Optical measuring method for semiconductor multiple layer structures and apparatus therefor
    21.
    发明申请
    Optical measuring method for semiconductor multiple layer structures and apparatus therefor 有权
    半导体多层结构的光学测量方法及其设备

    公开(公告)号:US20050099623A1

    公开(公告)日:2005-05-12

    申请号:US10642184

    申请日:2003-08-18

    Abstract: In a measuring apparatus for a semiconductor multiple layer structure, a spectrometer disperses light from a sample for measurement of the photoluminescence spectrum or disperses probe light to irradiate the sample for the measurement of the reflection spectrum. A controller makes a guide member guide the white light to the spectrometer and acquire electric signals from a first detector for the measurement of the reflection spectrum, and makes the guide member guide the light from the spectrometer to a second detector to acquire electric signals for the measurement of the photoluminescence spectrum.

    Abstract translation: 在半导体多层结构的测量装置中,光谱仪从用于测量光致发光光谱的样品中分散光,或者分散探针光以照射样品用于测量反射光谱。 控制器使引导构件将白光引导到光谱仪,并从第一检测器获取用于测量反射光谱的电信号,并且使引导构件将来自光谱仪的光引导到第二检测器,以获取电信号 测量光致发光光谱。

    DC testing apparatus and semiconductor testing apparatus
    22.
    发明授权
    DC testing apparatus and semiconductor testing apparatus 失效
    直流试验装置及半导体检测装置

    公开(公告)号:US06683470B2

    公开(公告)日:2004-01-27

    申请号:US10111621

    申请日:2002-04-26

    Applicant: Hideo Takeuchi

    Inventor: Hideo Takeuchi

    CPC classification number: G11C29/56 G11C2029/5004 G11C2029/5606

    Abstract: The apparatus includes: a sequencer 11 for outputting a start signal, a timing signal, a write-in signal, and a clock signal sequentially, when an AD start signal is input; an ADC 12 for measuring an output of a device under test (DUT) 3 to which a test pattern is input, when the start signal is input; an arithmetic/logical unit (ALU) 13 for outputting an output voltage value of the ADC when the timing signal is input, and for outputting a result of comparing the output voltage value with an expected value to the pattern generator as a PASS/FAIL signal; an address counter 14 for updating an address value to be output when the clock signal is input; and a history memory for storing a measurement value in an address indicated by the address value when the write-in signal is input. This configuration makes it possible to measure each voltage value output from the DUT for a test pattern corresponding each AD start signal.

    Abstract translation: 该装置包括:定时器11,用于当输入AD开始信号时,顺序地输出开始信号,定时信号,写入信号和时钟信号; 当输入起始信号时,用于测量输入测试图案的被测器件(DUT)3的输出的ADC12; 用于在输入定时信号时输出ADC的输出电压值的算术/逻辑单元(ALU)13,并将用于将输出电压值与预期值进行比较的结果作为PASS / FAIL信号输出到模式发生器 ; 地址计数器14,用于更新输入时钟信号时要输出的地址值; 以及历史存储器,用于在输入写入信号时将测量值存储在由地址值指示的地址中。 该配置使得可以测量对应于每个AD启动信号的测试图案从DUT输出的每个电压值。

    Paramagnetic oxygen analyzer
    23.
    发明授权
    Paramagnetic oxygen analyzer 失效
    顺磁氧分析仪

    公开(公告)号:US4860574A

    公开(公告)日:1989-08-29

    申请号:US209431

    申请日:1988-06-21

    CPC classification number: G01N27/74

    Abstract: A closed loop-like measuring passage is provided with two openings at symmetrical positions, and a sample gas is introduced through on opening into the passage and discharged therefrom through the other opening. A bypass pipe is connected to the measuring passage midway therealong, and a stable purge gas of known composition is introduced into the pipe from the center thereof. A magnetic field is generated in one of the two connecting portions between the bypass pipe and the measuring passage, and the oxygen gas attracting action of the field results in a change in the ratio of the split of the purge gas stream introduced into the bypass pipe and split into two streams. This change is detected by a pair of purge gas stream detecting sensors provided inside the bypass pipe symmetrically with respect to the portion through which the purge gas is introduced, and the thus detected signals are processed to obtain the difference between them which gives the oxygen gas concentration in the sample gas.

