Scattered/transmitted light information system
    51.
    发明授权
    Scattered/transmitted light information system 失效
    散射/透射光信息系统

    公开(公告)号:US5675419A

    公开(公告)日:1997-10-07

    申请号:US533019

    申请日:1995-09-25

    摘要: In an information gathering system especially suited to the monitoring of vegetable products in sorting apparatus, a light beam (23) is directed by a scanning source such as a laser (11) at the surface of an object (2) such as a tomato moving in the direction x--x through a scanning zone. The scanning operation is conducted in the y--y direction. Directly reflected light returned from the surface of the object (2) along a path (17) extending from light beam target region (12) is sensed by a line detector (14), which provides an output signal indicative of the level, of the directly reflected light. Light entering the material of the organic product (2) is subjected to a light scattering or diffusing process within the material of the product, so that at least a region (13) of the surface of the product (12) surrounding the target zone (12) of light beam (23) becomes lit-up or illuminated from within. Further photosensitive line detectors (15) and (16) located one to each side of reflected light detector (14) monitor the levels of light emanating from this illuminated zone (13) surrounding light beam target zone (12) and reaching the detectors (15) and (16) along paths (18) and (19) respectively. Comparison of the relative levels of the directly reflected light and emanating light signals enables information to be derived as to surface and sub-surface defects on or in the product (2). The use of suitable logic circuitry enables rejection of defective product in response to the information provided by the light signals.

    摘要翻译: 在特别适用于分类装置中的蔬菜产品监测的信息收集系统中,光源(23)由诸如激光器(11)的扫描源引导到物体(2)的表面,例如番茄移动 在xx方向通过扫描区域。 扫描操作在y-y方向上进行。 沿着从光束目标区域(12)延伸的路径(17)从物体(2)的表面返回的直接反射光被线检测器(14)感测,线检测器(14)提供指示水平的输出信号 直接反射光。 进入有机产品(2)的材料的光在产品的材料内进行光散射或扩散过程,使得至少围绕目标区域的产品(12)的表面的区域(13) 12)的光束(23)从内部变亮或照亮。 位于反射光检测器(14)的每一侧的另外的光敏线检测器(15)和(16)监测从围绕光束目标区域(12)并到达检测器(15)的该被照射区域(13)发出的光的水平 )和(16)分别沿着路径(18)和(19)。 直接反射光和发射光信号的相对电平的比较使得能够得出关于产品上或表面上的表面和子表面缺陷的信息(2)。 使用合适的逻辑电路可以响应于由光信号提供的信息而排斥有缺陷的产品。