公开(公告)号：US20130015859A1

公开(公告)日：2013-01-17

申请号：US13299443

申请日：2011-11-18

Applicant: I-Shih Tseng ,  Tien-Teng Chang ,  Jeff Lee ,  Chih-Yu Cheng ,  Hsu-Ting Cheng

Inventor： I-Shih Tseng ,  Tien-Teng Chang ,  Jeff Lee ,  Chih-Yu Cheng ,  Hsu-Ting Cheng

IPC: G01R31/26

CPC classification number: G01R31/2635 ,  G01R1/0408

Abstract: A testing apparatus for flip chip LEDs includes a transparent substrate, a spacing member, a flexible transparent carrier, and a vacuum generator. The spacing member is configured on a first surface of the transparent substrate. The flexible transparent carrier is removably assembled to the spacing member so that a closed space is formed by the flexible transparent carrier, the spacing member, and the first surface of the transparent substrate. The vacuum generator is connected to the closed space for pumping air out of the closed space, and then a part of the transparent substrate clings to the first surface to form a testing area for loading the flip chip LED.

Abstract translation: 倒装芯片LED的测试装置包括透明衬底，间隔构件，柔性透明载体和真空发生器。 间隔部件构造在透明基板的第一面上。 柔性透明载体可移除地组装到间隔构件，使得由柔性透明载体，间隔构件和透明基底的第一表面形成封闭空间。 真空发生器连接到封闭空间，用于将空气排出封闭空间，然后一部分透明基板粘附到第一表面，形成用于装载倒装芯片LED的测试区域。

公开(公告)号：US20120250021A1

公开(公告)日：2012-10-04

申请号：US13245088

申请日：2011-09-26

Applicant: Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

Inventor： Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

IPC: G01N21/27

CPC classification number: G01J3/51 ,  G01J2001/4252 ,  G01J2005/608 ,  G01R31/2635

Abstract: The invention discloses a light emitting component measuring system and the method thereof which is capable of measuring the optical proprieties of a plurality of the devices under test (DUT). Each DUT is capable of receiving electricity so as to output an initial ray, wherein each initial ray has a first wavelength range. The light emitting component measuring system comprises a filtering device and a sensing device. The filtering device comprises a first filtering portion which can filter a corresponding third wavelength of the said initial rays and output a plurality of first filtered rays simultaneously. Each first filtered ray has a second wavelength range respectively. The said sensing device receives the ray outputted from the filtering device and generates an optical data accordingly.

Abstract translation: 本发明公开了一种发光元件测量系统及其方法，其能够测量被测器件（DUT）的多个测试光学特性。 每个DUT能够接收电力以输出初始射线，其中每个初始射线具有第一波长范围。 发光元件测量系统包括过滤装置和感测装置。 滤波装置包括第一滤波部分，其可以过滤所述初始光线的对应的第三波长并同时输出多个第一滤波光线。 每个第一滤波光线分别具有第二波长范围。 所述感测装置接收从过滤装置输出的射线，并相应地产生光学数据。

公开(公告)号：US07626403B2

公开(公告)日：2009-12-01

申请号：US11987439

申请日：2007-11-30

Applicant: Joy Ou ,  Albert Fan

Inventor： Joy Ou ,  Albert Fan

IPC: G01R31/302

CPC classification number: G01J1/08 ,  G01J1/02 ,  G01J1/0271

Abstract: The present invention provides a photosensor testing device with a built-in light source and a tester provided with said device, which has a base and an upper cover disposed above the base, characterized in that the upper cover is equipped with at least one light emitting diode (LED) assembly used as a light source for a photosensor under test to undergo testing operation. Therefore, the components such as high intensity discharge lamps and optical processing devices are unnecessary any more, reducing the bulk volume of the testing device and its related cost. Besides, the testing process would be speeded up and the testing accuracy could be improved, as well as the time consumed in replacing the light source would be saved.

Abstract translation: 本发明提供了一种具有内置光源的光电传感器测试装置和设置有所述装置的测试仪，其具有设置在基座上方的基座和上盖，其特征在于，所述上盖配备有至少一种发光 二极管（LED）组件用作被测光电传感器的光源进行测试操作。 因此，不需要诸如高强度放电灯和光学处理装置的部件，减少了测试装置的体积和相关成本。 此外，测试过程将加快，可以提高测试精度，节省更换光源的时间。

公开(公告)号：US07535214B2

公开(公告)日：2009-05-19

申请号：US11786778

申请日：2007-04-12

Applicant: James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

Inventor： James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

IPC: G01R31/02

CPC classification number: G01R31/2893 ,  G11C29/56 ,  G11C29/56016 ,  H01L21/67333

Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray; and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a SIP device disposed in a corresponding one of the cells. The test hive is operable to simultaneously, electrically test at least a predetermined number of the number of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray. The apparatus also includes a sorter automatically operable to remove each SIP device that did not pass electrical testing with SIP devices that did pass electrical testing until a tray of electrically tested SIP devices is fully populated with SIP devices that did pass electrical testing.

