公开(公告)号：US4775234A

公开(公告)日：1988-10-04

申请号：US945546

申请日：1986-12-23

Applicant: Teiichi Shimomura

Inventor： Teiichi Shimomura

IPC: G01J3/06 ,  G01J3/18 ,  G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0235 ,  G01J3/18 ,  G01J2003/061 ,  G01J2003/1885

Abstract: A spectroscopic measurement system comprises at least two kinds of diffraction gratings whose grating surfaces are in line, an exchange device for exchanging the positions of the two kinds of diffraction gratings in connection with incident light to be measured while the two kinds of diffraction gratings are placed in a predetermined rotation angle, at least two kinds of detectors having characteristics corresponding to those of the two kinds of diffraction gratings respectively, a light path switch for switching a path of diffraction light toward either of the two kinds of detectors, and a switch circuit for switching the detection output of the two kinds of detectors in synchronization with the exchange operation of the two kinds of diffraction gratings.