-
1.发明授权公开(公告)号：US09990135B2
公开(公告)日：2018-06-05
申请号：US15275306
申请日：2016-09-23
申请人： Apple Inc.
CPC分类号： G06F9/546 , G06F9/5016
摘要： Described are a system and technique for collecting stack trace information of devices and analyzing this information to provide metrics with respect to memory usage. The memory analysis includes attributing the memory usage to particular development components by traversing a stack trace. For example, the development components may correspond to a classification used for a particular development effort such as a group of classes, a sub-project, or a development team. As a result, the system may produce various metrics that produce memory usage information attributable to a more meaningful conceptual unit rather than, for example, function names. Accordingly, these attributions may be analyzed for forensic purposes to get a more meaningful picture of sources and causes of memory usage.
-
2.发明申请公开(公告)号：US20180088821A1
公开(公告)日：2018-03-29
申请号：US15275306
申请日：2016-09-23
申请人： Apple Inc.
CPC分类号： G06F9/546 , G06F9/5016
摘要： Described are a system and technique for collecting stack trace information of devices and analyzing this information to provide metrics with respect to memory usage. The memory analysis includes attributing the memory usage to particular development components by traversing a stack trace. For example, the development components may correspond to a classification used for a particular development effort such as a group of classes, a sub-project, or a development team. As a result, the system may produce various metrics that produce memory usage information attributable to a more meaningful conceptual unit rather than, for example, function names. Accordingly, these attributions may be analyzed for forensic purposes to get a more meaningful picture of sources and causes of memory usage.
-
搜索结果
2 条记录 (耗时 0.011 秒)
