APPARATUS FOR ACHIEVING CRYOGENIC TEMPERATURE IN MOVABLE SYSTEM
    5.
    发明申请
    APPARATUS FOR ACHIEVING CRYOGENIC TEMPERATURE IN MOVABLE SYSTEM 有权
    在可移动系统中实现低温的装置

    公开(公告)号:US20140230456A1

    公开(公告)日:2014-08-21

    申请号:US14178349

    申请日:2014-02-12

    Inventor: Osamu Tajima

    CPC classification number: F25B9/14 F25B9/10 F25D19/00

    Abstract: An apparatus for achieving a cryogenic temperature in a movable system, includes a rotating table, a vacuum chamber which is fixed on the rotating table, a cryogen-free refrigerator which has a cooling section inside the vacuum chamber, an inner cylinder which is fixed to a bottom of the rotating table, an outer cylinder which stores the inner cylinder such that the inner cylinder is rotatable and includes an outward and return gas port which is provided to be continuous with gas passages, a compressor which circulates gas to the cryogen-free refrigerator through the outward and return gas passages, and a rotary joint for wiring which is fixed to the inner cylinder and rotatably conducts electricity, wherein a piece of internal wiring is led through a through-hole and a hole, and electricity is supplied to a piece of equipment on the rotating table through the piece of internal wiring.

    Abstract translation: 一种用于在可移动系统中实现低温的装置,包括旋转台,固定在旋转台上的真空室,在真空室内具有冷却段的无冷冻冷藏库,固定在 旋转台的底部,外筒,其存储内筒,使得内筒可旋转并且包括设置成与气体通道连续的向外和返回气体端口;将气体循环到无冷冻剂的压缩机 冰箱通过向外和返回气体通道,以及用于布线的旋转接头,其被固定到内筒并可旋转地传导电力,其中一条内部布线被引导通过通孔和孔,并且电力被供应到 一块设备在旋转台上通过内部接线。

    OSCILLATION CIRCUIT AND ELECTRONIC DEVICE
    7.
    发明公开

    公开(公告)号:US20230291355A1

    公开(公告)日:2023-09-14

    申请号:US18006122

    申请日:2021-05-07

    CPC classification number: H03B5/364 H03B2200/0082 H03B2200/0012

    Abstract: An oscillation circuit includes an oscillator (X1), capacitors (C1, C2) connected between two terminals of the oscillator (X1), and an amplification circuit (A1) having an input terminal connected to a connecting point between the oscillator (X1) and the capacitor (C1) and an output terminal connected to a connecting point between the capacitor (C1) and the capacitor (C2). The amplification circuit (A1) includes an n-type transistor (M1) and a p-type transistor (M2) respectively having source terminals, the connecting point of which is connected to the output terminal of the amplification circuit (A1), a p-type transistor (M3) configured to connect a gate terminal of the n-type transistor (M1) to a power supply terminal at the time of an oscillation stop and disconnect the power supply terminal and the gate terminal of the n-type transistor (M1) at the time of an oscillation operation, and an n-type transistor (M4) configured to connect a gate terminal of the p-type transistor (M2) to ground at the time of the oscillation stop and disconnect a ground terminal and the gate terminal of the p-type transistor (M2) at the time of the oscillation operation. It is possible to implement low power consumption and high-speed oscillation activation of the oscillation circuit.

    Cell for X-ray analysis and X-ray analysis apparatus

    公开(公告)号:US10753889B2

    公开(公告)日:2020-08-25

    申请号:US16189004

    申请日:2018-11-13

    Abstract: Provided are a cell for X-ray analysis and an X-ray analysis apparatus that enable simultaneous X-ray diffraction and X-ray absorption fine structure measurements of a material (sample) in the same field of view on the sample (same position on the sample). The cell for X-ray analysis of the present invention enables simultaneous X-ray diffraction and X-ray absorption fine structure measurements of a sample in the same field of view on the sample and includes a furnace including a space where the sample is held and a focused heater heating the sample, a first window provided to the furnace and through which X-rays directed at the sample is incident, a second window provided to the furnace and from which X-rays emerging from the sample exit, a third window provided to the furnace, and a holder that positions the sample in the space. The cell for X-ray analysis makes it possible to simultaneously measure X-ray diffraction of the sample at outside of the second window and X-ray absorption fine structure of the sample through the third window.

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