公开(公告)号：US20220367169A1

公开(公告)日：2022-11-17

申请号：US17663085

申请日：2022-05-12

Applicant: Analytik Jena GmbH

Inventor： Roland Lehmann ,  Iouri Kalinitchenko

IPC: H01J49/42 ,  H01J49/40 ,  H01J49/10 ,  H01J49/00

Abstract: The present disclosure includes a mass spectrometry apparatus for analyzing an analyte sample, which comprises: an ion source from which a quantity of analyte ions from the analyte sample may be sourced for providing an ion beam; a mass analyzer serving to filter the analyte ions of the ion beam based on their mass-to-charge ratio; a first detector unit for analyzing the ions of the ion beam; and a second detector unit being based on the time-of-flight principle and comprising a second detector for analyzing the ions of the ion beam. The present disclosure further includes a method for analyzing an analyte sample using a mass spectrometry apparatus according to the present disclosure.

公开(公告)号：US20240429037A1

公开(公告)日：2024-12-26

申请号：US18731545

申请日：2024-06-03

Applicant: Analytik Jena GmbH+Co. KG

Inventor： Iouri Kalinitchenko ,  Wolfram Weisheit ,  Roland Lehmann

IPC: H01J49/06 ,  H01J49/04 ,  H01J49/10 ,  H01J49/24

Abstract: A mass spectrometer for analyzing an analyte sample includes: a plasma ion source configured to produce a plasma; an interface arrangement configured to form a plasma flux from the plasma and to direct the plasma flux toward a mass analyzer, wherein the interface arrangement includes a cone and a capillary tube, wherein the cone includes an orifice through which the plasma flux is directed, wherein the capillary tube includes an outlet arranged and configured to introduce the analyte sample into the plasma flux at the orifice or in a plasma expansion zone downstream of the orifice such that the analyte sample is ionized and ions are generated, wherein the outlet is in contact with the plasma flux; the mass analyzer, which is configured to filter and/or separate the generated ions; and a detector configured to detect the generated ions from the analyte sample.

公开(公告)号：US20220367167A1

公开(公告)日：2022-11-17

申请号：US17663074

申请日：2022-05-12

Applicant: Analytik Jena GmbH

Inventor： Roland Lehmann ,  Wolfram Weisheit ,  Iouri Kalinitchenko

IPC: H01J49/10 ,  H01J49/06 ,  H01J49/04 ,  H01J49/00

Abstract: A method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least including an interface structure, including a sampling or skimmer cone, and at least one passage with an inlet and an outlet into a reaction zone, the method including: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.

公开(公告)号：US11984310B2

公开(公告)日：2024-05-14

申请号：US17663074

申请日：2022-05-12

Applicant: Analytik Jena GmbH

Inventor： Roland Lehmann ,  Wolfram Weisheit ,  Iouri Kalinitchenko

IPC: H01J49/10 ,  H01J49/00 ,  H01J49/04 ,  H01J49/06

CPC classification number: H01J49/105 ,  H01J49/0031 ,  H01J49/0495 ,  H01J49/067

Abstract: A method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least including an interface structure, including a sampling or skimmer cone, and at least one passage with an inlet and an outlet into a reaction zone, the method including: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.

公开(公告)号：US20240094097A1

公开(公告)日：2024-03-21

申请号：US18466925

申请日：2023-09-14

Applicant: Analytik Jena GmbH+Co. KG

Inventor： Iouri Kalinitchenko ,  Wolfram Weisheit

IPC: G01N1/22 ,  G01N27/623

CPC classification number: G01N1/2273 ,  G01N27/623

Abstract: A system for analyzing a sample, wherein the sample is an air composition or an aerosol, includes: a sample preparation unit, including a sample inlet and a plasma torch, wherein the sample enters the system through the sample inlet, wherein the plasma torch is configured to produce a plasma, which ionizes the sample such that ions and/or photons are generated, wherein the plasma is configured to aspirate the sample through the sample inlet; an interface configured to guide the generated ions and/or photons towards a detector; the detector, which is configured to detect the generated ions and/or photons; and an evaluation unit configured to analyze the sample by means of the detected ions and/or photons.

公开(公告)号：US20240118212A1

公开(公告)日：2024-04-11

申请号：US18480681

申请日：2023-10-04

Applicant: Analytik Jena GmbH+Co. KG

Inventor： Marcus Großmann ,  Iouri Kalinitchenko ,  Wolfram Weisheit ,  Philipp Frederic Schulz

IPC: G01N21/71 ,  G01N21/73 ,  H01J49/10

CPC classification number: G01N21/718 ,  G01N21/73 ,  H01J49/105

Abstract: A method for analyzing a sample using a system, wherein the sample is a solid sample comprising a first chemical element and a second chemical element, wherein the system comprises a plasma spectrometer and an analytical device, the method including: determining a concentration of the first chemical element using the analytical device; determining a sensitivity of the plasma spectrometer to the first chemical element and to the second chemical element; measuring a signal intensity of the first chemical element using the plasma spectrometer; measuring a signal intensity of the second chemical element using the plasma spectrometer; and calculating a concentration of the second chemical element using the determined concentration of the first chemical element, the sensitivities to the first chemical element and to the second chemical element, and the signal intensities of the first chemical element and the second chemical element.