摘要:
An amplifier may include two or more pulse-width modulators controlling respective sets of switches to produce an amplified version of a source signal. A positive DC-offset based on the source signal may be applied to the pulse-width modulator controlling one respective set of switches, and an equal value negative DC-offset may be applied to the pulse-width modulator controlling the other respective set of switches, to provide an effective offset between the respective points in time of the rising/falling edges of the different pulse-width modulated control signals. The addition of alternating positive and negative DC-offset values doesn't affect the output load, and doesn't degrade the signal. The DC-offsets may be added at a frequency selected to be beyond the signal baseband, and the value of the small input signal level may be determined using an RMS level comparator or similar measurement technique.
摘要:
An amplifier may include two or more pulse-width modulators (PWMs) controlling respective sets of switches to produce an amplified version of a source signal. The clocking for the amplifier may be controlled to delay signal processing within the PWMs relative to one another in time, thereby providing an effective time offset between the respective edge transitions of the controlling signals provided to the respective sets of switches. The PWMs may count down to zero from the next PWM duty-cycle value when a new data sample is detected, beginning a new count for each new sample, with the PWM outputting a pulse when the counter value is nonzero. A “data-sample-ready” signal may be decoded from a master counter, which may be clocked based on the high speed PWM clock, and the decode value may be adjusted to determine when the PWM should initialize to the next data sample.
摘要:
Predicting simultaneous switching output noise of an IC device is described. User input is obtained. The user input includes: an identification of an input/output bank of an integrated circuit die; an identification of a device package substrate to which the integrated circuit die is to be attached; and an identification of input/output interface to be used by the input/output bank. A noise factor and an impedance are selected responsive to the user input. The noise factor is multiplied with the impedance to provide a result. The result, which is output, is a prediction of the simultaneous switching output noise of the integrated circuit device.
摘要:
Induced crosstalk is predicted for the input/output pins of a programmable logic device. Signal edge rates for the input/output pin are determined from selected interface protocols for the input/output pins. For each pair of the input/output pins, a first coupling coefficient specifies a coupling between the pair of input/output pins within a package for mounting the programmable logic device to a printed circuit board. A depth is input for each via coupled to an input/output pin by the printed circuit board. From the via depths, a second coupling coefficient is determined for each pair of the input/output pins that satisfy a separation criterion. For each of the input/output pins, a predicted value of an induced crosstalk is determined from the first and second coupling coefficients for each pair that includes the input/output pin and another input/output pin, and from the signal edge rate of this other input/output pin.
摘要:
Transient processing mechanisms for power converters. Error generation circuitry in a power converter may generate an error signal based on the difference between a power converter output voltage and a reference voltage. Transient detection circuitry may detect whether the error signal exceeds at least a first threshold. If the first threshold is exceeded, timing control logic may generate a low band correction pulse to adjust the power converter output voltage, and thereby adjust the error signal to a level within the first threshold. If the error signal exceeds a second threshold, the timing control logic may generate a high band correction pulse to adjust the power converter output voltage, and thereby adjust the error signal to a level within the second threshold. The timing control logic may initiate a low band blanking period following the low band correction pulse and high band blanking period following the high band correction pulse.
摘要:
Transient processing mechanisms for power converters. Error generation circuitry in a power converter may generate an error signal based on the difference between a power converter output voltage and a reference voltage. Transient detection circuitry may detect whether the error signal exceeds at least a first threshold. If the first threshold is exceeded, timing control logic may generate a low band correction pulse to adjust the power converter output voltage, and thereby adjust the error signal to a level within the first threshold. If the error signal exceeds a second threshold, the timing control logic may generate a high band correction pulse to adjust the power converter output voltage, and thereby adjust the error signal to a level within the second threshold. The timing control logic may initiate a low band blanking period following the low band correction pulse and high band blanking period following the high band correction pulse.
摘要:
An amplifier may include two or more pulse-width modulators (PWMs) controlling respective sets of switches to produce an amplified version of a source signal. The clocking for the amplifier may be controlled to delay signal processing within the PWMs relative to one another in time, thereby providing an effective time offset between the absolute moment in time of the edge transition of the controlling signals to the respective sets of switches. The PWMs may include a decrementor that counts down to zero from the next PWM duty-cycle value when a new data sample is detected, beginning a new count when the next sample is present. The PWM output may correspond to the counter value, outputting a pulse when the counter value is nonzero. A “data-sample-ready” signal may be decoded from a master counter, which may be clocked based on the high speed PWM clock, and the delay mechanism may be based on adjusting the decode value to determine when the PWM should initialize to the next data sample.
摘要:
An IC uses a tunable interconnect driver between a data source and a data destination to selectively slow down (“de-tune”) data signals. Data sent along relatively short paths are de-tuned to reduce power supply noise during synchronous switching events. In some embodiments, the tunable interconnect driver delays data transmission relative to an un-delayed signal path, in other embodiments, the slew rate of the tunable interconnect driver is selectively reduced.
摘要:
A packaged integrated circuit (“IC”) includes a substrate, an IC die, and a molded plastic lid. A test point standoff is electrically connected to the IC die and extends away from the surface of the package substrate through the molded plastic lid toward the top surface of the molded plastic lid. The top of the test point standoff is below the top surface of the molded plastic lid.
摘要:
A packaged semiconductor device uses built-in self test to characterize voltage between points within the semiconductor die during a current discontinuity generated in the semiconductor die. The semiconductor die is operated to generate a current discontinuity, or several sequential current discontinuities, and the voltage is measured with an on-chip ADC. Measuring the voltage within the semiconductor die, rather than measuring at external test points, provides a more accurate prediction of device operation. Multiple test points are measured using a multiplexer, multiple ADCs, or by reconfiguring an FPGA. Impedance versus frequency information of the greater power distribution system connected to the semiconductor die is obtained by transforming the voltage and current through the semiconductor die measured during a current discontinuity.