Abstract:
A terahertz wave generating module includes a bidirectional light source which provides a first dual-mode beam in a first direction and a second dual-mode beam in a second direction; a forward lens unit which focuses the first dual-mode beam; a photomixer unit which converts the first dual-mode beam focused by the forward lens unit into a terahertz wave; a backward lens unit which focuses the second dual-mode beam; and a light output unit which uses the second dual-mode beam focused by the backward lens unit as a light signal, wherein the bidirectional light source, the forward lens unit, the photomixer unit, the backward lens unit, and the light output unit are integrated in a housing.
Abstract:
Disclosed is a phase shift measuring device, which includes a dual mode laser including a first beat light source generating a first beating signal and a second beat light source generating a second beating signal, and that outputs a dual mode signal including the first beating signal and the second beating signal, a first splitter that receives the dual mode signal to generate a first branch signal and a second branch signal, the first branch signal and the second branch signal being including the branched first beating signal and the branched second beating signal, respectively, a phase control unit that receives the first branch signal and to generate a combined signal, a transmitting end that receives the combined signal from the phase control unit and generates a transmission signal based on the combined signal, and a receiving end.
Abstract:
The inventive concept relates to an apparatus for inspecting shoes and a method for inspecting shoes, and the apparatus includes an inspection unit configured to accommodate an inspection subject, a transmission unit configured to emit electromagnetic waves toward the inspection subject accommodated in the inspection unit, a reception unit configured to receive the electromagnetic wave reflected from the inspection subject, an injection unit configured to inject a fluid toward a bottom part of the inspection subject accommodated in the inspection unit, a suction unit configured to suction a material separated from the bottom part of the inspection subject together with the fluid, and an analysis unit configured to analyze a component of the material introduced into the suction unit and the electromagnetic wave received by the reception unit.
Abstract:
Disclosed is a terahertz wave generating apparatus. The terahertz wave generating apparatus includes a dual mode laser including a first single mode laser that generates a first beating signal, a gain adjustment region that modulates the first beating signal, and a second single mode laser that generates a second beating signal, and a photomixer that mixes the modulated first beating signal and the second beating signal, and that modulates a current supplied based on a beating frequency of the mixed beating signals to generate a terahertz wave signal, and the gain adjustment region is formed between the first single mode laser and the second single mode laser, and the first beating signal is output from the first single mode laser to the gain adjustment region and is modulated based on a reverse bias voltage supplied to the gain adjustment region.
Abstract:
A measurement apparatus for measuring a coating amount of a slurry according to the present disclosure includes a light emitter configured to irradiate terahertz wave onto a release paper coated with the slurry, a light receiver configured to receive the terahertz wave, which is irradiated from the light emitter and passes through the release paper coated with the slurry, to obtain a power of the terahertz wave, and a calculating part configured to calculate a thickness of an electrode, formed from the slurry applied to the release paper, based on the power of the terahertz wave received by the light receiver.
Abstract:
A Schottky barrier diode includes a substrate, a first semiconductor layer formed on the substrate, a second semiconductor layer formed on the first semiconductor layer, and a metal layer formed on the second semiconductor layer to form a Schottky barrier, wherein the first semiconductor layer and the second semiconductor layer are formed of different materials, and a conduction band offset between the first semiconductor layer and the second semiconductor layer is less than a set value.
Abstract:
Disclosed is a photomixer for generating and detecting a terahertz continuous wave, including: an optical conductor to which beating light is incident; and a plurality of antenna feeding electrodes formed on both side surfaces of the optical conductor, and configured to receive a current of a terahertz frequency.
Abstract:
A contactless thickness measuring apparatus is provided which includes an terahertz transmitter configured to receive the first optical path signal from the coupler and to generate a terahertz continuous wave using the first optical signal and an applied bias; an optical delay line configured to delay the second optical path signal output from the coupler; and an terahertz receiver configured to receive the terahertz continuous wave penetrating a sample and to detect an optical current using the terahertz continuous wave and the second optical path signal delayed. A thickness of the sample is a value corresponding to the optical current which phase value becomes a constant regardless of a plurality of measurement frequencies.