摘要:
Systems, methods and apparatus are provided through which, in some embodiments, an electronic sensor is positioned in the field of projection of an X-ray source, and the electronic sensor measures the deviation between a visible light field and an X-ray field. In some embodiments, the deviation is scaled in reference to the position of the electronic sensor between an X-ray receptor and the X-ray source.
摘要:
A method and apparatus for tomosynthesis image quality control for a tomosynthesis imaging system. The method and apparatus including: positioning a phantom having an edge of predetermined sharpness at a predetermined angle relative to an imaging plane of an x-ray detector; performing tomosynthesis acquisition and generating one or more slice images using one or more three-dimensional reconstruction algorithms; selecting a slice image to be measured from the one or more slice images; identifying a sharpest edge in the slice image to be measured, wherein the sharpest edge in the slice image to be measured includes the in-focus portion of the phantom; inputting the slice image to be measured and coordinates of the sharpest edge in the slice image to be measured into a modulation transfer function (MTF) algorithm; and, using the MTF algorithm, calculating the in-plane resolution and slice thickness of the slice image to be measured.
摘要:
The present invention provides a method and apparatus for tomosynthesis image quality control for a tomosynthesis imaging system, the method and apparatus addressing the measurement of in-plane resolution and slice thickness, via the measurement of modulation transfer function (MTF), the method and apparatus including: positioning a phantom having an edge of predetermined sharpness at a predetermined angle relative to an imaging plane of an x-ray detector; performing tomosynthesis acquisition and generating one or more slice images using one or more three-dimensional reconstruction algorithms; selecting a slice image to be measured from the one or more slice images; identifying a sharpest edge in the slice image to be measured, wherein the sharpest edge in the slice image to be measured includes the in-focus portion of the phantom; inputting the slice image to be measured and coordinates of the sharpest edge in the slice image to be measured into an MTF algorithm; and, using the MTF algorithm, calculating the in-plane resolution and slice thickness of the slice image to be measured.