公开(公告)号：US09395400B1

公开(公告)日：2016-07-19

申请号：US13794172

申请日：2013-03-11

Applicant: Amazon Technologies, Inc.

Inventor： Rashed Adnan Islam ,  Saket Patil ,  Ian Charles Rust

IPC: G01R31/04 ,  G01R31/02 ,  G01N3/48

CPC classification number: G01R31/04 ,  G01M7/08 ,  G01N3/48 ,  G01R31/025 ,  G01R31/026 ,  G01R31/041

Abstract: This disclosure is directed to a test fixture to test a robustness of a connection port of an electronic device, a cable connector coupled to the connection port, or both. The test fixture may enable repeatable testing using predetermined test parameters. The test fixture may secure the electronic device using a clamp. A pendulum may be mounted in the test fixture and rotatable to cause an impact of a weight against a cable connector coupled to the connection port of an electronic device. After the impact, the integrity and/or functionality of the cable connector, the connection port, or both may be inspected. In accordance with one or more embodiments, the test fixture may be under at least partial control of a controller. The controller may enable creation or control of test parameters, repeat testing, cycle testing, and/or inspection (e.g., determining whether the connection is maintained and/or functional, etc.).

Abstract translation: 本公开涉及一种用于测试电子设备的连接端口，耦合到连接端口的电缆连接器或两者的鲁棒性的测试夹具。 测试夹具可以使用预定的测试参数实现可重复的测试。 测试夹具可以使用夹具固定电子设备。 摆锤可以安装在测试夹具中并且可旋转以引起重量抵靠耦合到电子设备的连接端口的电缆连接器的冲击。 在冲击之后，可以检查电缆连接器，连接端口或两者的完整性和/或功能。 根据一个或多个实施例，测试夹具可以处于控制器的至少部分控制之下。 控制器可以创建或控制测试参数，重复测试，循环测试和/或检查（例如，确定连接是否被维护和/或功能等）。

公开(公告)号：US09657904B1

公开(公告)日：2017-05-23

申请号：US14628565

申请日：2015-02-23

Applicant: Amazon Technologies, Inc.

Inventor： Guneet Sethi ,  Nhi A. Duong ,  Tin Quang Pham ,  Heather Kulani Coursey ,  Weihsin Hou ,  Robert L. D. Zenner ,  Saket Patil

IPC: G02F1/01 ,  F21K9/00 ,  F21V8/00

CPC classification number: G02B6/0073 ,  G02B6/0065

Abstract: Technologies are described herein for photobleaching a display. A display may be photobleached by exposing the display to light emitted by an external lamp and/or may be photobleached using one or more display lights of the electronic device during a burn-in period. In some examples, the light emitted by the lamp is filtered to remove wavelengths below a certain wavelength. The light that is received by the display from the lamp may include wavelengths between about 310 nm and 700 nm. These wavelengths correspond to visible light and near-visible light. The display may be exposed to the light for some duration or until some dose of light is received by the display. In other configurations, a burn-in period is performed for about eighteen hours.