Automatic testing method to be used by an IC testing system equipped with multiple testing sites
    1.
    发明申请
    Automatic testing method to be used by an IC testing system equipped with multiple testing sites 审中-公开
    自动测试方法由配备多个测试点的IC测试系统使用

    公开(公告)号:US20080133166A1

    公开(公告)日:2008-06-05

    申请号:US11798666

    申请日:2007-05-16

    Applicant: Angus Lai

    Inventor: Angus Lai

    CPC classification number: G01R31/319

    Abstract: An automatic testing method to be used by an IC testing system equipped with multiple testing sites. In this method the testing procedural information for each IC is stored in different sets of image files that are to be read by the testing system. Thus by inputting into the testing system the identification codes of the IC's that are going to be tested, the testing system would recognize which image files to use and the testing procedure would continue automatically. This method would greatly reduce the complex procedures needed to prepare an IC for testing in the prior art, thus leaving less room for human error and increasing the accuracy of the testing procedure.

    Abstract translation: 一种配有多个测试点的IC测试系统使用的自动测试方法。 在这种方法中,每个IC的测试程序信息存储在测试系统要读取的不同图像文件集中。 因此,通过向测试系统输入要测试的IC的识别码,测试系统将识别要使用哪些图像文件,并且测试过程将自动继续。 该方法将大大降低在现有技术中准备用于测试的IC所需的复杂程序,从而留下较少的人为错误的空间并提高测试程序的准确性。

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