公开(公告)号：US20130027545A1

公开(公告)日：2013-01-31

申请号：US13538284

申请日：2012-06-29

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: H04N7/18

CPC classification number: G01N21/474 ,  G01N21/55 ,  G01N21/8806 ,  G01N2021/1765

Abstract: Radiation is irradiated by an irradiation device at a pre-set angle of incidence with respect to the surface onto the surface to be investigated, and the radiation scattered and/or reflected by this surface arrives at a radiation detector device arranged at a pre-set detection angle with respect to the surface and having an image-recording unit which records black-and-white images, wherein this radiation detector device permits a spatially resolved detection of the radiation reaching it. The irradiation device directs radiation in a first wavelength range onto the surface and the image-recording unit records a first spatially resolved image of this radiation scattered and/or reflected from the surface and the irradiation device directs radiation in a second wavelength range onto the surface and the image-recording unit records a second spatially resolved image of this radiation scattered and/or reflected from the surface.

Abstract translation: 照射装置以相对于要被研究的表面上的表面的预定入射角照射辐射，并且由该表面散射和/或反射的辐射到达布置在预定位置的辐射检测器装置 相对于表面的检测角度并具有记录黑白图像的图像记录单元，其中该放射线检测器装置允许对到达其的辐射的空间分辨检测。 照射装置将第一波长范围的辐射引导到表面上，并且图像记录单元记录从表面散射和/或反射的该辐射的第一空间分辨图像，并且照射装置将第二波长范围内的辐射引导到表面上 并且图像记录单元记录从表面散射和/或反射的该辐射的第二空间分辨图像。

公开(公告)号：US20110013197A1

公开(公告)日：2011-01-20

申请号：US12833709

申请日：2010-07-09

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01B11/24

CPC classification number: G01N21/898 ,  G01J3/50

Abstract: A method for the optical investigation of textured surfaces (10) with the steps: irradiation of radiation onto the surface (10) to be investigated; reception of an image from at least part of the radiation irradiated onto the surface (10) and reflected by the surface (10); location-resolved evaluation of the image recorded and determination of at least one value (K) which is characteristic of this image. According to the invention a parameter (G) which is characteristic of the surface is determined whilst using the characteristic value (K) and whilst using at least one further property (E)—known beforehand or determined—of the surface (10).

Abstract translation: 一种用于对纹理表面（10）的光学研究的方法，具有以下步骤：将辐射照射到要研究的表面（10）上; 从辐射到所述表面（10）上并被所述表面（10）反射的至少部分辐射接收图像; 记录的图像的位置解析评价和作为该图像的特征的至少一个值（K）的确定。 根据本发明，在使用特征值（K）并且同时使用至少一个预先确定的或已确定的表面（10）的另外的属性（E）的同时确定表面特征的参数（G）。

公开(公告)号：US07659994B2

公开(公告)日：2010-02-09

申请号：US11230295

申请日：2005-09-19

Applicant: Uwe Sperling

Inventor： Uwe Sperling

IPC: G01B11/30

CPC classification number: G01N21/57 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0237 ,  G01J3/10 ,  G01J3/504 ,  G01J3/51 ,  G01J2003/1221

Abstract: A device for determining properties of surfaces having at least one first radiation device having at least one radiation source emitting radiation, having at least one first radiation detector having a first radiation detector element which captures at least a portion of the radiation emitted from the radiation device and subsequently diffused and/or reflected off a measuring surface and emits at least one measuring signal characteristic of the reflected/diffused radiation, and at least one second radiation detector having a second radiation detector element capturing a portion of the radiation from the radiation device and diffused/reflected off a measuring surface and outputs a measuring signal characteristic of the reflected and/or diffused radiation, and at least one filter device which is placeable both in the optical path between the radiation device and the first radiation detector and in the optical path between the radiation device and the second radiation detector.

Abstract translation: 一种用于确定具有至少一个具有至少一个发射辐射源的辐射源的第一辐射装置的表面的特性的装置，具有至少一个具有第一辐射检测器元件的第一辐射检测器，该第一辐射检测器捕获从辐射装置发射的辐射的至少一部分 并且随后从测量表面扩散和/或反射并且发射反射/扩散辐射的特征的至少一个测量信号，并且至少一个第二辐射检测器具有捕获来自辐射装置的辐射的一部分的第二辐射检测器元件，以及 从测量表面扩散/反射并输出反射和/或扩散辐射特征的测量信号，以及至少一个可放置在辐射装置和第一辐射检测器之间的光路中以及在光路中的滤光器装置 在辐射装置和第二辐射检测器之间。

