发明申请
US20110242333A1 TEST AND MEASUREMENT DEVICE, SYSTEM, AND METHOD FOR PROVIDING SYNCHRONIZED MEASUREMENT VIEWS
有权
用于提供同步测量视图的测试和测量装置,系统和方法
- 专利标题: TEST AND MEASUREMENT DEVICE, SYSTEM, AND METHOD FOR PROVIDING SYNCHRONIZED MEASUREMENT VIEWS
- 专利标题(中): 用于提供同步测量视图的测试和测量装置,系统和方法
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申请号: US12754583申请日: 2010-04-05
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公开(公告)号: US20110242333A1公开(公告)日: 2011-10-06
- 发明人: XINYU ZHU , BARRY A. MCKIBBEN , LAURENT A. MELLING, JR. , KEVIN T. IVERS , MICHAEL S. OVERTON
- 申请人: XINYU ZHU , BARRY A. MCKIBBEN , LAURENT A. MELLING, JR. , KEVIN T. IVERS , MICHAEL S. OVERTON
- 申请人地址: US OR BEAVERTON
- 专利权人: TEKTRONIX, INC.
- 当前专利权人: TEKTRONIX, INC.
- 当前专利权人地址: US OR BEAVERTON
- 主分类号: H04N17/00
- IPC分类号: H04N17/00
摘要:
Embodiments of the invention include a test and measurement device, system, and method for synchronizing measurement views and configuration parameters across multiple input channels or devices. A method includes receiving signals under test associated with multiple input channels of the test and measurement instrument or with multiple devices, selecting a measurement view of one input signal or device, receiving a synchronized view enable preference from a user control interface, and synchronizing the measurement view or configuration parameters of the other signals or devices with what was chosen on the first signal or device. A test and measurement instrument includes input terminals to receive the input signals, a user control interface to receive input from an operator, a display to provide measurement information about the input signals, and a synchronization control unit to synchronize measurement views and/or configuration parameters between the inputs or devices.
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