    Abstract translation: 闭环状测量通道在对称位置处设置有两个开口,并且样品气体通过开口引入通道并通过另一个开口从其中排出。 旁通管在其中途连接到测量通道,并且将已知组合物的稳定的吹扫气体从其中心引入到管道中。 在旁通管和测量通道之间的两个连接部分中的一个中产生磁场,并且该场的氧气吸引作用导致引入旁通管的吹扫气流的分流比的变化 并分成两个流。 该变化通过设置在旁通管内部的一对吹扫气体流检测传感器来检测,该检测传感器相对于引入吹扫气体的部分对称地被对称地处理,并且将这些检测到的信号进行处理以获得它们之间的差异, 样品气体中的浓度。

    Method of presetting plate cylinders for registering in an offset
printing press
    24.
    发明授权
    Method of presetting plate cylinders for registering in an offset printing press 失效
    在胶版印刷机中预先注册印版滚筒的方法

    公开(公告)号:US4694749A

    公开(公告)日:1987-09-22

    申请号:US793790

    申请日:1985-11-01

    CPC classification number: B41F13/12 B41P2233/13

    Abstract: An operation of presetting plate cylinder for automatic registration is carried out in a manner that rotational phase, lateral and twist errors of each plate cylinder are corrected by conventional means and then delamination errors are corrected on the basis of values calculated by using functional expressions concerning statistics. In order to carry out the operation, an apparatus for presetting plate cylinders has register error correcting means, control means for operating the delamination errors and a delamination error correcting means.

    Abstract translation: 以通过常规方法校正每个印版滚筒的旋转相位,横向和扭转误差的方式执行用于自动对准的预置印版滚筒的操作,然后基于通过使用关于统计的功能表达式计算的值来校正分层错误 。 为了执行操作,用于预设印版滚筒的装置具有记录误差校正装置,用于操作分层错误的控制装置和分层错误校正装置。

    Method for adjusting an ink fountain in a printing press and ink
fountains
    25.
    发明授权
    Method for adjusting an ink fountain in a printing press and ink fountains 失效
    用于调整印刷机和墨水喷泉中的墨斗的方法

    公开(公告)号:US4607571A

    公开(公告)日:1986-08-26

    申请号:US561993

    申请日:1983-12-16

    CPC classification number: B41F33/00 B41F31/045 B41F33/0027

    Abstract: An ink fountain has at least one position display means for displaying the position of each ductor blade piece to be preset before printing and at least one position indicating means for indicating an actual position of the blade piece. A gap between the distal end of the blade piece and the surface of an ink fountain roller is adjusted in such a manner that the actual position of the blade piece is registered with the position, to be preset, of the blade piece by operating an adjusting member.

    Abstract translation: 墨斗具有至少一个位置显示装置,用于在打印之前显示要预设的每个导叶片的位置,以及至少一个位置指示装置,用于指示刀片的实际位置。 叶片的远端与墨斗辊的表面之间的间隙被调节成使得叶片的实际位置通过操作调节件被配置在叶片的预定位置上 会员。

    System for automatically removing dust from plate cylinders of printing
press
    26.
    发明授权
    System for automatically removing dust from plate cylinders of printing press 失效
    用于自动清除印刷机印版滚筒上的灰尘的系统

    公开(公告)号:US4499827A

    公开(公告)日:1985-02-19

    申请号:US590205

    申请日:1984-03-15

    CPC classification number: B41F35/02

    Abstract: A system for automatically removing dust from a plate cylinder of a printing press has a laminated structure for inputting a dust removal position, which comprises (a) a printed circuit substrate bearing thereon a reference signal input circuit of comb form with numerous comb conductors and position signal read-out circuits alternatively interposed respectively between adjacent pairs of comb conductors and (b) a pressure-activated conductor sheet superposed in laminated state on and over the circuit substrate. When a printed material having a printing defect due to dust on the printing plate is laid over with correct register on this laminated structure, and the part of the defect is pressed, the nearest conductors of the input circuit and of the read-out circuit are shorted to designate the position of the defect. The resulting signal is processed and is sent to a dust removing mechanism to move a disk-shaped elastic dust removing head to the corresponding dust existing part of the printing plate. The head is revolvable through small increments of angle to present new dust removing parts of its periphery for each dust removing action.

    Abstract translation: 一种用于自动除去印刷机的印版滚筒上的灰尘的系统具有用于输入除尘位置的层压结构,该层叠结构包括(a)印刷电路基板,其上具有梳状形式的参考信号输入电路,其具有多个梳状导体和位置 信号读出电路分别交替地插入在相邻的梳状导体对之间,和(b)叠层状态的叠层状态的电路基板上的压力激活导体片。 当在该层压结构上布置具有印刷板上灰尘的打印缺陷的打印材料,并且该缺陷部分被按压时,输入电路和读出电路的最近的导体是 短路以指定缺陷的位置。 所得到的信号被处理并被送到除尘机构,以将盘形弹性除尘头移动到印版的相应灰尘存在部分。 头部可以通过小角度旋转,以便为每个除尘动作提供其周边的新除尘部件。

    Calibration method for printing plate picture pattern area meter
    27.
    发明授权
    Calibration method for printing plate picture pattern area meter 失效
    印版图案区域仪的校准方法

    公开(公告)号:US4441819A

    公开(公告)日:1984-04-10

    申请号:US311603

    申请日:1981-10-15

    CPC classification number: B41F33/0027

    Abstract: A calibration method is disclosed for a device in which an offset printing plate is optically scanned to measure the picture pattern area of the printing plate from the quantity of light reflected therefrom in which average values are obtained by scanning the printing plate plural times. The maximum and minimum of the average values are selected respectively as the quantity of light reflected from the non-printing-image region of the printing plate and as the quantity of light reflected from the printing image region of the printing plate in order to perform the calibration.

