公开(公告)号：US5520329A

公开(公告)日：1996-05-28

申请号：US221812

申请日：1994-04-01

Applicant: Russell M. Clinton, III ,  William P. Jones ,  Mark A. Roffman

Inventor： Russell M. Clinton, III ,  William P. Jones ,  Mark A. Roffman

IPC: G01W1/17 ,  G05D23/20 ,  G01K3/00

CPC classification number: G01W1/17 ,  G05D23/1931 ,  G05D23/20

Abstract: A method and apparatus for measuring and compensating for the impact of environmental effects on industrial processing units. A thermal test element having a low thermal mass and high conductivity is exposed to the environment. Ambient air temperature is sensed at a nearby location, and a differential temperature controller determines how much energy is required to maintain the test element at a desired temperature differential from ambient temperature. Duty cycle and wattage outputs enable feedforward compensation for environmentally induced process unit control disturbances.

Abstract translation: 一种用于测量和补偿环境影响对工业加工单位的影响的方法和装置。 具有低热质量和高导电性的热测试元件暴露于环境中。 在附近的位置感测环境空气温度，并且差温控制器确定将测试元件保持在与环境温度不同的期望温度所需的能量。 占空比和功率输出使得能够对环境引起的过程单元控制干扰进行前馈补偿。