公开(公告)号：US08919755B2

公开(公告)日：2014-12-30

申请号：US11652181

申请日：2007-01-11

申请人： Jae Gyun Shim ,  Yun Sung Na ,  In Gu Jeon ,  Tae Hung Ku ,  Dong Han Kim

发明人： Jae Gyun Shim ,  Yun Sung Na ,  In Gu Jeon ,  Tae Hung Ku ,  Dong Han Kim

IPC分类号： H01L21/687 ,  B25B5/00

CPC分类号： B25B5/006 ,  Y10S269/90 ,  Y10T24/44496

摘要： A clamping apparatus for clamping a plurality of Hi-Fix boards arranged in a row, includes at least one rotational clamping unit installed to clamp facing end sides of the two or more Hi-Fix boards together, and a plurality of clamping units installed to clamp end sides of the Hi-Fix boards other than the facing sides thereof. The rotational clamping unit includes a clamper installed to rotate about a fixed rotation point to clamp or release the claming of the facing end sides of the two or more Hi-Fix boards, and a driving unit for providing a rotational force to the clamper.

摘要翻译： 一种用于夹紧排列成一列的多个Hi-Fix板的夹持装置，包括至少一个旋转夹紧单元，其安装成将两个或更多个Hi-Fix板的相对端侧夹在一起，并且多个夹紧单元安装成夹紧 Hi-Fix板的除了其正面侧之外的端面。 旋转夹紧单元包括夹持器，其安装成围绕固定旋转点旋转以夹紧或释放两个或更多个Hi-Fix板的相对端侧的卡住，以及用于向夹持器提供旋转力的驱动单元。

公开(公告)号：US08141922B2

公开(公告)日：2012-03-27

申请号：US12304718

申请日：2007-06-26

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Dong Hyun Yo

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Dong Hyun Yo

IPC分类号： H01L21/673 ,  B66C1/02

CPC分类号： H01L21/6838

摘要： A pick-and-place apparatus for transferring and loading semiconductor devices between first and second loading elements is provided. The pick-and-place apparatus includes a multiplicity of picking unit modules, each of which has at least one or more picking units, and an interval regulation apparatus for regulating intervals between the picking unit modules at the first to third modes. The first to third row interval values are different from each other. The intervals between the picking unit modules are all regulated to be identical to the first row interval at the first mode, are alternately regulated to the second row interval and the third row interval in turn at the second mode, and are alternately regulated to the third row interval and the second row interval in turn at the third mode.

摘要翻译： 提供了用于在第一和第二加载元件之间传送和加载半导体器件的拾取和放置装置。 拾取和放置装置包括多个拾取单元模块，每个拾取单元模块具有至少一个或多个采摘单元，以及间隔调节装置，用于在第一至第三模式下调节采摘单元模块之间的间隔。 第一到第三行间隔值彼此不同。 拾取单元模块之间的间隔都被调节为与第一模式下的第一行间隔相同，在第二模式下依次交替地调节到第二行间隔和第三行间隔，并且被交替地调节到第三行间隔 行间隔，第二行间隔依次为第三模式。

公开(公告)号：US08038191B2

公开(公告)日：2011-10-18

申请号：US12103306

申请日：2008-04-15

申请人： Jae Gyun Shim ,  Yun Sung Na ,  In Gu Jeon ,  Tae Hung Ku ,  Dong Hyun Yo

发明人： Jae Gyun Shim ,  Yun Sung Na ,  In Gu Jeon ,  Tae Hung Ku ,  Dong Hyun Yo

IPC分类号： B25J15/06 ,  B65G47/91

CPC分类号： G01R31/2893 ,  H05K13/0482

摘要： A pick and place apparatus includes a plurality of device holing elements in a predetermined arrangement; a power supply mechanism for supplying a power for controlling a horizontal pitch between the plurality of device holding elements; a power transmission mechanism for delivering the power from the power supply mechanism to the plurality of device holding elements as a translational force in a horizontal direction; a first linear motion guide mechanism for guiding horizontal movements of some of the plurality of device holding elements; and a second linear motion guide mechanism disposed below the first linear motion guide mechanism, for guiding horizontal movements of the other device holding elements. The plurality of device holding elements are slidably coupled to the first and the second linear motion guide mechanism alternately.

