公开(公告)号：US07635973B2

公开(公告)日：2009-12-22

申请号：US11941412

申请日：2007-11-16

Applicant: Gerald F. Boe

Inventor： Gerald F. Boe

IPC: G01R31/28

CPC classification number: G01R31/2893

Abstract: An improved electronic component handler and associated improved test plate are shown. A guide on the test plate is used to intersect the testing apertures to eliminate misalignment of the component loading frame and the aperture to ensure easy insertion of components into the test apertures.

Abstract translation: 示出了改进的电子部件处理器和相关联的改进的测试板。 使用测试板上的引导件与测试孔相交，以消除部件加载框架和孔的未对准，以确保部件容易地插入到测试孔中。

公开(公告)号：US20080264826A1

公开(公告)日：2008-10-30

申请号：US11741921

申请日：2007-04-30

Applicant: Gerald F. Boe

Inventor： Gerald F. Boe

IPC: B65D85/86

CPC classification number: G01R31/2893 ,  G01R31/01 ,  G01R31/2808

Abstract: A gap set device for an electronic component handler is provided. The electronic component handler includes a test module operative to load, test and unload electronic components. The electronic components are received in test pockets provided on a test plate. The test pockets include at least one corner relief to improve loading efficiency.

Abstract translation: 提供了一种用于电子部件处理器的间隙设定装置。 电子部件处理器包括用于加载，测试和卸载电子部件的测试模块。 电子元件被接收在设置在测试板上的测试槽中。 测试口袋包括至少一个角部，以提高装载效率。

公开(公告)号：US20110241718A1

公开(公告)日：2011-10-06

申请号：US13163563

申请日：2011-06-17

Applicant: Gerald F. Boe

Inventor： Gerald F. Boe

IPC: G01R31/00

CPC classification number: G01R31/2893 ,  G01R31/01 ,  G01R31/2808

Abstract: Test plates with improved test pockets are described herein. One embodiment is a circular test plate comprising a plurality of test pockets, each test pocket being a quadrilateral hole in the test plate, and each quadrilateral hole having four sides and four corners located at the intersections of the sides. Each of the four corners comprises at least one corner having a corner relief that extends from and intersects each of the at least one corner's two intersecting sides, and any remaining corners not having a corner relief. The test plate can be incorporated into a component handler.

Abstract translation: 这里描述了具有改进的测试口袋的测试板。 一个实施例是包括多个测试凹部的圆形测试板，每个测试凹槽是测试板中的四边形孔，并且每个四边形孔具有位于两侧交点处的四个边和四个角。 四角中的每一个包括至少一个角部，其具有从所述至少一个角部的两个相交侧中的每一个延伸并且相交的角部浮雕，以及任何没有角部浮雕的剩余拐角。 测试板可以结合到组件处理器中。

公开(公告)号：US07965091B2

公开(公告)日：2011-06-21

申请号：US11741921

申请日：2007-04-30

Applicant: Gerald F Boe

Inventor： Gerald F Boe

IPC: G01R31/00

CPC classification number: G01R31/2893 ,  G01R31/01 ,  G01R31/2808

Abstract: A gap set device for an electronic component handler is provided. The electronic component handler includes a test module operative to load, test and unload electronic components. The electronic components are received in test pockets provided on a test plate. The test pockets include at least one corner relief to improve loading efficiency.

Abstract translation: 提供了一种用于电子部件处理器的间隙设定装置。 电子部件处理器包括用于加载，测试和卸载电子部件的测试模块。 电子元件被接收在设置在测试板上的测试槽中。 测试口袋包括至少一个角部，以提高装载效率。

公开(公告)号：US20090127169A1

公开(公告)日：2009-05-21

申请号：US11941412

申请日：2007-11-16

Applicant: Gerald F. Boe

Inventor： Gerald F. Boe

IPC: G01R31/28 ,  B07C5/34 ,  B07C5/344

CPC classification number: G01R31/2893

Abstract: An improved electronic component handler and associated improved test plate are shown. A guide on the test plate is used to intersect the testing apertures to eliminate misalignment of the component loading frame and the aperture to ensure easy insertion of components into the test apertures.

Abstract translation: 示出了改进的电子部件处理器和相关联的改进的测试板。 使用测试板上的引导件与测试孔相交，以消除部件加载框架和孔的未对准，以确保部件容易地插入到测试孔中。

公开(公告)号：US07161346B2

公开(公告)日：2007-01-09

申请号：US11135728

申请日：2005-05-23

Applicant: Jeff Fish ,  Gerald F. Boe

Inventor： Jeff Fish ,  Gerald F. Boe

IPC: G01R31/02 ,  B65G29/00 ,  B07C5/344

CPC classification number: G01R31/016

Abstract: A component handler includes an improved test seat having a shape that ensures that an electronic component seated in the test seat is in an appropriate orientation for parametric testing. The test seat has a base surface and first and second opposed seat side surfaces separated by generally increasing distances from a narrower notch end to a wider notch end. There is an opening at the narrower notch end. An electronic component is seated within this test seat such that the first and second side surfaces of the electronic component rest against the first and second seat side surfaces. A side surface side margin on which is formed a wraparound electrode is exposed by an opening at the narrower notch end and a second side surface side margin on which is formed a second wraparound electrode is exposed by an opening at the wider notch end.

Abstract translation: 组件处理器包括改进的测试座，其具有确保安装在测试座中的电子组件处于适当方向用于参数测试的形状。 测试座具有基部表面和第一和第二相对的座侧表面，其间距较窄的切口端至更宽的切口端的距离大致增加。 狭窄的一端有一个开口。 电子部件安置在该测试座内，使得电子部件的第一和第二侧表面抵靠第一和第二座椅侧表面。 形成环绕电极的侧面侧边缘由较窄的切口端处的开口露出，形成第二环绕电极的第二侧面侧边缘由较宽的切口端的开口露出。