公开(公告)号：US08095907B2

公开(公告)日：2012-01-10

申请号：US11874950

申请日：2007-10-19

Applicant: Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert McMahon

Inventor： Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert McMahon

IPC: G06F17/50

CPC classification number: G06F17/5045 ,  G01R31/2894

Abstract: A method of reliability evaluation and system fail warning using on chip parametric monitors. The method includes determining impact of parametric variation on reliability by identifying key parametric questions to be answered by stress, identifying parametric macros for each parameter, and identifying layout sensitive areas of evaluation. The process can also include a set of parametric macros in one of a test site or a product to be stressed, testing the set of parametric macros prior to start of stress and at each stress read out, and setting life time parameter profile for technology.

Abstract translation: 使用片上参数监视器的可靠性评估和系统故障警告的方法。 该方法包括通过识别应力应答的关键参数问题来确定参数变化对可靠性的影响，识别每个参数的参数宏，以及识别布局敏感的评估区域。 该过程还可以包括一组测试点或要压力的产品中的参数宏，在开始应力之前和每次读出压力时测试一组参数宏，并设置技术的寿命参数轮廓。

公开(公告)号：US07656182B2

公开(公告)日：2010-02-02

申请号：US11689150

申请日：2007-03-21

Applicant: Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert J. McMahon

Inventor： Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert J. McMahon

IPC: G01R31/26

CPC classification number: G01R31/2894 ,  G01R31/2831 ,  G01R31/30

Abstract: Disclosed are testing method embodiments in which, during post-manufacture testing, parametric measurements are taken from on-chip parametric measurement elements and used to optimize manufacturing in-line parametric control learning and/or to optimize product screening processes. Specifically, these post-manufacture parametric measurements can be used to disposition chips without shipping out non-conforming products, without discarding conforming products, and without requiring high cost functional tests. They can also be used to identify yield sensitivities to parametric variations from design and to provide feedback for manufacturing line improvements based on the yield sensitivities. Additionally, a historical database regarding the key parameters that are monitored at both the fabrication and post-fabrication levels can be used to predict future yield and, thereby, to preemptively improve the manufacturing line and/or also to update supply chain forecasts.

Abstract translation: 公开了测试方法实施例，其中在后制造测试中，参数测量取自片上参数测量元件，并用于优化制造在线参数控制学习和/或优化产品筛选过程。 具体来说，这些后期制造参数测量可用于配置芯片，而不会丢弃不合格的产品，而不会丢弃符合要求的产品，并且不需要高成本的功能测试。 它们也可以用于识别来自设计的参数变化的产量敏感性，并且基于产量灵敏度为制造线改进提供反馈。 此外，关于在制造和制造后水平上监测的关键参数的历史数据库可用于预测未来产量，从而预先改进生产线和/或更新供应链预测。

公开(公告)号：US20090106712A1

公开(公告)日：2009-04-23

申请号：US11874950

申请日：2007-10-19

Applicant: Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert McMahon

Inventor： Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert McMahon

IPC: G06F17/50

CPC classification number: G06F17/5045 ,  G01R31/2894

Abstract: A method of reliability evaluation and system fail warning using on chip parametric monitors. The method includes determining impact of parametric variation on reliability by identifying key parametric questions to be answered by stress, identifying parametric macros for each parameter, and identifying layout sensitive areas of evaluation. The process can also include a set of parametric macros in one of a test site or a product to be stressed, testing the set of parametric macros prior to start of stress and at each stress read out, and setting life time parameter profile for technology.

Abstract translation: 使用片上参数监视器的可靠性评估和系统故障警告的方法。 该方法包括通过识别应力应答的关键参数问题来确定参数变化对可靠性的影响，识别每个参数的参数宏，以及识别布局敏感的评估区域。 该过程还可以包括一组测试点或要压力的产品中的参数宏，在开始应力之前和每次读出压力时测试一组参数宏，并设置技术的寿命参数轮廓。

公开(公告)号：US20120105240A1

公开(公告)日：2012-05-03

申请号：US13344178

申请日：2012-01-05

Applicant: Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert McMahon

Inventor： Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert McMahon

IPC: G08B21/00 ,  G06F17/50

CPC classification number: G06F17/5045 ,  G01R31/2894

Abstract: A method of reliability evaluation and system fail warning using on chip parametric monitors. The method includes determining impact of parametric variation on reliability by identifying key parametric questions to be answered by stress, identifying parametric macros for each parameter, and identifying layout sensitive areas of evaluation. The process can also include a set of parametric macros in one of a test site or a product to be stressed, testing the set of parametric macros prior to start of stress and at each stress read out, and setting life time parameter profile for technology.

