Abstract:
In a measuring apparatus for a semiconductor multiple layer structure, a spectrometer disperses light from a sample for measurement of the photoluminescence spectrum or disperses probe light to irradiate the sample for the measurement of the reflection spectrum. A controller makes a guide member guide the white light to the spectrometer and acquire electric signals from a first detector for the measurement of the reflection spectrum, and makes the guide member guide the light from the spectrometer to a second detector to acquire electric signals for the measurement of the photoluminescence spectrum.
Abstract:
The apparatus includes: a sequencer 11 for outputting a start signal, a timing signal, a write-in signal, and a clock signal sequentially, when an AD start signal is input; an ADC 12 for measuring an output of a device under test (DUT) 3 to which a test pattern is input, when the start signal is input; an arithmetic/logical unit (ALU) 13 for outputting an output voltage value of the ADC when the timing signal is input, and for outputting a result of comparing the output voltage value with an expected value to the pattern generator as a PASS/FAIL signal; an address counter 14 for updating an address value to be output when the clock signal is input; and a history memory for storing a measurement value in an address indicated by the address value when the write-in signal is input. This configuration makes it possible to measure each voltage value output from the DUT for a test pattern corresponding each AD start signal.
Abstract:
A closed loop-like measuring passage is provided with two openings at symmetrical positions, and a sample gas is introduced through on opening into the passage and discharged therefrom through the other opening. A bypass pipe is connected to the measuring passage midway therealong, and a stable purge gas of known composition is introduced into the pipe from the center thereof. A magnetic field is generated in one of the two connecting portions between the bypass pipe and the measuring passage, and the oxygen gas attracting action of the field results in a change in the ratio of the split of the purge gas stream introduced into the bypass pipe and split into two streams. This change is detected by a pair of purge gas stream detecting sensors provided inside the bypass pipe symmetrically with respect to the portion through which the purge gas is introduced, and the thus detected signals are processed to obtain the difference between them which gives the oxygen gas concentration in the sample gas.
Abstract:
An operation of presetting plate cylinder for automatic registration is carried out in a manner that rotational phase, lateral and twist errors of each plate cylinder are corrected by conventional means and then delamination errors are corrected on the basis of values calculated by using functional expressions concerning statistics. In order to carry out the operation, an apparatus for presetting plate cylinders has register error correcting means, control means for operating the delamination errors and a delamination error correcting means.
Abstract:
An ink fountain has at least one position display means for displaying the position of each ductor blade piece to be preset before printing and at least one position indicating means for indicating an actual position of the blade piece. A gap between the distal end of the blade piece and the surface of an ink fountain roller is adjusted in such a manner that the actual position of the blade piece is registered with the position, to be preset, of the blade piece by operating an adjusting member.
Abstract:
A system for automatically removing dust from a plate cylinder of a printing press has a laminated structure for inputting a dust removal position, which comprises (a) a printed circuit substrate bearing thereon a reference signal input circuit of comb form with numerous comb conductors and position signal read-out circuits alternatively interposed respectively between adjacent pairs of comb conductors and (b) a pressure-activated conductor sheet superposed in laminated state on and over the circuit substrate. When a printed material having a printing defect due to dust on the printing plate is laid over with correct register on this laminated structure, and the part of the defect is pressed, the nearest conductors of the input circuit and of the read-out circuit are shorted to designate the position of the defect. The resulting signal is processed and is sent to a dust removing mechanism to move a disk-shaped elastic dust removing head to the corresponding dust existing part of the printing plate. The head is revolvable through small increments of angle to present new dust removing parts of its periphery for each dust removing action.
Abstract:
A calibration method is disclosed for a device in which an offset printing plate is optically scanned to measure the picture pattern area of the printing plate from the quantity of light reflected therefrom in which average values are obtained by scanning the printing plate plural times. The maximum and minimum of the average values are selected respectively as the quantity of light reflected from the non-printing-image region of the printing plate and as the quantity of light reflected from the printing image region of the printing plate in order to perform the calibration.
Abstract:
An image reading apparatus used for an image forming apparatus that is coupled therewith and that has a main controller which performs control of the image forming apparatus includes an image reading unit, a detector, and a communication controller. The image reading unit reads an image formed on a document. The detector detects a state of the image reading unit. The communication controller connects to the main controller, the detector, and a communication line. Power is supplied to the detector and the communication controller in both a first operating state, in which supply of power to the main controller is stopped, and a second operating state, in which power is supplied to the main controller. The detector transmits a detection signal to the communication controller in the first operating state, and transmits the detection signal to the main controller in the second operating state.
Abstract:
A method for evaluating semiconductor layers includes irradiating semiconductor layers on a substrate with light; measuring an optical spectrum peculiar to excitons in the semiconductor layers; and analyzing a broadening factor of optical spectral features of the optical spectrum. The method provides a quick measurement of a surface state of the semiconductor layers with high accuracy.
Abstract:
A semiconductor device comprises an AlN layer, a GaN layer, and an AlGaN layer sequentially formed on a semiconductor substrate. A first opening extends through said GaN layer and said AlGaN layer and exposes part of an upper surface of the AlN layer. A second opening extends through the semiconductor substrate and exposes a part of a lower surface of the AlN layer, in a location facing the first opening. A upper electrode is exposed on an upper surface of the AlN layer in the first opening; and a lower electrode is disposed on a lower surface of the AlN layer in the second opening.