Abstract translation: 描述了具有多个电引线的用于测试系统级封装（SIP）器件的装置。 该装置利用工业标准的JEDEC托盘并且同时测试这种托盘中的所有装置的至少预定部分。 该装置包括测试蜂巢，其包括：多个测试电路，其数量对应于托盘中的至少预定数量的单元; 以及多组测试触点，每组耦合到测试电路中的一个并且被定向成与设置在相应的一个单元中的SIP设备的多个电触点接合。 测试配置单元可操作以同时电测试蜂巢接收的每个托盘中至少预定数量的SIP设备数量，而不从托盘移除SIP设备。 该设备还包括分拣机，其可自动操作以移除没有通过电测试的SIP设备，该SIP设备通过电测试，直到经过电测试的SIP设备的盘被完全填充了通过电测试的SIP设备。

公开(公告)号：US07489155B2

公开(公告)日：2009-02-10

申请号：US11786779

申请日：2007-04-12

Applicant: James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

Inventor： James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

IPC: G01R31/26 ,  G01R31/02

CPC classification number: G01R31/2887

Abstract: A method for testing System-In-Package (SIP) devices such as micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.

Abstract translation: 描述了一种用于测试系统级封装（SIP）设备的方法，诸如每个具有多个电引线的微型SD设备。 该方法采用行业标准的JEDEC托盘，同时对这些托盘中的所有设备进行测试。

公开(公告)号：US20080297771A1

公开(公告)日：2008-12-04

申请号：US12078018

申请日：2008-03-26

Applicant: Tsung-Hsien Ou ,  Hsin-Yueh Sung ,  Hong-Da Jian ,  Chi-Cheng Kuan ,  Wen-Chi Luo

Inventor： Tsung-Hsien Ou ,  Hsin-Yueh Sung ,  Hong-Da Jian ,  Chi-Cheng Kuan ,  Wen-Chi Luo

IPC: G01N21/00

CPC classification number: G01N21/255 ,  G01J1/02 ,  G01J1/0214 ,  G01J1/04 ,  G01J1/0407 ,  G01J1/0437 ,  G01J1/0451 ,  G01J1/0488 ,  G01J1/4257 ,  G01J3/02 ,  G01J3/0213 ,  G01J3/50 ,  G01J2001/0481 ,  G01J2001/4247

Abstract: A high-speed optical sensing device is provided in the present invention. The high-speed optical sensing device has an optical detector, a lens set, and a beam splitter. The optical detector is utilized for detecting luminous intensity. The lens set is utilized for concentrating light beams toward a color analyzer. The beam splitter is aligned to the illuminating device to be detected and is utilized to separate the light beam generated by the illuminating device to the optical detector and the lens set simultaneously.

Abstract translation: 在本发明中提供了一种高速光学传感装置。 高速光学感测装置具有光学检测器，透镜组和分束器。 光检测器用于检测发光强度。 透镜组用于将光束聚焦到颜色分析器。 分束器对准待检测的照明装置，并用于将由照明装置产生的光束同时分离到光学检测器和透镜组。

公开(公告)号：US07443190B1

公开(公告)日：2008-10-28

申请号：US11786746

申请日：2007-04-12

Applicant: James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

Inventor： James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

IPC: G01R31/26 ,  G01R31/02

CPC classification number: G01R31/2893 ,  G01R31/31905 ,  G11C29/56 ,  G11C29/56016 ,  G11C2029/5602

Abstract: A method for testing micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time. The method of the illustrative embodiment include the steps of: providing a test hive comprising a plurality of test circuits corresponding in number to at least a predetermined portion of said cells and comprising a plurality of groups of test contacts, each group of said groups of test contacts being coupled to one of said test circuits and being oriented to engage said plurality of electrical contacts of a micro SD device disposed in a corresponding one of said cells; moving each said tray from said stack one at a time to a position proximate said test hive; causing relative movement of said tray proximate said test hive whereby said test hive engages said tray of micro SD device and said test hive such that electrical connection is made simultaneously by each of said groups of test contacts with said electrical contacts of a micro SD device disposed in said corresponding of said cells; and simultaneously, electrically testing at least a predetermined portion of said micro SD devices in each tray engaged by said hive without removing said micro SD devices from said tray.