Abstract translation: 使用片上参数监视器的可靠性评估和系统故障警告的方法。 该方法包括通过识别应力应答的关键参数问题来确定参数变化对可靠性的影响，识别每个参数的参数宏，以及识别布局敏感的评估区域。 该过程还可以包括一组测试点或要压力的产品中的参数宏，在开始应力之前和每次读出压力时测试一组参数宏，并设置技术的寿命参数轮廓。

公开(公告)号：US07904839B2

公开(公告)日：2011-03-08

申请号：US11954646

申请日：2007-12-12

Applicant: John R. Goss ,  Paul J. Grzymkowski ,  Robert McMahon

Inventor： John R. Goss ,  Paul J. Grzymkowski ,  Robert McMahon

IPC: G06F17/50

CPC classification number: G06F21/62 ,  G06F21/70

Abstract: A circuitry access system for controlling access to addressable circuit elements of an integrated circuit. The circuitry access system includes a first storage element having a first listing of unique identifiers each identifier representing one of the addressable circuit elements. A selector distinguishes a first subset of unique identifiers from the first listing. A second storage element receives and stores the first subset in an arrangement that does not include an indication of the absence of any unique identifier of the first listing that is not included in the first subset. An output of second storage element allows a user of the integrated circuit to access one or more of the addressable circuit elements corresponding to the first subset of unique identifiers. A method of controlling access to addressable circuit elements is also provided.

Abstract translation: 一种用于控制对集成电路的可寻址电路元件的访问的电路接入系统。 电路接入系统包括第一存储元件，其具有唯一标识符的第一列表，每个标识符表示可寻址电路元件之一。 选择器将唯一标识符的第一子集与第一列表区分开。 第二存储元件以不包括没有包括在第一子集中的第一列表的任何唯一标识符的指示的布置来接收和存储第一子集。 第二存储元件的输出允许集成电路的用户访问对应于唯一标识符的第一子集的一个或多个可寻址电路元件。 还提供了一种控制对可寻址电路元件的访问的方法。

公开(公告)号：US20090180584A1

公开(公告)日：2009-07-16

申请号：US12175534

申请日：2008-07-18

Applicant: Darren L. Anand ,  John R. Goss ,  Peter O. Jakobsen ,  Michael R. Ouellette ,  Thomas O. Sopchak ,  Donald L. Wheater

Inventor： Darren L. Anand ,  John R. Goss ,  Peter O. Jakobsen ,  Michael R. Ouellette ,  Thomas O. Sopchak ,  Donald L. Wheater

IPC: G11C19/00

CPC classification number: G11C19/00 ,  G11C29/003

Abstract: The invention provides a circuit that can observe data within shift registers without altering the data. The circuit includes selectors connected to the inputs and outputs of the shift registers. The selectors selectively connect the input with the output of a selected shift register to form a wiring loop for the selected shift register. A control device connected to the wiring loop uses the wiring loop to cause the data to be continually transferred from the output of the selected shift register to the input of the selected shift register and back through the selected shift register in a circular manner. The control device includes a counter used for determining the length of a selected shift register and a set of registers to store, for future use when rotating data in the shift registers, the length of each shift register. The control device also includes a data output accessible from outside the circuit. An observation wire is connected to the wiring loop, and the data passes from the wiring loop to the control device through the observation wire. The control device outputs data appearing on the wiring loop as the data is circulated through the selected shift register to permit data within the selected shift register to be observed outside the circuit without altering the data within the selected shift register.