公开(公告)号：US07626709B2

公开(公告)日：2009-12-01

申请号：US12207214

申请日：2008-09-09

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01B11/30

CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N2021/8835

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle, at least one first detector device for capturing the radiation emitted to and reflected back from the surface wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface, and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Abstract translation: 用于检查表面的光学性质的装置包括至少一个第一辐射装置，其以第一预定的空间角度向待检测的表面发射辐射;至少一个第一检测器装置，用于捕获从该表面发射到和反射的辐射 其中允许检测到的辐射的局部分辨率的第一检测器装置相对于该表面至少定位在第二预定的空间角度，以及至少一个另外的辐射装置或第二检测器装置，其在一 检测发射到表面并从表​​面反射回的辐射的第三预定空间角度。

公开(公告)号：US07567348B2

公开(公告)日：2009-07-28

申请号：US11230316

申请日：2005-09-19

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01N21/55

CPC classification number: G01N21/57

Abstract: A method and a device for a spatially resolved examination and evaluation of the properties of surfaces, in particular such properties of surfaces which affect the optical impression which the surface makes. A defined radiation is directed at a first predetermined solid angle to an examined surface. Furthermore, at least a portion of the radiation affected by the examined surface in particular by diffusion and reflection, is detected at a second predefined solid angle. At least one measured variable is spatially resolved captured which characterizes at least one predetermined property of the radiation affected by the examined surface. At least over a portion of the spatially resolved measured values at least one statistical parameter for characterizing the surface is determined.

Abstract translation: 用于空间分辨检查和评估表面性质的方法和装置，特别是影响表面所产生的光学印象的表面的这种特性。 被限定的辐射被引导到被检查表面的第一预定立体角。 此外，特别是通过扩散和反射影响被检查表面的辐射的至少一部分以第二预定义立体角检测。 捕获的至少一个测量变量被空间分辨，其表征受检查表面影响的辐射的至少一个预定特性。 至少在空间分辨测量值的一部分上，确定用于表征表面的至少一个统计参数。

公开(公告)号：US20090122316A1

公开(公告)日：2009-05-14

申请号：US12267301

申请日：2008-11-07

Applicant: Uwe Sperling ,  Peter Schwarz

Inventor： Uwe Sperling ,  Peter Schwarz

IPC: G01J3/46

CPC classification number: G01J3/50 ,  G01J3/02 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/0297 ,  G01J3/52 ,  G01J3/524

Abstract: A colour measuring unit (1) comprising a radiation device (2) which emits light onto a surface (9) to be examined, wherein the radiation device (2) comprises at least one semiconductor-based light source (6), and a radiation detector device (12) which receives at least a portion of the light scattered by the surface and outputs a signal characteristic of this light, wherein the radiation detector device (12) allows a spectral analysis of the light impinging thereon. According to the invention, the colour measuring unit comprises at least one sensor device (10) which determines at least one electrical parameter of the light source (6), and also a processor device (14) which outputs from this measured parameter at least one value characteristic of the light emitted by the radiation device (2).

Abstract translation: 一种颜色测量单元（1），包括在待检查的表面（9）上发射光的辐射装置（2），其中所述辐射装置（2）包括至少一个基于半导体的光源（6）和辐射 检测器装置（12），其接收由表面散射的光的至少一部分，并输出该光的特征信号，其中，辐射检测器装置（12）允许对其上的光的光谱分析。 根据本发明，颜色测量单元包括至少一个确定光源（6）的至少一个电参数的传感器装置（10），以及一个处理器装置（14），该装置从该测量参数输出至少一个 由辐射装置（2）发射的光的特性值。

公开(公告)号：US20090046300A1

公开(公告)日：2009-02-19

申请号：US12207214

申请日：2008-09-09

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01B11/30

CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N2021/8835

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle, at least one first detector device for capturing the radiation emitted to and reflected back from the surface wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface, and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Abstract translation: 用于检查表面的光学性质的装置包括至少一个第一辐射装置，其以第一预定的空间角度向待检测的表面发射辐射;至少一个第一检测器装置，用于捕获从该表面发射到和反射的辐射 其中允许检测到的辐射的局部分辨率的第一检测器装置相对于该表面至少定位在第二预定的空间角度，以及至少一个另外的辐射装置或第二检测器装置，其在一 检测发射到表面并从表​​面反射回的辐射的第三预定空间角度。

