Method and apparatus for tomosynthesis image quality control
    1.
    发明授权
    Method and apparatus for tomosynthesis image quality control 失效
    断层摄影图像质量控制的方法和装置

    公开(公告)号:US07286631B2

    公开(公告)日:2007-10-23

    申请号:US11339067

    申请日:2006-01-25

    IPC分类号: A61B6/00

    摘要: A method and apparatus for tomosynthesis image quality control for a tomosynthesis imaging system. The method and apparatus including: positioning a phantom having an edge of predetermined sharpness at a predetermined angle relative to an imaging plane of an x-ray detector; performing tomosynthesis acquisition and generating one or more slice images using one or more three-dimensional reconstruction algorithms; selecting a slice image to be measured from the one or more slice images; identifying a sharpest edge in the slice image to be measured, wherein the sharpest edge in the slice image to be measured includes the in-focus portion of the phantom; inputting the slice image to be measured and coordinates of the sharpest edge in the slice image to be measured into a modulation transfer function (MTF) algorithm; and, using the MTF algorithm, calculating the in-plane resolution and slice thickness of the slice image to be measured.

    摘要翻译: 一种用于断层合成成像系统的层析合成图像质量控制的方法和装置。 所述方法和装置包括:相对于X射线检测器的成像平面将具有预定锐度的边缘的假想物体以预定角度定位; 执行层析合成获取并使用一个或多个三维重建算法生成一个或多个切片图像; 从所述一个或多个切片图像中选择要测量的切片图像; 识别要测量的切片图像中的最锐边,其中要测量的切片图像中的最锐边包括体模的对焦部分; 将要测量的切片图像和要测量的切片图像中最锐边的坐标输入调制传递函数(MTF)算法; 并使用MTF算法计算要测量的切片图像的面内分辨率和切片厚度。

    Method and apparatus for tomosynthesis image quality control
    2.
    发明申请
    Method and apparatus for tomosynthesis image quality control 失效
    断层摄影图像质量控制的方法和装置

    公开(公告)号:US20060120506A1

    公开(公告)日:2006-06-08

    申请号:US11339067

    申请日:2006-01-25

    摘要: The present invention provides a method and apparatus for tomosynthesis image quality control for a tomosynthesis imaging system, the method and apparatus addressing the measurement of in-plane resolution and slice thickness, via the measurement of modulation transfer function (MTF), the method and apparatus including: positioning a phantom having an edge of predetermined sharpness at a predetermined angle relative to an imaging plane of an x-ray detector; performing tomosynthesis acquisition and generating one or more slice images using one or more three-dimensional reconstruction algorithms; selecting a slice image to be measured from the one or more slice images; identifying a sharpest edge in the slice image to be measured, wherein the sharpest edge in the slice image to be measured includes the in-focus portion of the phantom; inputting the slice image to be measured and coordinates of the sharpest edge in the slice image to be measured into an MTF algorithm; and, using the MTF algorithm, calculating the in-plane resolution and slice thickness of the slice image to be measured.

    摘要翻译: 本发明提供了通过调制传递函数(MTF)的测量,方法和装置,用于层析合成成像系统的层析合成图像质量控制的方法和装置,该方法和装置解决了平面内分辨率和切片厚度的测量。 包括:相对于X射线检测器的成像平面将具有预定锐度的边缘的假想物以预定角度定位; 执行层析合成获取并使用一个或多个三维重建算法生成一个或多个切片图像; 从所述一个或多个切片图像中选择要测量的切片图像; 识别要测量的切片图像中的最锐边,其中要测量的切片图像中的最锐边包括体模的对焦部分; 将要测量的切片图像和要测量的切片图像中最锐边的坐标输入到MTF算法中; 并使用MTF算法计算要测量的切片图像的面内分辨率和切片厚度。

    Systems, methods and apparatus for determining deviation of an x-ray field, a light field and a primary receptor
    3.
    发明申请
    Systems, methods and apparatus for determining deviation of an x-ray field, a light field and a primary receptor 有权
    用于确定x射线场,光场和初级受体的偏差的系统,方法和装置

    公开(公告)号:US20060118701A1

    公开(公告)日:2006-06-08

    申请号:US11002007

    申请日:2004-12-02

    IPC分类号: H01J40/14

    CPC分类号: G03B42/02

    摘要: Systems, methods and apparatus are provided through which, in some embodiments, an electronic sensor is positioned in the field of projection of an X-ray source, and the electronic sensor measures the deviation between a visible light field and an X-ray field. In some embodiments, the deviation is scaled in reference to the position of the electronic sensor between an X-ray receptor and the X-ray source.

    摘要翻译: 提供了系统,方法和装置,在一些实施例中,电子传感器位于X射线源的投影领域中,并且电子传感器测量可见光场与X射线场之间的偏差。 在一些实施例中,相对于X射线接收器和X射线源之间的电子传感器的位置,偏差被缩放。