摘要翻译： 拾取和放置装置包括预定布置的多个装置孔元件; 电源机构，用于提供用于控制所述多个设备保持元件之间的水平间距的电力; 动力传递机构，用于将来自供电机构的动力作为水平方向的平移力传递到多个装置保持元件; 用于引导所述多个装置保持元件中的一些的水平移动的第一线性运动引导机构; 以及第二线性运动引导机构，其设置在所述第一线性运动引导机构的下方，用于引导所述另一装置保持元件的水平运动。 多个装置保持元件交替地可滑动地联接到第一和第二直线运动引导机构。

公开(公告)号：US20100134136A1

公开(公告)日：2010-06-03

申请号：US12698532

申请日：2010-02-02

申请人： Yun Sung Na ,  In Gu Jeon ,  Dong Hyun Yo ,  Hyun Song

发明人： Yun Sung Na ,  In Gu Jeon ,  Dong Hyun Yo ,  Hyun Song

IPC分类号： G01R31/26

CPC分类号： G01R31/2893

摘要： Operation methods of test handler are disclosed. The pick-and-place apparatus picks up semiconductor devices from first loading compartments arrayed in a matrix on a first loading element, moves, and places onto second loading compartments arrayed in a matrix on a second loading element. Pickers of the pick-and-place apparatus pick up the semiconductor devices from the first loading compartments and place them selectively onto a plurality of adjacent odd rows or a plurality of adjacent even rows of the second loading compartments during one operation. The pick-and-place apparatus includes a relatively large number of the pickers, preferably arrayed in a matrix, and thus performs loading and unloading of semiconductor devices at a relatively high speed.

摘要翻译： 公开了测试处理器的操作方法。 拾取和放置装置从在第一加载元件上排列成矩阵的第一加载隔间拾取半导体器件，移动并放置在第二加载元件上排列成矩阵的第二加载隔间上。 拾取和放置装置的拾取器从第一加载隔间拾取半导体器件，并且在一次操作期间将它们选择性地放置在第二加载隔间的多个相邻奇数行或多个相邻偶数行上。 拾取和放置装置包括相对大量的拾取器，优选地排列成矩阵，并且因此以相对高的速度执行半导体器件的装载和卸载。

公开(公告)号：US06844717B2

公开(公告)日：2005-01-18

申请号：US09975861

申请日：2001-10-12

申请人： Jae-Gyun Shim ,  Seung-Won Jeon ,  Yun-Sung Na ,  In-Gu Jeon

发明人： Jae-Gyun Shim ,  Seung-Won Jeon ,  Yun-Sung Na ,  In-Gu Jeon

IPC分类号： G01R31/28 ,  H01L21/00 ,  H01L21/677 ,  G01R31/26

CPC分类号： H01L21/67236 ,  G01R31/2887 ,  G01R31/2893 ,  H01L21/67242 ,  H01L21/67778

摘要： The present invention discloses a test handler comprising a main body, a stocker including a user tray supplier and a user tray deliverer for loading plurality of user trays carrying the semiconductor device during devices tests, a plurality of test trays, a device loading means for transferring the devices in the user tray of the user tray supplier to the test tray, a first tray inverter changing the horizontal posture of the test tray, a soak chamber preparing a desired test temperature condition, a test chamber accomplishing tests, a de-soak chamber restoring the devices temperature, a second tray inverter inverting to the test tray of a horizontal posture, a device unloading means transferring the semiconductor devices on the test tray. The present invention can double the lot size in unit operation to improve equipment operation ratio. In more, the device loading time and unloading can be reduced so that the number of the devices treated in unit operation can be increased.

摘要翻译： 本发明公开了一种测试处理器，包括主体，包括用户托盘供应器的储料器和用于在设备测试期间装载携带半导体器件的多个用户托盘的用户托盘输送器，多个测试托盘，用于传送的设备加载装置 用户托盘的用户托盘中的设备供应到测试托盘，第一托盘变换器改变测试托盘的水平姿势，准备所需测试温度条件的浸泡室，完成测试的测试室，脱泡室 恢复设备温度，第二托盘变换器反转到水平姿态的测试托盘，装置卸载装置将半导体器件传送到测试托盘上。 本发明可以使单位操作中的批量增加一倍，以提高设备运行率。 此外，可以减少装置加载时间和卸载，从而可以增加在单元操作中处理的装置的数量。

