Method and device for the digital detection of transparent and opaque documents
    1.
    发明授权
    Method and device for the digital detection of transparent and opaque documents 失效
    用于数字检测透明和不透明文档的方法和设备

    公开(公告)号:US06366367B1

    公开(公告)日:2002-04-02

    申请号:US09254380

    申请日:1999-03-05

    IPC分类号: H04N104

    摘要: The invention relates to a method and device used for the digital detection of transparent and opaque documents, comprising a CCD pick-up element, a document holder, an illuminating device and elements for covering the edges (masking unit) of the documents. The method comprises the following steps: a) placing the document on the document holder; b) determining the size of the document; c) automatically adjusting a zoom objective, assigned to the scanner, in relation to the document; d) automatically adjusting the masking to the document size; e) beginning the exposure process; f) automatically adjusting the illumination by determining the dynamic range of the image intensity; g) exposing the CCD chip in the camera (one shot); h) memorizing the digitized data in a PC memory; i) further processing the memorized data in the PC or in an external data processing installation.

    摘要翻译: 本发明涉及一种用于数字检测透明和不透明文件的方法和装置,包括CCD拾取元件,文件夹,照明装置和用于覆盖文件边缘(掩蔽单元)的元件。 该方法包括以下步骤:a)将文件放在文件夹上; b)确定文件的大小; c)相对于文件自动调整分配给扫描仪的缩放目标; d)自动调整屏蔽到文档大小; e)开始曝光过程; f)通过确定图像强度的动态范围来自动调节照明; g)将相机中的CCD芯片曝光(一次); h)将数字化数据存储在PC存储器中; i)在PC或外部数据处理设备中进一步处理存储的数据。

    Method and interference microscope for microscoping an object in order
to obtain a resolution beyond the diffraction limit (high resolution)
    2.
    发明授权
    Method and interference microscope for microscoping an object in order to obtain a resolution beyond the diffraction limit (high resolution) 失效
    方法和干涉显微镜用于显微镜物体,以获得超过衍射极限的分辨率(高分辨率)

    公开(公告)号:US5995227A

    公开(公告)日:1999-11-30

    申请号:US793218

    申请日:1997-02-19

    IPC分类号: G01B9/02 G01B9/04 G01B11/00

    CPC分类号: G01B9/04

    摘要: The invention relates to a method for microscoping an object with a (phase-measurement) interference microscope with extremely high resolution, in which the light beam of a light source is divided into at least two coherent part beams, of which at least one serves for illuminating the object, and whereby the part beams are interferingly combined again and supplied to an interference figure detector screened into image zones, for achieving a resolution beyond the diffraction limit. Furthermore, the invention relates to an interference microscope, preferably for carrying out the above method. The method according to the invention is characterized in that by means of a zooming system with adjustable enlargement, said system being connected upstream of the interference figure detector, an enlargement is adjusted by which the location uncertainty to be determined is allocated to a part zone of an image zone of the detector screen by using for the zoom adjustment through a feedback the image information of the interference figure detector of at least one preceding picture recording on the basis of a phase image computed therefrom.

    摘要翻译: PCT No.PCT / DE95 / 01073 Sec。 371日期1997年2月19日 102(e)1997年2月19日PCT PCT 1995年8月16日PCT公布。 公开号WO96 / 06324 日期:1996年2月29日本发明涉及一种用具有极高分辨率的(相位测量)干涉显微镜显微物体的方法,其中将光源的光束分成至少两个相干部分光束,其中 至少一个用于照亮物体,并且由此部分光束再次被干涉地组合并提供给被屏蔽到图像区域中的干涉图检测器,以实现超过衍射极限的分辨率。 此外,本发明涉及干涉式显微镜,优选用于实施上述方法。 根据本发明的方法的特征在于,通过具有可调放大的变焦系统,所述系统连接在干涉图检测器的上游,调整放大位置,将要确定的位置不确定度分配给 基于由其计算的相位图像,通过反馈使用至少一个先前图像记录的干涉图检测器的图像信息来使用来进行变焦调整的检测器屏幕的图像区域。