Method of making and using an extended test switch
    21.
    发明申请
    Method of making and using an extended test switch 有权
    制造和使用扩展测试开关的方法

    公开(公告)号:US20060059681A1

    公开(公告)日:2006-03-23

    申请号:US10947758

    申请日:2004-09-23

    Applicant: Roy Ball

    Inventor: Roy Ball

    Abstract: A method of making and using an extended test switch starting with a previously existing un-extended test switch that is ready for connection to electrical devices to be tested. A housing selected from one or more available housings each having a predetermined length is connected to a modified un-extended test switch. Each housing has a rear wall that has several inwardly and outwardly facing terminals. At least one of the rear facing terminals of the un-extended test switch is connected to an associated one of the inwardly facing terminals of the housing. After manufacture the extended test switch can be mounted in a suitable receptacle for connection to at least one electrical device. One or more of the switches on the front of the un-extended test switch to be left in an operational condition with a clear cover attached to the front of the test switch.

    Abstract translation: 一种制造和使用扩展测试交换机的方法,从先前存在的可以连接到要测试的电气设备的未扩展测试开关开始。 从一个或多个具有预定长度的可用壳体中选择的壳体连接到修改的未扩展测试开关。 每个壳体具有后壁,其具有若干向内和向外的端子。 未扩展的测试开关的至少一个背面的端子连接到壳体的相对的向内的端子之一。 在制造之后,扩展的测试开关可以安装在合适的插座中,用于连接至少一个电气设备。 未扩展测试开关前面的一个或多个开关将处于工作状态,清洁盖连接到测试开关的前部。

    MODULAR TEST SWITCH
    22.
    发明申请
    MODULAR TEST SWITCH 有权
    模块化测试开关

    公开(公告)号:US20110056819A1

    公开(公告)日:2011-03-10

    申请号:US12873976

    申请日:2010-09-01

    CPC classification number: H01H71/0271 H01H21/54 H01R9/2408 H01R9/2433

    Abstract: A modular test switch assembly includes a plurality of stackable features that may be arranged in a variety of configurations. Each module includes a test switch and includes features to engage adjoining modules in the assembly. The entire test switch assembly is secured together using a retaining rod that is inserted through aligned thru-holes in the assembly.

    Abstract translation: 模块化测试开关组件包括可以以各种配置布置的多个可堆叠特征。 每个模块包括一个测试开关,并且包括与组件中的相邻模块接合的特征。 整个测试开关组件使用固定杆固定在一起,该固定杆穿过组件中对准的通孔插入。

    TEST SWITCH COVER ASSEMBLY
    23.
    发明申请
    TEST SWITCH COVER ASSEMBLY 审中-公开
    测试开关盖组件

    公开(公告)号:US20100226111A1

    公开(公告)日:2010-09-09

    申请号:US12716091

    申请日:2010-03-02

    CPC classification number: H01H71/0221

    Abstract: A cover assembly protects a test switch having a pair of forwardly extending, opposed posts. The cover assembly includes cover having a pair of holes on opposed sides of the front face. A thumbnut is secured within each hole. Each thumbnut includes a nut having internal threads to rotatably engage the posts extending from the cover. The nut is made of a magnetic material such that, when removed, the cover assembly may be secured to any metallic surface.

    Abstract translation: 盖组件保护具有一对向前延伸的对置柱的测试开关。 盖组件包括在前表面的相对侧上具有一对孔的盖。 每个孔内都有一个缩略图。 每个缩略图包括具有内螺纹的螺母,以可旋转地接合从盖延伸的柱。 螺母由磁性材料制成,使得当移除时,盖组件可以固定到任何金属表面。

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