公开(公告)号：US06651817B2

公开(公告)日：2003-11-25

申请号：US09981486

申请日：2001-10-17

申请人： Jae-Gyun Shim ,  Seung-Won Jeon ,  Yun-Sung Na ,  In-Gu Jeon

发明人： Jae-Gyun Shim ,  Seung-Won Jeon ,  Yun-Sung Na ,  In-Gu Jeon

IPC分类号： B65D8530

CPC分类号： G01R1/04 ,  G01R31/01 ,  G01R31/2893 ,  H01L21/6835

摘要： A test tray insert of a test handler is provided including a housing, a locker, and a stopper, where one end side of the stopper is hinged on the inside of the mounting hole and the other end side of the stopper is protruded to the receiving hole so that the stopper fixes the device. The housing includes a receiving hole for loading a device in the enter of the receiving hole, and a mounting hole, extended from both sides of the receiving hole, including a joint jaw. The housing further includes a base protrusion placed n both ends of the bottom of the receiving hole and a supporting protrusion placed in both sides of the base protrusion.

摘要翻译： 提供了一种测试处理机的测试盘插入件，包括壳体，储物柜和止动器，止动器的一端侧铰接在安装孔的内侧，止动件的另一端侧突出到接收器 孔，使得止动器固定该装置。 壳体包括用于将装置装载在接收孔的入口中的接收孔以及包括接合钳口的从容纳孔的两侧延伸的安装孔。 所述壳体还包括在所述容纳孔的底部的两端部和设置在所述基部突起的两侧的支撑突起的基部突出部。

公开(公告)号：US08570058B2

公开(公告)日：2013-10-29

申请号：US12745053

申请日：2009-01-19

申请人： Yun-Sung Na ,  In-Gu Jeon ,  Dong-Hyun Yo ,  Young-Ho Kweon ,  Hoyung-Su Kim

发明人： Yun-Sung Na ,  In-Gu Jeon ,  Dong-Hyun Yo ,  Young-Ho Kweon ,  Hoyung-Su Kim

IPC分类号： G01R31/20 ,  G01R31/00

CPC分类号： G01R31/2867

摘要： A system and method is disclosed that transfers carrier boards in a handler that supports the testing of electronic devices. A carrier board can be transferred from the transfer start position to one of the mid transfer positions and the transfer final position. Carrier boards, which are spaced apart from each other in a chamber, can be gathered adjacent to each other in the circulation direction of carrier board. The transfer speed and the total circulation speed of the carrier boards can be enhanced. The transfer speed of carrier board can be easily controlled according to the test conditions.

摘要翻译： 公开了一种在支持电子设备测试的处理器中传送载板的系统和方法。 承载板可以从转移开始位置转移到中间转移位置和转移最终位置之一。 在室中彼此间隔开的承载板可以沿着载板的循环方向彼此相邻地收集。 可以提高载板的传送速度和总循环速度。 根据试验条件可以容易地控制载板的传送速度。

公开(公告)号：US08258804B2

公开(公告)日：2012-09-04

申请号：US12513039

申请日：2007-10-22

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jung-Woo Hwang

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jung-Woo Hwang

IPC分类号： G01R31/00

CPC分类号： G01R31/2893

摘要： A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.

摘要翻译： 公开了一种用于测试处理器的测试盘，其装载有半导体器件，然后沿着预定的循环路线携带它们。 测试托盘允许一个固定单元将多个相邻的插入模块固定到框架的接收空间，从而有效地使用框架的空间并且允许相对大量的插入模块安装在相同的区域中 到常规的测试托盘。

公开(公告)号：US07948255B2

公开(公告)日：2011-05-24

申请号：US11997974

申请日：2006-08-14

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku

IPC分类号： G01R31/20 ,  G01R31/00

CPC分类号： H01L21/67745 ,  G01R31/2893 ,  H01L21/67271 ,  H01L21/67778

摘要： A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in the horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.

摘要翻译： 公开了一种测试处理程序。 测试处理器包括用于传送用户托盘的第一至第三传送，以及适于在水平方向上分别移动第一至第三传送的第一至第三水平移动单元。 第一至第三水平移动单元独立地操作，使得第一至第三传送中的每一个可以独立地执行水平移动。 第一至第三传送中的每一个基于其先前分配的功能执行，从而提高设备的测试处理速度。

公开(公告)号：US07898271B2

公开(公告)日：2011-03-01

申请号：US12385790

申请日：2009-04-20

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

IPC分类号： G01R31/00

CPC分类号： G01R31/2867

摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.

摘要翻译： 公开了一种测试处理程序。 用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。 当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。