Abstract:
An electronic module (100) has a first and a second circuit (200, 300) with respective first and second output connections (230, 330), respective first and second reference potential connections (220, 320), and respective first and second sensing connections (240, 340), each circuit (200, 300) comprising a respective sensing block (250, 350), which at its input side is connected to the respective sensing connection (240, 340) and to the respective reference potential connection (220, 320). The first sensing connection (240) is either connected to the first output connection (230) or to the second output connection (330). The second sensing connection (340) is connected to the second output connection (330). The sensing blocks (250, 350) are configured to detect a failure of the electronic module (100) with respect to its respective reference potential connection (220, 320) and to indicate a detected failure by providing a failure signal at its respective output connection (230, 330).
Abstract:
A coupling circuit has a first and a second transistor (P1, P2) of a p-channel field-effect transistor type. A drain terminal of the first transistor (P1) is connected to a signal input (1), source terminals of the first and the second transistor (P1, P2) are commonly connected to a signal output (2), bulk terminals of the first and the second transistor (P1, P2) are commonly connected to a drain terminal of the second transistor (P2), and a gate terminal of the first transistor (P1) is connected to a gate terminal of the second transistor (P2). The coupling circuit further comprises a gate control circuit (10) with a charge pump circuit (110) which is configured to generate a negative potential. The gate control circuit (10) is configured to control a gate voltage at the gate terminals of the first and the second transistor (P1, P2) based on a negative potential.
Abstract:
An electronic module (100) has a first and a second circuit (200, 300) with respective first and second output connections (230, 330), respective first and second reference potential connections (220, 320), and respective first and second sensing connections (240, 340), each circuit (200, 300) comprising a respective sensing block (250, 350), which at its input side is connected to the respective sensing connection (240, 340) and to the respective reference potential connection (220, 320). The first sensing connection (240) is either connected to the first output connection (230) or to the second output connection (330). The second sensing connection (340) is connected to the second output connection (330). The sensing blocks (250, 350) are configured to detect a failure of the electronic module (100) with respect to its respective reference potential connection (220, 320) and to indicate a detected failure by providing a failure signal at its respective output connection (230, 330).
Abstract:
A coupling circuit has a first and a second transistor (P1, P2) of a p-channel field-effect transistor type. A drain terminal of the first transistor (P1) is connected to a signal input (1), source terminals of the first and the second transistor (P1, P2) are commonly connected to a signal output (2), bulk terminals of the first and the second transistor (P1, P2) are commonly connected to a drain terminal of the second transistor (P2), and a gate terminal of the first transistor (P1) is connected to a gate terminal of the second transistor (P2). The coupling circuit further comprises a gate control circuit (10) with a charge pump circuit (110) which is configured to generate a negative potential. The gate control circuit (10) is configured to control a gate voltage at the gate terminals of the first and the second transistor (P1, P2) based on a negative potential.