ,  Xiaolan Chen

IPC分类号： G01J1/42

CPC分类号： G01N21/33 ,  H01L21/67115 ,  H01L21/67248

摘要： Provided are improved apparatus and methods for radiative treatment. In some embodiments, a semiconductor processing apparatus for radiative cure includes a process chamber and a radiation assembly external to the process chamber. The radiation assembly transmits radiation into the chamber on a substrate holder through a chamber window. A radiation detector measures radiation intensity from time to time. The assembly includes a gas inlet and exhaust operable to flow a radiation-activatable cooling gas through the radiation assembly.

摘要翻译： 提供了用于辐射治疗的改进的装置和方法。 在一些实施例中，用于辐射固化的半导体处理装置包括处理室和处理室外部的辐射组件。 辐射组件通过腔室窗口将辐射传播到衬底保持器上的腔室中。 辐射探测器不时地测量辐射强度。 组件包括可操作以使可辐射致冷的冷却气体流过辐射组件的气体入口和排气口。