公开(公告)号：US20080072111A1

公开(公告)日：2008-03-20

申请号：US11855505

申请日：2007-09-14

Applicant: Thuyen Le ,  Thomas Pflueger ,  Martin Padeffke ,  Stefan Bonsels

Inventor： Thuyen Le ,  Thomas Pflueger ,  Martin Padeffke ,  Stefan Bonsels

IPC: G01R31/3187

CPC classification number: G01R31/3187 ,  G01R31/318502

Abstract: The present invention relates to a method for performing a test case with at least one LBIST engine on an integrated circuit with a plurality of storage elements and logic circuits interconnected according to a predetermined scheme. The LBIST engine is at least partially built up by storage elements and/or logic circuits. At least one scan chain is formed as a series of selected storage elements and the other storage elements are used for the LBIST engine or a part of said LBIST engine in a testing mode. The scan chain is driven by a test pattern and the LBIST test case is testing those parts of the logic circuits corresponding to the storage elements of said scan chain.

Abstract translation: 本发明涉及一种在具有根据预定方案互连的多个存储元件和逻辑电路的集成电路上的至少一个LBIST引擎执行测试用例的方法。 LBIST引擎至少部分地由存储元件和/或逻辑电路构成。 至少一个扫描链形成为一系列所选择的存储元件，并且其它存储元件用于LBIST引擎或在测试模式中用于所述LBIST引擎的一部分。 扫描链由测试模式驱动，LBIST测试用例正在测试对应于所述扫描链的存储元件的逻辑电路的那些部分。