摘要:
A testing card for a USB port includes first USB contacting pins, a second USB contacting pin, a transmitting circuits, a voltage converting circuit, and a testing portion. The first USB contacting pins are connected to the USB port to receive a number of USB signals. The second USB contacting pin is connected to the USB port to receive a voltage signal from the USB port. The transmitting circuit is electrically connected to the first USB contacting pins to transmit the USB signals therefrom. The voltage converting circuit is electrically connected to the second USB contacting pin to convert the voltage signal to a predetermined level. The testing portion is electrically connected to the outputs of the transmitting circuit and the voltage converting circuit to receive the USB signals and the converted voltage signal.
摘要:
A test apparatus includes a circuit board. The circuit board includes a number of first golden fingers arranged on a first side of the circuit board, and a first test circuit. The first test circuit includes a first capacitor. A first terminal of the first capacitor is grounded. A second terminal of the first capacitor is electrically connected to a first pin of the first golden fingers. A first test pad is connected to the second terminal of the first capacitor. A second test pad is connected to a second pin of the first golden fingers. The second pin is grounded.
摘要:
A test apparatus includes a circuit board and a peripheral component interconnect (PCI) expansion slot. A number of golden fingers are arranged at a first side of the circuit board. A second side of the circuit board is connected to a bottom of the PCI expansion slot. The golden fingers are electrically connected to the PCI expansion slot. A number of first test pads and second test pads are arranged on the circuit board between the first and second sides. The first and second test pads have different shapes, sizes, and/or colors. The first and second test pads are electrically connected to the PCI expansion slot correspondingly.
摘要:
In a method for testing a high-definition multimedia interface (HDMI) of a computing device, tests are individually selected and applied to the HDMI. A source code file of the selected test is obtained from a storage system of the computing device. The parameters of the selected test and display resolutions of a display device of the computing device are set. The obtained source code file are executed to apply the selected test to the HDMI according to the set parameters and the display resolutions. After the source code has been executed, the test results are stored.
摘要:
A PCI Express interface testing apparatus for testing characteristics of signal transmissions of a PCI Express interface includes a printed circuit board, a plurality of sending signal connectors, and a plurality of receiving signals connectors. Both the sending signal connectors and the receiving signal connectors are electrically connected to the printed circuit board. A related method for testing the characteristics of signal transmissions of a PCI Express interface is also provided.
摘要:
A testing card for a USB port includes first USB contacting pins, a second USB contacting pin, a transmitting circuits, a voltage converting circuit, and a testing portion. The first USB contacting pins are connected to the USB port to receive a number of USB signals. The second USB contacting pin is connected to the USB port to receive a voltage signal from the USB port. The transmitting circuit is electrically connected to the first USB contacting pins to transmit the USB signals therefrom. The voltage converting circuit is electrically connected to the second USB contacting pin to convert the voltage signal to a predetermined level. The testing portion is electrically connected to the outputs of the transmitting circuit and the voltage converting circuit to receive the USB signals and the converted voltage signal.
摘要:
A test apparatus includes a circuit board and an expansion slot. A number of golden fingers are arranged on a first side of the circuit board. A second side of the circuit board is connected to a bottom of the expansion slot. The golden fingers are electrically connected to the expansion slot. A number of first test pads and second test pads are arranged on the circuit board between the first side and the second side. The first and second test pads have different shapes, sizes, and/or colors. The first and second test pads are electrically connected to pins in the expansion slot.
摘要:
In a test data management method, an electronic signal that needed to be tested of an electronic device is select. A predefined template file of a test report of the electronic signal is generated. Test data of the electronic signal is obtained from a test file, and is inserted into predetermined locations of the template file. The test report of the electronic signal is generated according to the template file and the inserted test data, and the test report is stored into a storage system of a computing device.
摘要:
A connection apparatus for connecting a mobile peripheral component interconnect express module (MXM) interface to a test apparatus includes a circuit board, a golden finger connector, and a group of signal test contacts. The test contacts are connected to the golden finger connector and configured for connection to the testing apparatus. When the circuit board is inserted into a MXM interface, the test contacts connect to the MXM interface.
摘要:
A test apparatus includes a circuit board. The circuit board includes a number of first golden fingers arranged on a first side of the circuit board, and a first test circuit. The first test circuit includes a first capacitor. A first terminal of the first capacitor is grounded. A second terminal of the first capacitor is electrically connected to a first pin of the first golden fingers. A first test pad is connected to the second terminal of the first capacitor. A second test pad is connected to a second pin of the first golden fingers. The second pin is grounded.