公开(公告)号：US12044964B2

公开(公告)日：2024-07-23

申请号：US18337289

申请日：2023-06-19

Applicant: Applied Materials, Inc.

Inventor： David Alexander Sell ,  Samarth Bhargava

IPC: G03F7/00 ,  G02B25/00

CPC classification number: G03F7/0005 ,  G02B25/001

Abstract: Embodiments of the present disclosure generally relate to methods of forming a substrate having a target thickness distribution at one or more eyepiece areas across a substrate. The substrate includes eyepiece areas corresponding to areas where optical device eyepieces are to be formed on the substrate. Each eyepiece area includes a target thickness distribution. A base substrate thickness distribution of a base substrate is measured such that a target thickness change can be determined. The methods described herein are utilized along with the target thickness change to form a substrate with the target thickness distribution.

公开(公告)号：US11720016B2

公开(公告)日：2023-08-08

申请号：US17315613

申请日：2021-05-10

Applicant: Applied Materials, Inc.

Inventor： David Sell ,  Samarth Bhargava

IPC: G03F7/00 ,  G02B25/00

CPC classification number: G03F7/0005 ,  G02B25/001

Abstract: Embodiments of the present disclosure generally relate to methods of forming a substrate having a target thickness distribution at one or more eyepiece areas across a substrate. The substrate includes eyepiece areas corresponding to areas where optical device eyepieces are to be formed on the substrate. Each eyepiece area includes a target thickness distribution. A base substrate thickness distribution of a base substrate is measured such that a target thickness change can be determined. The methods described herein are utilized along with the target thickness change to form a substrate with the target thickness distribution.

公开(公告)号：US12050344B2

公开(公告)日：2024-07-30

申请号：US18496574

申请日：2023-10-27

Applicant: Applied Materials, Inc.

Inventor： Kevin Messer ,  David Alexander Sell ,  Samarth Bhargava

IPC: G02B6/122 ,  G02B6/12

CPC classification number: G02B6/1223 ,  G02B6/12007 ,  G02B2006/12107 ,  G02B2207/101

Abstract: Embodiments of the present disclosure generally relate to augmented reality waveguide combiners. The waveguides includes a waveguide substrate, having a substrate refractive index (RI) nsub, a slab waveguide layer disposed over the waveguide substrate, the slab waveguide layer having a slab RI nswg and a slab depth dswg, the slab depth dswg from a lower surface to an upper surface of the slab waveguide layer, at least one grating defined by a plurality of grating structures, the grating structures are disposed in, on, or over the slab waveguide layer, and a superstrate between and over the grating structures, the superstrate having a superstrate RI nsuperstrate and an interface with the slab waveguide layer. The slab RI nswg is greater than the substrate RI nsub and the slab RI nswg is greater than the superstrate RI nsuperstrate.

公开(公告)号：US11886111B2

公开(公告)日：2024-01-30

申请号：US17655583

申请日：2022-03-21

Applicant: Applied Materials, Inc.

Inventor： David Sell ,  Samarth Bhargava

IPC: G03F7/00 ,  G02B25/00

CPC classification number: G03F7/0005 ,  G02B25/001

Abstract: Embodiments of the present disclosure generally relate to methods of forming a substrate having a target thickness distribution at one or more eyepiece areas across a substrate. The substrate includes eyepiece areas corresponding to areas where optical device eyepieces are to be formed on the substrate. Each eyepiece area includes a target thickness distribution. A base substrate thickness distribution of a base substrate is measured such that a target thickness change can be determined. The methods described herein are utilized along with the target thickness change to form a substrate with the target thickness distribution.

公开(公告)号：US12007610B2

公开(公告)日：2024-06-11

申请号：US17662354

申请日：2022-05-06

Applicant: Applied Materials, Inc.

Inventor： Kevin Messer ,  Samarth Bhargava

IPC: G02B6/42

CPC classification number: G02B6/4204 ,  G02B6/4291

Abstract: Waveguide combiners having a pass-through in-coupler grating are described herein. The waveguide combiners include at least one microdisplay and a stack of at least two waveguide layers. In one configuration of a waveguide combiner described herein, the green FOV and the blue FOV only propagate in a first waveguide and the red FOV only propagates in a second waveguide. In another configuration of a waveguide combiner described herein, the blue FOV, the red FOV, and the green FOV only propagate in the first waveguide, the second waveguide, and a third waveguide respectively. The waveguide combiners including the stack of waveguide layers reduces luminance non-uniformity, color non-uniformity, double-images, and other non-uniformities of the overlayed images from a first microdisplay and, in some embodiments, a second microdisplay.