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    Adapting Data Quality Rules Based Upon User Application Requirements
    2.
    发明申请
    Adapting Data Quality Rules Based Upon User Application Requirements 审中-公开
    根据用户应用要求适应数据质量规则

    公开(公告)号：US20130006992A1

    公开(公告)日：2013-01-03

    申请号：US13552103

    申请日：2012-07-18

    Applicant: Mohan N. Dani ,  Anuj Gupta ,  Mukesh K. Mohania ,  Girish Venkatachaliah

    Inventor： Mohan N. Dani ,  Anuj Gupta ,  Mukesh K. Mohania ,  Girish Venkatachaliah

    IPC: G06F17/30

    CPC classification number: G06F17/30303 ,  G06F3/0482 ,  G06F3/04842 ,  G06F17/30371 ,  G06F17/3056 ,  G06F17/30569

    Abstract: During application of data quality rules to a data set obtained from a data source, data is retrieved from the data source along with a common set of rules configured to format the retrieved data in a manner in accordance with one or more predefined data quality rules of the common set of rules. At least one predefined data quality rule is adjusted utilizing at least one editable widget to form a modified set of data quality rules adapted for use with a specified application. The modified set of data quality rules is applied to the retrieved data.

    Abstract translation: 在将数据质量规则应用于从数据源获得的数据集中时，从数据源中检索数据以及配置为按照一种或多种预定义的数据质量规则格式化检索的数据的公共规则集 共同的规则。 使用至少一个可编辑小部件来调整至少一个预定数据质量规则，以形成适于与指定应用一起使用的经修改的数据质量规则集合。 经修改的数据质量规则集应用于检索的数据。

    Latch-type sense amplifier
    3.
    发明授权
    Latch-type sense amplifier 有权
    锁存型读出放大器

    公开(公告)号：US07227798B2

    公开(公告)日：2007-06-05

    申请号：US10679941

    申请日：2003-10-06

    Applicant: Anuj Gupta ,  Sanjeev Chopra

    Inventor： Anuj Gupta ,  Sanjeev Chopra

    IPC: G11C7/00

    CPC classification number: G11C7/065

    Abstract: An improved latch-type sense amplifier circuit having two cross-coupled inverters forming a latch, a supply coupling device for selectively connecting the latch to a supply source, and a bit line coupling circuits for selectively connecting the inputs of each inverter to the complimentary bit line from the memory array. The circuit is configured to sense a voltage difference between the bit lines with improved reliability by providing a delayed sense amplifier enable signal to pass transistors for delaying disconnection of the bit lines from the sense amplifier until the latching action is completed, and adding two transistors in series with the existing transistors of the conventional latch for correcting the offset between the threshold voltages of the inverters of the latch.

    Abstract translation: 具有形成锁存器的两个交叉耦合的反相器的改进的锁存型读出放大器电路，用于选择性地将锁存器连接到电源的电源耦合装置和用于选择性地将每个反相器的输入连接到补充位的位线耦合电路 线从内存阵列。 该电路被配置为通过提供延迟读出放大器使能信号来传递晶体管来延迟位线从读出放大器的断开直到闭锁动作完成，并且将两个晶体管加到 与常规锁存器的现有晶体管串联，用于校正锁存器的反相器的阈值电压之间的偏移。

    Adapting data quality rules based upon user application requirements
    4.
    发明授权
    Adapting data quality rules based upon user application requirements 有权
    根据用户应用需求调整数据质量规则

    公开(公告)号：US09323814B2

    公开(公告)日：2016-04-26

    申请号：US13552103

    申请日：2012-07-18

    Applicant: Mohan N. Dani ,  Anuj Gupta ,  Mukesh K. Mohania ,  Girish Venkatachaliah

    Inventor： Mohan N. Dani ,  Anuj Gupta ,  Mukesh K. Mohania ,  Girish Venkatachaliah

    IPC: G06F17/30

    CPC classification number: G06F17/30303 ,  G06F3/0482 ,  G06F3/04842 ,  G06F17/30371 ,  G06F17/3056 ,  G06F17/30569

    Abstract: During application of data quality rules to a data set obtained from a data source, data is retrieved from the data source along with a common set of rules configured to format the retrieved data in a manner in accordance with one or more predefined data quality rules of the common set of rules. At least one predefined data quality rule is adjusted utilizing at least one editable widget to form a modified set of data quality rules adapted for use with a specified application. The modified set of data quality rules is applied to the retrieved data.

