公开(公告)号：US20080208524A1

公开(公告)日：2008-08-28

申请号：US12034796

申请日：2008-02-21

Applicant: Ian Carrington Sellars ,  Peter Ian Baldwin ,  Philip Anthony May ,  Colin John Morley ,  Brian Leslie Williams ,  Michael Carrington Sellars

Inventor： Ian Carrington Sellars ,  Peter Ian Baldwin ,  Philip Anthony May ,  Colin John Morley ,  Brian Leslie Williams ,  Michael Carrington Sellars

IPC: G01B7/28

CPC classification number: G01B7/281

Abstract: A surface profile measuring instrument has a means for measuring the profile of a surface and a means for storing measurements produced by the means for measuring the profile of a surface. The instrument may have a tip physically coupled to a sensor. The instrument may also have means for processing the measurements and/or for analysing the measurements. The instrument may be connected to an external device such as a printer and/or to a display unit.

Abstract translation: 表面轮廓测量仪器具有用于测量表面轮廓的装置和用于存储由用于测量表面轮廓的装置产生的测量的装置。 仪器可以具有物理耦合到传感器的尖端。 该仪器还可以具有用于处理测量和/或分析测量的装置。 仪器可以连接到诸如打印机和/或显示单元的外部设备。