公开(公告)号：US07027160B2

公开(公告)日：2006-04-11

申请号：US09834241

申请日：2001-04-12

Applicant: Uwe Sperling

Inventor： Uwe Sperling

IPC: G01N21/47

CPC classification number: G01J3/02 ,  G01B5/0004 ,  G01B11/306 ,  G01J3/0291 ,  G01J3/50 ,  G01J3/501 ,  G01J3/504 ,  G01N21/474

Abstract: The present invention relates to a device for measuring transmission and reflection properties of objects and surfaces and a method for operating said device. The device is equipped with a housing, an optical measuring base unit and preferably a source of radiation for emitting radiation at a predetermined angle onto a measurement surface, as well as a detecting means for detecting the radiation reflected from said measurement surface. An elastic retaining means serves to elastically support the optical measuring base unit in the housing such that a touchdown surface for setting down said optical measuring base unit on the measurement surface is disposed external the housing and assumes a predetermined stressed position relative the housing in the unpositioned state.

公开(公告)号：US20050073688A1

公开(公告)日：2005-04-07

申请号：US10880361

申请日：2004-06-29

Applicant: Uwe Sperling

Inventor： Uwe Sperling

IPC: G01N21/892 ,  G01N21/47 ,  G01N21/88

CPC classification number: G01N21/8806 ,  G01N21/474

Abstract: A device for determining the properties of surfaces comprising at least one first radiation means (1) having at least one radiation source which emits radiation, at least one radiation detector means (20) which captures at least a portion of the radiation emitting from the at least one radiation source (1) and then diffused and/or reflected off a measurement surface and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation, an optical divider means (11) having a specified thickness positioned in the optical path between the radiation means (1) and the radiation detector means (20). Said optical divider means (11) comprises at least one aperture (15) extending at least in sections at a specified angle different from 0 degrees to the thickness of said optical divider means (11).

Abstract translation: 用于确定包括至少一个具有发射辐射的至少一个辐射源的至少一个第一辐射装置（1）的表面的性质的装置，至少一个辐射检测器装置（20），其捕获从所述辐射源发射的辐射的至少一部分 至少一个辐射源（1），然后从测量表面扩散和/或反射，并且发射出被反射和/或扩散的辐射的特征的至少一个测量信号;具有指定厚度的光学分离器装置（11） 辐射装置（1）和辐射检测装置（20）之间的光路。 所述光分路器装置（11）包括至少一个孔（15），所述至少一个孔（15）以与所述分光装置（11）的厚度不同于0度的规定角度至少部分地延伸。

公开(公告)号：US5844680A

公开(公告)日：1998-12-01

申请号：US809511

申请日：1997-06-03

Applicant: Uwe Sperling

Inventor： Uwe Sperling

IPC: G01J3/46 ,  G01J3/50 ,  G01N21/25 ,  G01J3/40

CPC classification number: G01N21/251 ,  G01J3/50 ,  G01J3/501 ,  G01J3/524 ,  G01J2003/467 ,  G01J2003/507 ,  G01J3/513

Abstract: A device and process for measuring and analyzing spectral radiation within a desired wavelength range. A number of radiation sources are provided, in combination with a sensor for detecting radiation within the desired wavelength range. The radiation sources are selected to have spectral characteristics that are linearly independent from one another, but overlap so that, in combination, the radiation sources generate radiation over the entire desired wavelength range. Alternatively, a single radiation source generating radiation over the entire desired wavelength range is provided in combination with a plurality of sensors that have spectral sensing characteristics that are linearly independent from one another, but overlap so that, in combination, the sensors sense radiation over the entire desired wavelength range. Further provided is a control unit that stores a number of calibration functions with linearly independent spectral characteristics, the control unit further receiving output values from the sensors to determine the spectral characteristics of the object being measured.

Abstract translation: PCT No.PCT / EP95 / 03789第 371日期：1997年6月3日 102（e）日期1997年6月3日PCT 1995年9月24日PCT PCT。 第WO96 / 09524号公报 日期1996年3月28日用于测量和分析期望波长范围内的光谱辐射的装置和过程。 与用于检测期望波长范围内的辐射的传感器组合提供了许多辐射源。 辐射源被选择为具有彼此线性独立的光谱特征，但重叠，使得辐射源组合在整个所需波长范围内产生辐射。 或者，在整个所需波长范围内产生辐射的单个辐射源与具有彼此线性独立但具有重叠的光谱感测特性的多个传感器组合提供，使得传感器组合地感测在 整个所需的波长范围。 还提供了一种控制单元，其存储具有线性独立频谱特性的多个校准函数，所述控制单元还接收来自传感器的输出值，以确定被测量物体的光谱特性。