    Abstract translation: 公开了一种校准方法,其中光学扫描胶版印刷版从其反射的光量测量印版的图案区域,其中通过多次扫描印版获得平均值。 分别选择平均值的最大值和最小值作为从印刷版的非印刷图像区域反射的光量和作为从印刷版的印刷图像区域反射的光量来执行 校准。

    Image reading apparatus, control apparatus and method, and computer readable medium storing program for implementing a power saving technique
    28.
    发明授权
    Image reading apparatus, control apparatus and method, and computer readable medium storing program for implementing a power saving technique 有权
    图像读取装置,控制装置和方法以及用于实现省电技术的计算机可读介质存储程序

    公开(公告)号:US09083835B2

    公开(公告)日:2015-07-14

    申请号:US13092644

    申请日:2011-04-22

    Applicant: Hideo Takeuchi

    Inventor: Hideo Takeuchi

    CPC classification number: H04N1/00888 H04N1/00904

    Abstract: An image reading apparatus used for an image forming apparatus that is coupled therewith and that has a main controller which performs control of the image forming apparatus includes an image reading unit, a detector, and a communication controller. The image reading unit reads an image formed on a document. The detector detects a state of the image reading unit. The communication controller connects to the main controller, the detector, and a communication line. Power is supplied to the detector and the communication controller in both a first operating state, in which supply of power to the main controller is stopped, and a second operating state, in which power is supplied to the main controller. The detector transmits a detection signal to the communication controller in the first operating state, and transmits the detection signal to the main controller in the second operating state.

    Abstract translation: 用于与其耦合的图像形成装置的图像读取装置,并且具有执行图像形成装置的控制的主控制器包括图像读取单元,检测器和通信控制器。 图像读取单元读取在文档上形成的图像。 检测器检测图像读取单元的状态。 通信控制器连接到主控制器,检测器和通信线路。 在主控制器的供电停止的第一操作状态和向主控制器供电的第二操作状态下,向检测器和通信控制器供电。 检测器在第一操作状态下向通信控制器发送检测信号,并且在第二操作状态下将检测信号发送到主控制器。

    Method and apparatus for evaluating semiconductor layers
    29.
    发明授权
    Method and apparatus for evaluating semiconductor layers 有权
    用于评估半导体层的方法和装置

    公开(公告)号:US07656514B2

    公开(公告)日:2010-02-02

    申请号:US11486271

    申请日:2006-07-14

    CPC classification number: G01N21/31

    Abstract: A method for evaluating semiconductor layers includes irradiating semiconductor layers on a substrate with light; measuring an optical spectrum peculiar to excitons in the semiconductor layers; and analyzing a broadening factor of optical spectral features of the optical spectrum. The method provides a quick measurement of a surface state of the semiconductor layers with high accuracy.

    Abstract translation: 半导体层的评价方法包括用光照射基板上的半导体层; 测量半导体层中激子特有的光谱; 并分析光谱的光谱特征的拓宽因子。 该方法以高精度快速测量半导体层的表面状态。

    SEMICONDUCTOR DEVICE
    30.
    发明申请
    SEMICONDUCTOR DEVICE 有权
    半导体器件

    公开(公告)号:US20090218578A1

    公开(公告)日:2009-09-03

    申请号:US12143053

    申请日:2008-06-20

    CPC classification number: H01L27/0733 H01L28/40 H01L29/778

    Abstract: A semiconductor device comprises an AlN layer, a GaN layer, and an AlGaN layer sequentially formed on a semiconductor substrate. A first opening extends through said GaN layer and said AlGaN layer and exposes part of an upper surface of the AlN layer. A second opening extends through the semiconductor substrate and exposes a part of a lower surface of the AlN layer, in a location facing the first opening. A upper electrode is exposed on an upper surface of the AlN layer in the first opening; and a lower electrode is disposed on a lower surface of the AlN layer in the second opening.

    Abstract translation: 半导体器件包括依次形成在半导体衬底上的AlN层,GaN层和AlGaN层。 第一开口延伸穿过所述GaN层和所述AlGaN层并暴露AlN层的上表面的一部分。 第二开口延伸穿过半导体衬底并且在面向第一开口的位置中暴露AlN层的下表面的一部分。 上电极暴露在第一开口中的AlN层的上表面上; 并且下电极设置在第二开口中的AlN层的下表面上。

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