Abstract translation: 描述了一种用于测试每个具有多个电引线的微型SD器件的方法。 该方法使用工业标准JEDEC托盘并同时测试这些托盘中的装置的至少预定部分。 说明性实施例的方法包括以下步骤：提供包括多个测试电路的测试配置单元，其数量对应于所述单元的至少预定部分，并且包括多组测试触点，每组所述测试组 触点耦合到所述测试电路中的一个并且被定向成接合设置在相应的一个所述单元中的微型SD器件的所述多个电触头; 将每个所述托盘从所述堆叠一次移动到靠近所述测试配置单元的位置; 使得所述托盘相对运动靠近所述测试蜂巢，由此所述测试配置单元接合所述微型SD设备和所述测试配置单元的所述托盘，使得每个所述测试接触组同时由所述微型SD设备的所述电触点 在所述对应的所述细胞中; 同时，电子测试由所述蜂巢接合的每个托盘中的所述微型SD设备的至少预定部分，而不从所述托盘移除所述微型SD设备。

公开(公告)号：US20080133166A1

公开(公告)日：2008-06-05

申请号：US11798666

申请日：2007-05-16

Applicant: Angus Lai

Inventor： Angus Lai

IPC: G01R31/317 ,  G06K7/10

CPC classification number: G01R31/319

Abstract: An automatic testing method to be used by an IC testing system equipped with multiple testing sites. In this method the testing procedural information for each IC is stored in different sets of image files that are to be read by the testing system. Thus by inputting into the testing system the identification codes of the IC's that are going to be tested, the testing system would recognize which image files to use and the testing procedure would continue automatically. This method would greatly reduce the complex procedures needed to prepare an IC for testing in the prior art, thus leaving less room for human error and increasing the accuracy of the testing procedure.

Abstract translation: 一种配有多个测试点的IC测试系统使用的自动测试方法。 在这种方法中，每个IC的测试程序信息存储在测试系统要读取的不同图像文件集中。 因此，通过向测试系统输入要测试的IC的识别码，测试系统将识别要使用哪些图像文件，并且测试过程将自动继续。 该方法将大大降低在现有技术中准备用于测试的IC所需的复杂程序，从而留下较少的人为错误的空间并提高测试程序的准确性。

公开(公告)号：US20070127036A1

公开(公告)日：2007-06-07

申请号：US11295672

申请日：2005-12-07

Applicant: Chien-Chong Liao ,  Yao-Min Lin ,  Huang-Chang Chang ,  Wei-Che Chang

Inventor： Chien-Chong Liao ,  Yao-Min Lin ,  Huang-Chang Chang ,  Wei-Che Chang

IPC: G01B11/02

CPC classification number: G01B11/2441

Abstract: An interference measurement system self-alignment method, which can be realized through an optical image interference measurement system. The method comprises the following steps of: utilizing the imaging device to get the optical information of the object to be measured and store the optical information thus obtained; performing the inclination adjustment of the first direction rotation axis of the object platform based on the direction of the interference fringe in the optical information until the interference fringes are adjusted to a defined orthogonal direction, thus eliminating the inclination of the first direction rotation axis; and performing the inclination adjustment of the second direction rotation axis of the object platform based on the expansion direction of the interference fringe in the optical information until the spacing of the interference fringes are adjusted to the maximum, thus eliminating the inclination of the second direction rotation axis.

Abstract translation: 干涉测量系统自对准方法，可以通过光学图像干涉测量系统实现。 该方法包括以下步骤：利用成像装置获取待测物体的光学信息，并存储由此得到的光信息; 基于所述光信息中的所述干涉条纹的方向，进行所述物体平台的第一方向旋转轴的倾斜调整，直到所述干涉条纹被调整为规定的正交方向，从而消除所述第一方向旋转轴的倾斜; 并且基于光信息中的干涉条纹的扩展方向进行对象平台的第二方向旋转轴的倾斜调整，直到干涉条纹的间隔被调整为最大，从而消除了第二方向旋转的倾斜 轴。

公开(公告)号：USD511161S1

公开(公告)日：2005-11-01

申请号：US29188495

申请日：2003-08-20

Applicant: Tsung-Hsien Lin ,  Chun-Lin Liu

Designer： Tsung-Hsien Lin ,  Chun-Lin Liu