Abstract translation: 本发明提供一种可以观察移位寄存器内的数据而不改变数据的电路。 该电路包括连接到移位寄存器的输入和输出的选择器。 选择器选择性地将输入与所选移位寄存器的输出连接，以形成所选移位寄存器的布线回路。 连接到布线回路的控制装置使用布线回路使得数据从所选择的移位寄存器的输出连续地传送到所选择的移位寄存器的输入端并循环地返回所选择的移位寄存器。 控制装置包括用于确定所选择的移位寄存器的长度的计数器和一组寄存器，用于存储当在移位寄存器中旋转数据时将来使用的每个移位寄存器的长度。 控制装置还包括从电路外部可访问的数据输出。 观察线连接到布线回路，数据通过观察线从布线回路传递到控制装置。 当数据通过选定的移位寄存器循环时，控制装置输出出现在布线环路上的数据，以允许在电路外观察所选移位寄存器内的数据，而不改变所选移位寄存器内的数据。

公开(公告)号：US20080231307A1

公开(公告)日：2008-09-25

申请号：US11689150

申请日：2007-03-21

Applicant: Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert J. McMahon

Inventor： Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert J. McMahon

IPC: G01R31/26

CPC classification number: G01R31/2894 ,  G01R31/2831 ,  G01R31/30

Abstract: Disclosed are testing method embodiments in which, during post-manufacture testing, parametric measurements are taken from on-chip parametric measurement elements and used to optimize manufacturing in-line parametric control learning and/or to optimize product screening processes. Specifically, these post-manufacture parametric measurements can be used to disposition chips without shipping out non-conforming products, without discarding conforming products, and without requiring high cost functional tests. They can also be used to identify yield sensitivities to parametric variations from design and to provide feedback for manufacturing line improvements based on the yield sensitivities. Additionally, a historical database regarding the key parameters that are monitored at both the fabrication and post-fabrication levels can be used to predict future yield and, thereby, to preemptively improve the manufacturing line and/or also to update supply chain forecasts.

Abstract translation: 公开了测试方法实施例，其中在后制造测试中，参数测量取自片上参数测量元件，并用于优化制造在线参数控制学习和/或优化产品筛选过程。 具体来说，这些后期制造参数测量可用于配置芯片，而不会丢弃不合格的产品，而不会丢弃符合要求的产品，并且不需要高成本的功能测试。 它们也可以用于识别来自设计的参数变化的产量敏感性，并且基于产量灵敏度为制造线改进提供反馈。 此外，关于在制造和制造后水平上监测的关键参数的历史数据库可用于预测未来产量，从而预先改进生产线和/或更新供应链预测。

公开(公告)号：US07453973B2

公开(公告)日：2008-11-18

申请号：US11533907

申请日：2006-09-21

Applicant: Darren L. Anand ,  John R. Goss ,  Peter O. Jacobsen ,  Michael R. Ouellette ,  Thomas G. Sopchak ,  Donald L. Wheater

Inventor： Darren L. Anand ,  John R. Goss ,  Peter O. Jacobsen ,  Michael R. Ouellette ,  Thomas G. Sopchak ,  Donald L. Wheater

IPC: G11C19/00

CPC classification number: G11C19/00 ,  G11C29/003

Abstract: The invention provides a circuit that can observe data within shift registers without altering the data. The circuit includes selectors connected to the inputs and outputs of the shift registers. The selectors selectively connect the input with the output of a selected shift register to form a wiring loop for the selected shift register. A control device connected to the wiring loop uses the wiring loop to cause the data to be continually transferred from the output of the selected shift register to the input of the selected shift register and back through the selected shift register in a circular manner. The control device includes a counter used for determining the length of a selected shift register and a set of registers to store, for future use when rotating data in the shift registers, the length of each shift register. The control device also includes a data output accessible from outside the circuit. An observation wire is connected to the wiring loop, and the data passes from the wiring loop to the control device through the observation wire. The control device outputs data appearing on the wiring loop as the data is circulated through the selected shift register to permit data within the selected shift register to be observed outside the circuit without altering the data within the selected shift register.

