公开(公告)号：US11454651B2

公开(公告)日：2022-09-27

申请号：US17114468

申请日：2020-12-07

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

IPC: G01R1/067 ,  G01R31/50 ,  G01R31/54

Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

公开(公告)号：US20220206082A1

公开(公告)日：2022-06-30

申请号：US17523909

申请日：2021-11-11

Applicant: WUHAN UNIVERSITY

Inventor： Yigang HE ,  Chunsong Sui ,  Hui ZHANG

IPC: G01R31/54 ,  H02M7/219

Abstract: A model-based method and system for diagnosing an open-circuit fault of a power transistor of a three-phase converter are provided, which belong to the technical field of fault diagnosis of power electronic equipment and can implement fast and accurate diagnosis of the open-circuit fault of the power transistor of the three-phase converter without adding an additional hardware. The fault diagnosis method of the disclosure only needs current and voltage sampling signals and drive signals that already exist in a control system of the converter and has the advantage of simple implementation. A cycle accumulated value of a difference between a sampling current and an estimated current after the power transistor of the converter has the open-circuit fault is used as a diagnostic variable, which can quickly and accurately complete diagnosis of a faulty power transistor and has relatively strong practicability.

公开(公告)号：US11255924B2

公开(公告)日：2022-02-22

申请号：US17356508

申请日：2021-06-23

Applicant: Uni-Trend Technology (China) Co., Ltd.

Inventor： Jizhi Long ,  Benny Siu Lam Hung ,  Weikun Han ,  Zhanhua Jin ,  Deng Zhang ,  Shengjun Qiu ,  Yongsong Lu

IPC: G01R31/69 ,  G01R31/54 ,  G01R27/20 ,  H01R13/66 ,  H01R13/717

Abstract: A socket detection apparatus for supporting anomaly detection of an earth wire and a neutral wire includes: a micro-control unit, provided with a test plug of a fire wire connection end, a neutral wire connection end and an earth wire connection end, and a detection circuit connected with the test plug; and an induction antenna arranged corresponding to a fire wire end of a detected power socket, the induction antenna being connected with a first signal input end of the micro-control unit.

公开(公告)号：US11255921B2

公开(公告)日：2022-02-22

申请号：US16745925

申请日：2020-01-17

Applicant: Brunswick Corporation

Inventor： Karl E. Thornton ,  Joseph A. Schlaikowski ,  Matthew T. Elsner ,  David M. Schneider

IPC: G01R31/54 ,  G01R31/52 ,  G01R1/067 ,  G01R31/00

Abstract: An electrical outlet tester for testing a power outlet for powering a recreational vehicle includes outlet tester circuitry configured to test wiring of a power outlet for powering a recreational vehicle to detect a plurality of wiring conditions. The electrical outlet tester includes and a set of light indicators connected to the outlet tester circuitry so as to indicate each of the plurality of wiring conditions detectable by the outlet tester circuitry. The set of light indicators includes a first group of light indicators configured to indicate a plurality of fault condition types and a second group of light indicators configured to indicate one or more lines affected by the fault condition type indicated on the first group of light indicators. A housing surrounds the outlet tester circuitry and a plug extends from the housing and is configured to galvanically connect to the power outlet in order to facilitate testing thereof.

公开(公告)号：US20220024344A1

公开(公告)日：2022-01-27

申请号：US17424822

申请日：2020-01-21

Applicant: LG INNOTEK CO., LTD.

Inventor： Hyoung Dong KIM

IPC: B60L58/12 ,  G01R31/52 ,  G01R31/54 ,  G01R31/28 ,  G01R31/3835 ,  G01R31/36

Abstract: Provided is an apparatus for detecting malfunction, the apparatus detecting malfunction of a display device for displaying a charging state of a vehicle battery according to a control signal. The apparatus for detecting malfunction according to an embodiment of the present invention comprises: an interrupt generation unit for generating an interrupt signal if the control signal satisfies a preset event; a voltage detection unit for detecting a voltage value of the control signal by converting an analog value of the control signal into a digital value; and a determination unit for detecting at least one among whether or not the display device has malfunction and a malfunction type on the basis of at least one among whether or not the display device operates, whether or not the interrupt signal is generated, and the voltage value of the control signal.

