公开(公告)号：US20240087149A1

公开(公告)日：2024-03-14

申请号：US17944207

申请日：2022-09-14

Applicant: Apple Inc.

Inventor： Shay Yosub ,  Noam Badt ,  Boris Morgenstein ,  Yuval Vardi ,  David Pawlowski ,  Assaf Avraham ,  Pieter Spinnewyn ,  Tom Levy ,  Yohai Zmora

IPC: G06T7/521 ,  G06T5/50 ,  G06V10/141 ,  G06V10/24 ,  G06V10/74

CPC classification number: G06T7/521 ,  G06T5/50 ,  G06V10/141 ,  G06V10/245 ,  G06V10/761 ,  G06T2207/10028 ,  G06T2207/20221

Abstract: A method for depth mapping includes providing a depth mapping device comprising a projector, which is configured to project a pattern of optical radiation onto a target area over a first field of view about a projection axis, and a camera, which is configured to capture images of the target area within a second field of view, narrower than the first field of view, about a camera axis, which is offset transversely relative to the projection axis. The projector projects the pattern onto first and second planes at first and second distances from the camera, and the camera captures first and second reference images containing first and second parts of the pattern on the first and second planes, respectively. The first and second reference images are combined to produce an extended reference image including both the first and second parts of the pattern.

公开(公告)号：US20250113017A1

公开(公告)日：2025-04-03

申请号：US18479848

申请日：2023-10-03

Applicant: APPLE INC.

Inventor： Nir Goldfriend ,  Yuval Vardi ,  David Pawlowski ,  Roey Zuitlin ,  Gidi Lasovski ,  Boris Morgenstein

IPC: H04N13/271 ,  H04N13/254 ,  H04N13/296

Abstract: A method for depth mapping includes operating a projector at a first temperature to project a pattern of optical radiation onto a reference plane, capturing a first image of the projected pattern on the reference plane, using the first image and an optical and thermal model of the projector to compute multiple reference images associated with different respective temperatures of the projector. Using the projector, the pattern is projected onto a scene, and a temperature of the projector is measured while projecting the pattern. The method further includes capturing a second image of the projected pattern on the scene, selecting one of the reference images responsively to the measured temperature; and computing a depth map of the scene by comparing the pattern in the second image to the selected one of the reference images.