Abstract translation: 本发明提供一种可以观察移位寄存器内的数据而不改变数据的电路。 该电路包括连接到移位寄存器的输入和输出的选择器。 选择器选择性地将输入与所选移位寄存器的输出连接，以形成所选移位寄存器的布线回路。 连接到布线回路的控制装置使用布线回路使得数据从所选择的移位寄存器的输出连续地传送到所选择的移位寄存器的输入端并循环地返回所选择的移位寄存器。 控制装置包括用于确定所选择的移位寄存器的长度的计数器和一组寄存器，用于存储当在移位寄存器中旋转数据时将来使用的每个移位寄存器的长度。 控制装置还包括从电路外部可访问的数据输出。 观察线连接到布线回路，数据通过观察线从布线回路传递到控制装置。 当数据通过选定的移位寄存器循环时，控制装置输出出现在布线环路上的数据，以允许在电路外观察所选移位寄存器内的数据，而不改变所选移位寄存器内的数据。

公开(公告)号：US08504975B2

公开(公告)日：2013-08-06

申请号：US13344178

申请日：2012-01-05

Applicant: Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert McMahon

Inventor： Jeanne P. Bickford ,  John R. Goss ,  Nazmul Habib ,  Robert McMahon

IPC: G06F17/50

CPC classification number: G06F17/5045 ,  G01R31/2894

Abstract: A method of reliability evaluation and system fail warning using on chip parametric monitors. The method includes determining impact of parametric variation on reliability by identifying key parametric questions to be answered by stress, identifying parametric macros for each parameter, and identifying layout sensitive areas of evaluation. The process can also include a set of parametric macros in one of a test site or a product to be stressed, testing the set of parametric macros prior to start of stress and at each stress read out, and setting life time parameter profile for technology.

公开(公告)号：US07916826B2

公开(公告)日：2011-03-29

申请号：US12175534

申请日：2008-07-18

Applicant: Darren L. Anand ,  John R. Goss ,  Peter O. Jakobsen ,  Michael R. Ouellette ,  Thomas O. Sopchak ,  Donald L. Wheater

Inventor： Darren L. Anand ,  John R. Goss ,  Peter O. Jakobsen ,  Michael R. Ouellette ,  Thomas O. Sopchak ,  Donald L. Wheater

IPC: G11C19/00

CPC classification number: G11C19/00 ,  G11C29/003

Abstract: The invention provides a circuit that can observe data within shift registers without altering the data. The circuit includes selectors connected to the inputs and outputs of the shift registers. The selectors selectively connect the input with the output of a selected shift register to form a wiring loop for the selected shift register. A control device connected to the wiring loop uses the wiring loop to cause the data to be continually transferred from the output of the selected shift register to the input of the selected shift register and back through the selected shift register in a circular manner. The control device includes a counter used for determining the length of a selected shift register and a set of registers to store, for future use when rotating data in the shift registers, the length of each shift register. The control device also includes a data output accessible from outside the circuit. An observation wire is connected to the wiring loop, and the data passes from the wiring loop to the control device through the observation wire. The control device outputs data appearing on the wiring loop as the data is circulated through the selected shift register to permit data within the selected shift register to be observed outside the circuit without altering the data within the selected shift register.

Abstract translation: 本发明提供一种可以观察移位寄存器内的数据而不改变数据的电路。 该电路包括连接到移位寄存器的输入和输出的选择器。 选择器选择性地将输入与所选移位寄存器的输出连接，以形成所选移位寄存器的布线回路。 连接到布线回路的控制装置使用布线回路使得数据从所选择的移位寄存器的输出连续地传送到所选择的移位寄存器的输入端并循环地返回所选择的移位寄存器。 控制装置包括用于确定所选择的移位寄存器的长度的计数器和一组寄存器，用于存储当在移位寄存器中旋转数据时将来使用的每个移位寄存器的长度。 控制装置还包括从电路外部可访问的数据输出。 观察线连接到布线回路，数据通过观察线从布线回路传递到控制装置。 当数据通过选定的移位寄存器循环时，控制装置输出出现在布线环路上的数据，以允许在电路外观察所选移位寄存器内的数据，而不改变所选移位寄存器内的数据。