Method and apparatus for checking the wall thickness of a layer
    1.
    发明授权
    Method and apparatus for checking the wall thickness of a layer 失效
    用于检查层的壁厚的方法和装置

    公开(公告)号:US4641525A

    公开(公告)日:1987-02-10

    申请号:US743298

    申请日:1985-06-10

    Applicant: Hubert Merki

    Inventor: Hubert Merki

    Abstract: In a method of checking the insulating sheath on a wire or cable leaving an extruder, the external diameter of the insulating sheath is continuously determined over the whole circumference by means of a first measuring apparatus and the wall thickness of the insulation is continuously detected over the whole circumference by means of a second measuring apparatus. The measured values are supplied to a computer which, inter alia, continuously determines the difference between the maximum and minimum wall thicknesses found (W.sub.max -W.sub.min). Eccentricity and minimum wall thickness of the sheath are calculated from this difference and from the measured external diameter of the insulation and the diameter of the conductor of the wire or cable, and are indicated in a display device. The measurement is thus rendered largely independent of fluctuations in sensitivity of the measuring apparatus for the wall thickness of the insulation. An apparatus for carrying out the method comprises the respective measuring apparatus and a computer for effecting the required calculations.

    Abstract translation: 在离开挤出机的电线或电缆上检查绝缘护套的方法中,通过第一测量装置在整个圆周上连续地确定绝缘护套的外径,并且绝缘护套的壁厚在 整周,借助于第二测量装置。 将测量值提供给计算机,其中尤其连续地确定找到的最大和最小壁厚之差(Wmax-Wmin)。 根据该差异以及绝缘体的测量外径和电线或电缆的导体的直径计算护套的偏心度和最小壁厚,并在显示装置中指示。 因此,测量很大程度上与测量装置对绝缘体的壁厚的灵敏度的波动无关。 用于执行该方法的装置包括相应的测量装置和用于执行所需计算的计算机。

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