    Abstract translation: 在将数据质量规则应用于从数据源获得的数据集中时，从数据源中检索数据以及配置为按照一种或多种预定义的数据质量规则格式化检索的数据的公共规则集 共同的规则。 使用至少一个可编辑小部件来调整至少一个预定数据质量规则，以形成适于与指定应用一起使用的经修改的数据质量规则集合。 经修改的数据质量规则集应用于检索的数据。

    Systems and methods for situational application development in the enterprise environment
    5.
    发明授权
    Systems and methods for situational application development in the enterprise environment 有权
    企业环境中情境应用开发的系统与方法

    公开(公告)号：US09372740B2

    公开(公告)日：2016-06-21

    申请号：US12639888

    申请日：2009-12-16

    Applicant: Kapil Gambhir ,  Anuj Gupta ,  Jaspreet Singh

    Inventor： Kapil Gambhir ,  Anuj Gupta ,  Jaspreet Singh

    IPC: G06F17/30 ,  H04N7/16 ,  G06F9/54 ,  H04L29/06

    CPC classification number: G06F9/547

    Abstract: Embodiments of the invention broadly contemplate a situational application development framework that provides consumable software components that are accessed as services and monitored in a standardized fashion through a mediator service and thus suitable for use in a controlled development environment. At least one embodiment of the invention thus facilitates on the fly application creation using mashup makers in an enterprise setup.

    Abstract translation: 本发明的实施例广泛地考虑了一种情境应用开发框架，其提供作为服务被访问并且以标准化的方式通过调解器服务来监视并因此适合于在受控的开发环境中使用的可消耗的软件组件。 因此，本发明的至少一个实施例有利于在企业设置中使用混搭制造商的即时应用程序创建。

    SYSTEM FOR BOUNDARY SCAN REGISTER CHAIN COMPRESSION
    7.
    发明申请
    SYSTEM FOR BOUNDARY SCAN REGISTER CHAIN COMPRESSION 审中-公开
    边界扫描注册链压缩系统

    公开(公告)号：US20110179325A1

    公开(公告)日：2011-07-21

    申请号：US12687893

    申请日：2010-01-15

    Applicant: Anuj Gupta ,  Himanshu Kukreja

    Inventor： Anuj Gupta ,  Himanshu Kukreja

    IPC: G01R31/3177 ,  G06F11/25

    CPC classification number: G01R31/318547

    Abstract: A system for testing input/output pads of an integrated circuit includes boundary scan register chains, a test control unit and a test data processing unit. Input test data is provided to the test control unit, which then provides the test data to the test data processing unit. The test data processing unit processes the test data to obtain processed test data. Thereafter, the processed data is loaded in each of the boundary scan register chains in parallel. The processed test data is propagated sequentially through the plurality of boundary scan register chains to obtain output test data. The output test data is used to detect faults present in the input/output pads of the integrated circuit.

    Abstract translation: 用于测试集成电路的输入/输出焊盘的系统包括边界扫描寄存器链，测试控制单元和测试数据处理单元。 输入测试数据提供给测试控制单元，测试控制单元然后将测试数据提供给测试数据处理单元。 测试数据处理单元处理测试数据以获得处理的测试数据。 此后，并行处理的数据被加载到每个边界扫描寄存器链中。 经处理的测试数据依次通过多个边界扫描寄存器链传播，以获得输出测试数据。 输出测试数据用于检测集成电路输入/输出焊盘中存在的故障。

    SYSTEMS AND METHODS FOR SITUATIONAL APPLICATION DEVELOPMENT IN THE ENTERPRISE ENVIRONMENT
    8.
    发明申请
    SYSTEMS AND METHODS FOR SITUATIONAL APPLICATION DEVELOPMENT IN THE ENTERPRISE ENVIRONMENT 有权
    企业环境中应用发展状况的系统与方法

    公开(公告)号：US20110145933A1

    公开(公告)日：2011-06-16

    申请号：US12639888

    申请日：2009-12-16

    Applicant: Kapil Gambhir ,  Anuj Gupta ,  Jaspreet Singh

    Inventor： Kapil Gambhir ,  Anuj Gupta ,  Jaspreet Singh

    IPC: G06F21/22

    CPC classification number: G06F9/547

    Abstract: Embodiments of the invention broadly contemplate a situational application development framework that provides consumable software components that are accessed as services and monitored in a standardized fashion through a mediator service and thus suitable for use in a controlled development environment. At least one embodiment of the invention thus facilitates on the fly application creation using mashup makers in an enterprise setup.

    Abstract translation: 本发明的实施例广泛地考虑了一种情境应用开发框架，其提供作为服务被访问并且以标准化的方式通过调解器服务来监视并因此适合于在受控的开发环境中使用的可消耗的软件组件。 因此，本发明的至少一个实施例有利于在企业设置中使用混搭制造商的即时应用程序创建。

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