摘要:
Embodiments of the invention include a test and measurement device, system, and method for synchronizing measurement views and configuration parameters across multiple input channels or devices. A method includes receiving signals under test associated with multiple input channels of the test and measurement instrument or with multiple devices, selecting a measurement view of one input signal or device, receiving a synchronized view enable preference from a user control interface, and synchronizing the measurement view or configuration parameters of the other signals or devices with what was chosen on the first signal or device. A test and measurement instrument includes input terminals to receive the input signals, a user control interface to receive input from an operator, a display to provide measurement information about the input signals, and a synchronization control unit to synchronize measurement views and/or configuration parameters between the inputs or devices.
摘要:
Signals suitable for displaying the phase relationship between the subcarrier wave and the horizontal sync pulse of a composite video signal are provided by establishing coincidence between the d.c. level of the 50 percent point of the sync pulse and the zero crossing point of the subcarrier wave, and generating a reference voltage level at the d.c. level of the 50 percent point of the sync pulse.
摘要:
A test signal generator applies a test pattern to a device under test. The output of the device under test is displayed on a video picture monitor. The test signal generator inserts a cursor into the test pattern, the position of the cursor within the test pattern being variable. From the cursor the test signal generator also generates a trigger signal. The trigger signal may be used to trigger the horizontal sweep of a waveform display device to which the output of the device under device is input. By observing the picture monitor an operator may adjust the cursor to a position just prior to an anomaly in the displayed test pattern so that only that portion of the output waveform of the device under test in the vicinity of the cursor is displayed on the waveform display device.
摘要:
Embodiments of the invention include a test and measurement device, system, and method for synchronizing measurement views and configuration parameters across multiple input channels or devices. A method includes receiving signals under test associated with multiple input channels of the test and measurement instrument or with multiple devices, selecting a measurement view of one input signal or device, receiving a synchronized view enable preference from a user control interface, and synchronizing the measurement view or configuration parameters of the other signals or devices with what was chosen on the first signal or device. A test and measurement instrument includes input terminals to receive the input signals, a user control interface to receive input from an operator, a display to provide measurement information about the input signals, and a synchronization control unit to synchronize measurement views and/or configuration parameters between the inputs or devices.
摘要:
A synchronous changeover device detects both peak amplitude and pulse width, automatically switching between sets of signals without a noticeable glitch when a fault is detected. The signals of each set are peak detected and combined so that if any signal of a set falls below a predetermined value a FAIL signal is output to a switch timing and control circuit. The FAIL signal, together with the sync signals from the sets of signals, causes an electronic switch to switch from one set of inputs to another between sync pulses, resulting in a synchronous changeover. Further the signals are input to a start/stop counter via a multiplexer under control of a microprocessor. The counter counts the number of pulses of a reference signal between the start and stop of a selected signal pulse, and the microprocessor determines if the pulse width is within acceptable limits. Out of limits pulse widths cause the microprocessor also to generate the FAIL signal to automatically switch between sets of signals.