公开(公告)号：US20240007606A1

公开(公告)日：2024-01-04

申请号：US17810098

申请日：2022-06-30

Applicant: Apple Inc.

Inventor： Boris Morgenstein ,  Assaf Avraham ,  David Pawlowski ,  Gidi Lasovski ,  Refael Della Pergola ,  Tom Levy ,  Yohai Zmora

IPC: H04N13/254 ,  G06T5/00 ,  G06T7/521 ,  G01B11/25

CPC classification number: H04N13/254 ,  G06T5/006 ,  G06T7/521 ,  G01B11/2504

Abstract: One disclosed embodiment includes techniques for temperature-dependent reference image correction in structured light projectors that may be used for generating three-dimensional (3D) scene depth maps. The techniques disclosed herein include receiving an indication of a temperature (e.g., an actual current operating temperature or a change in the current operating temperature relative to an established reference temperature) associated with one or more components of a projector and then determining, based on the temperature indication, an amount of adjustment needed to correct a reference pattern image based on an estimated effective focal length change of the projector. Next, a reference pattern image may be appropriately adjusted, e.g., based on the determined amount of effective focal length adjustment caused by the current operating temperature of the projector, to generate a corrected reference image, which may then be used to generate a more accurate 3D scene depth maps at the projector's current operating temperature.

公开(公告)号：US20250113017A1

公开(公告)日：2025-04-03

申请号：US18479848

申请日：2023-10-03

Applicant: APPLE INC.

Inventor： Nir Goldfriend ,  Yuval Vardi ,  David Pawlowski ,  Roey Zuitlin ,  Gidi Lasovski ,  Boris Morgenstein

IPC: H04N13/271 ,  H04N13/254 ,  H04N13/296

Abstract: A method for depth mapping includes operating a projector at a first temperature to project a pattern of optical radiation onto a reference plane, capturing a first image of the projected pattern on the reference plane, using the first image and an optical and thermal model of the projector to compute multiple reference images associated with different respective temperatures of the projector. Using the projector, the pattern is projected onto a scene, and a temperature of the projector is measured while projecting the pattern. The method further includes capturing a second image of the projected pattern on the scene, selecting one of the reference images responsively to the measured temperature; and computing a depth map of the scene by comparing the pattern in the second image to the selected one of the reference images.

公开(公告)号：US20240094437A1

公开(公告)日：2024-03-21

申请号：US18307820

申请日：2023-04-27

Applicant: APPLE INC.

Inventor： Roei Remez ,  Moshe Kriman ,  Yuval Tsur ,  Maoz Ovadia ,  Yaron Gross ,  Omer Eden ,  Alex Pekin ,  Assaf Avraham ,  Roey Zuitlin ,  Gidi Lasovski ,  Refael Della Pergola

IPC: G02B1/00 ,  G01B11/25 ,  G02B1/02 ,  G02B27/30

CPC classification number: G02B1/002 ,  G01B11/254 ,  G02B1/02 ,  G02B27/30

Abstract: An optoelectronic apparatus includes an array of emitters configured to emit beams of optical radiation. An optical substrate is mounted over the array. An optical metasurface is disposed on the optical substrate and configured to collimate and split each of the emitted beams into a respective group of collimated sub-beams, and to direct the collimated sub-beams toward a target to form a pattern of spots on the target.

公开(公告)号：US11856180B1

公开(公告)日：2023-12-26

申请号：US17810098

申请日：2022-06-30

Applicant: Apple Inc.

Inventor： Boris Morgenstein ,  Assaf Avraham ,  David Pawlowski ,  Gidi Lasovski ,  Refael Della Pergola ,  Tom Levy ,  Yohai Zmora

IPC: H04N13/254 ,  G06T7/521 ,  G01B11/00 ,  G06T5/00 ,  G01B11/25

CPC classification number: H04N13/254 ,  G01B11/2504 ,  G06T5/006 ,  G06T7/521

Abstract: One disclosed embodiment includes techniques for temperature-dependent reference image correction in structured light projectors that may be used for generating three-dimensional (3D) scene depth maps. The techniques disclosed herein include receiving an indication of a temperature (e.g., an actual current operating temperature or a change in the current operating temperature relative to an established reference temperature) associated with one or more components of a projector and then determining, based on the temperature indication, an amount of adjustment needed to correct a reference pattern image based on an estimated effective focal length change of the projector. Next, a reference pattern image may be appropriately adjusted, e.g., based on the determined amount of effective focal length adjustment caused by the current operating temperature of the projector, to generate a corrected reference image, which may then be used to generate a more accurate 3D scene depth maps at the projector's current operating temperature.