公开(公告)号：US11231453B2

公开(公告)日：2022-01-25

申请号：US16865804

申请日：2020-05-04

Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED

Inventor： Mill-Jer Wang ,  Ching-Nen Peng ,  Hung-Chih Lin ,  Hao Chen ,  Mincent Lee

IPC: G01R31/28 ,  G01R31/26 ,  G01R31/66 ,  G01B7/12 ,  G01R31/3185 ,  G01R31/54

Abstract: Among other things, one or more techniques or systems for evaluating a tiered semiconductor structure, such as a stacked CMOS structure, for misalignment are provided. In an embodiment, a connectivity test is performed on vias between a first layer and a second layer to determine a via diameter and a via offset that are used to evaluate misalignment. In an embodiment, a connectivity test for vias within a first layer is performed to determine an alignment rotation based upon which vias are connected through a conductive arc within a second layer or which vias are connected to a conductive pattern out of a set of conductive patterns. In this way, the via diameter, the via offset, or the alignment rotation are used to evaluate the tiered semiconductor structure, such as during a stacked CMOS process, for misalignment.

公开(公告)号：US20210405128A1

公开(公告)日：2021-12-30

申请号：US17356508

申请日：2021-06-23

Applicant: Uni-Trend Technology (China) Co., Ltd.

Inventor： Jizhi Long ,  Benny Siu Lam Hung ,  Weikun Han ,  Zhanhua Jin ,  Deng Zhang ,  Shengjun Qiu ,  Yongsong Lu

IPC: G01R31/69 ,  G01R31/54 ,  G01R27/20

Abstract: A socket detection apparatus for supporting anomaly detection of an earth wire and a neutral wire includes: a micro-control unit, provided with a test plug of a fire wire connection end, a neutral wire connection end and an earth wire connection end, and a detection circuit connected with the test plug; and an induction antenna arranged corresponding to a fire wire end of a detected power socket, the induction antenna being connected with a first signal input end of the micro-control unit.

公开(公告)号：US20210389352A1

公开(公告)日：2021-12-16

申请号：US17161677

申请日：2021-01-29

Applicant: WUHAN UNIVERSITY

Inventor： Yigang HE ,  Chunsong Sui ,  Hui ZHANG ,  Bolun DU ,  Zhaorong Zeng ,  Mingyun Chen

IPC: G01R19/175 ,  G01R31/54 ,  G01R31/26 ,  H02M1/32 ,  G01R31/40

Abstract: Provided are a failure diagnosis method and apparatus for open circuit failure of a power tube of a three-phase rectifier based on a current signal, relating to a failure diagnosis technique for power electronic equipment and capable of quickly and accurately diagnosing on an open circuit failure of the power tube of the three-phase rectifier without adding a hardware component. The failure diagnosis method only requires a sampled current existing in the control system of the rectifier and some intermediate computing signals and is therefore simple and requires little computing resource. A distorted current after the open circuit failure occurs in the power tube of the rectifier and a positive/negative half cycle where the current is present when the failure occurs serve as diagnostic variables. By analyzing the sampled current, a quick diagnosis on the power tube having the open circuit failure is provided. Thus, the invention is highly applicable.

公开(公告)号：US20210373587A1

公开(公告)日：2021-12-02

申请号：US17285907

申请日：2019-11-13

Applicant: ZTE CORPORATION

Inventor： Qian Yang ,  Jijie Shi

IPC: G05F1/569 ,  G01R31/52 ,  G01R31/54 ,  G01R1/36 ,  G01R1/30 ,  G01R31/40 ,  G01R31/28 ,  G01R31/66 ,  H03K5/24

Abstract: A detection and protection circuit includes: a comparator, six resistors, and two diodes. A first resistor is connected to a second resistor. The second resistor (30) is grounded. A positive input end, a negative input end, a power supply end, a ground end, and an output end of the comparator are connected to a third resistor, a fourth resistor, a power management device power supply pin, the ground, and a main controller. The other end of the third resistor is connected between the first resistor and the second resistor. The other end of the fourth resistor is connected to the first resistor. A first power supply is connected between the fourth resistor and the first resistor. A fifth resistor is connected to a sixth resistor. The sixth resistor (70) is grounded. The other end of the fifth resistor is connected to the main controller.

公开(公告)号：US20210190836A1

公开(公告)日：2021-06-24

申请号：US17125105

申请日：2020-12-17

Applicant: Federal Bureau of Investigation

Inventor： Ian B. VABNICK ,  Michael MALONE

IPC: G01R19/165 ,  G01R31/54 ,  G01R31/58

Abstract: Circuit test devices and methods are provided. The method includes measuring a voltage between first and second conductor points (CPs) of a circuit under test (CUT), and determining if the measured voltage is less than a low voltage threshold value (LVTV) indicative of electrical continuity (EC) between the first and second CPs. In response to determining that the measured voltage is less than the LVTV, the method includes: transmitting a test signal (TS) to the first or second CP, and determining if the test signal is received after being transmitted. In response to determining that the TS is received, a presence of EC between the first and second conductor points is reported, and in response to determining that the TS is not received, absence of EC between the first and second CPs, or a lack of electrical contact between the VMC and the first and/or second CP(s), is reported.