公开(公告)号：US07479017B1

公开(公告)日：2009-01-20

申请号：US11848617

申请日：2007-08-31

申请人： Steve Koopman ,  Jeremy Wooldridge ,  Doug McCartin ,  Everett Koopman

发明人： Steve Koopman ,  Jeremy Wooldridge ,  Doug McCartin ,  Everett Koopman

IPC分类号： H01R12/00

CPC分类号： H01R12/707 ,  H01R12/7052 ,  H01R12/724 ,  H01R13/6658

摘要： A right angle electrical connector assembly includes a connector frame including a plurality of posts, each of the plurality of posts including at least one standoff rib extending therefrom, a flexible circuit having a first end portion and a second end portion, the second end portion being arranged to be connected to a circuit board. The flexible circuit includes a plurality of holes arranged to correspond to the plurality of posts, each of the plurality of posts is received in a respective one of the plurality of holes, and a height of a first major surface of the second end portion of the flexible circuit is set by the at least one standoff rib of each of the plurality of posts.

摘要翻译： 直角电连接器组件包括连接器框架，该连接器框架包括多个柱，所述多个柱中的每一个包括从其延伸的至少一个支座肋，具有第一端部和第二端部的柔性电路，所述第二端部为 布置成连接到电路板。 柔性电路包括多个孔，其布置成对应于多个柱，多个柱中的每一个被容纳在多个孔中的相应一个孔中，并且第二端部的第一主表面的高度 柔性电路由多个柱中的每一个的至少一个支座设置。

公开(公告)号：US07654847B2

公开(公告)日：2010-02-02

申请号：US12130781

申请日：2008-05-30

申请人： Emad Soubh ,  Doug McCartin ,  Jeremy Wooldridge ,  Steve Koopman

发明人： Emad Soubh ,  Doug McCartin ,  Jeremy Wooldridge ,  Steve Koopman

IPC分类号： H01R12/00

CPC分类号： G01R1/06733 ,  G01R1/06738 ,  Y10S439/94 ,  Y10T29/53191

摘要： A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips. An alignment assembly for aligning a probe with respect to a device to be tested includes a first alignment block, a second alignment block, and an alignment piece connecting the first alignment block and the second alignment block. The first alignment block and the second alignment block are arranged to be attached to the device to be tested to align the probe with respect to the device to be tested.

摘要翻译： 提供了一个用于测试设备的电气特性的探头。 探针包括壳体，多根电缆，位于壳体内的电路板以及现场可更换的探头。 探针尖端包括一组触点。 多个电缆中的每一个连接到相应的触点。 探头包括一个可伸缩护罩，当探头连接到设备时，护罩将缩回。 联系人有分叉的提示。 用于使探针相对于待测试装置对准的对准组件包括第一对准块，第二对准块和连接第一对准块和第二对准块的对准块。 第一对准块和第二对准块被布置成附接到要测试的装置以使探针相对于被测试装置对准。

公开(公告)号：US07549884B2

公开(公告)日：2009-06-23

申请号：US11668455

申请日：2007-01-29

申请人： Emad Soubh ,  Doug McCartin ,  Jeremy Wooldridge ,  Steve Koopman

发明人： Emad Soubh ,  Doug McCartin ,  Jeremy Wooldridge ,  Steve Koopman

IPC分类号： H01R27/00

CPC分类号： G01R1/06733 ,  G01R1/06738 ,  Y10S439/94 ,  Y10T29/53191

摘要： A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.

摘要翻译： 提供了一个用于测试设备的电气特性的探头。 探针包括壳体，多根电缆，位于壳体内的电路板以及现场可更换的探头。 探针尖端包括一组触点。 多个电缆中的每一个连接到相应的触点。 探头包括一个可伸缩护罩，当探头连接到设备时，护罩将缩回。 联系人有分叉的提示。

公开(公告)号：US20090075511A1

公开(公告)日：2009-03-19

申请号：US12133560

申请日：2008-06-05

申请人： David GIVENS ,  Doug MCCARTIN ,  John REID ,  Jeremy WOOLDRIDGE

发明人： David GIVENS ,  Doug MCCARTIN ,  John REID ,  Jeremy WOOLDRIDGE

IPC分类号： H01R13/62

CPC分类号： H01R13/6275 ,  H01R12/716 ,  H01R13/6582 ,  H01R13/6594

摘要： A socket that electrically connects a memory drive unit to a circuit board includes a socket housing including a base portion having a slot disposed in a central portion therein, sidewalls extending upward from the base portion, and end walls extending upward from the base portion and between the sidewalls, and a locking member arranged to engage a locking structure of a memory drive unit when a memory drive unit is inserted into the memory drive socket. The slot includes a plurality of contacts disposed therein which are arranged to engage corresponding contact pads of the memory drive unit. A bottom surface of the base portion includes at least one pin arranged to engage a through hole of a circuit board. The locking member includes at least one pin disposed at a lower end portion thereof and arranged to be secured to the circuit board.

摘要翻译： 将存储器驱动单元电连接到电路板的插座包括插座壳体，该插座壳体包括基部，该基部具有设置在其中的中心部分的槽，从基部向上延伸的侧壁以及从基部向上延伸的端壁， 所述侧壁和锁定构件被布置成当存储器驱动单元插入到所述存储器驱动器插座中时与所述存储器驱动单元的锁定结构接合。 槽包括设置在其中的多个触点，其布置成接合存储器驱动单元的对应的接触焊盘。 基部的底面包括布置成接合电路板的通孔的至少一个销。 锁定构件包括设置在其下端部处的至少一个销，并且布置成固定到电路板。

公开(公告)号：US20090153169A1

公开(公告)日：2009-06-18

申请号：US12130781

申请日：2008-05-30

申请人： Emad SOUBH ,  Doug McCARTIN ,  Jeremy WOOLDRIDGE ,  Steve KOOPMAN

发明人： Emad SOUBH ,  Doug McCARTIN ,  Jeremy WOOLDRIDGE ,  Steve KOOPMAN

IPC分类号： G01R31/02

CPC分类号： G01R1/06733 ,  G01R1/06738 ,  Y10S439/94 ,  Y10T29/53191

摘要： A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.

摘要翻译： 提供了一个用于测试设备的电气特性的探头。 探针包括壳体，多根电缆，位于壳体内的电路板以及现场可更换的探头。 探针尖端包括一组触点。 多个电缆中的每一个连接到相应的触点。 探头包括一个可伸缩护罩，当探头连接到设备时，护罩将缩回。 联系人有分叉的提示。

公开(公告)号：US20080180122A1

公开(公告)日：2008-07-31

申请号：US11668455

申请日：2007-01-29

申请人： Emad Soubh ,  Doug McCartin ,  Jeremy Wooldridge ,  Steve Koopman

发明人： Emad Soubh ,  Doug McCartin ,  Jeremy Wooldridge ,  Steve Koopman

IPC分类号： G01R1/067

CPC分类号： G01R1/06733 ,  G01R1/06738 ,  Y10S439/94 ,  Y10T29/53191

摘要： A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.

摘要翻译： 提供了一个用于测试设备的电气特性的探头。 探针包括壳体，多根电缆，位于壳体内的电路板以及现场可更换的探头。 探针尖端包括一组触点。 多个电缆中的每一个连接到相应的触点。 探头包括一个可伸缩护罩，当探头连接到设备时，护罩将缩回。 联系人有分叉的提示。