Abstract:
The disclosure is directed to precise measurement of out-of-plane birefringence properties of samples of transparent optical material. Two angled-apart light beams are passed through a selected location of a sample optical element. One of the beams is incident to the sample surface. The characteristics of the beams are detected after passing through the sample, and the information detected is processed to determine the out-of-plane birefringence.
Abstract:
Improving the throughput of systems for measuring birefringence of optical samples includes techniques for directing multiple beams through the photoelastic modulator component of the system so that, along with expanded detection mechanisms to accommodate the multiple beams, the heretofore scanning (via a single beam) of a line across the sample is considerably enlarged so that several lines covering a “swath” of the sample area is scanned by the system of the present invention.
Abstract:
A system for controlling a light beam in an optical setup includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary detector. A lens is selectively movable into the path of the light beam for spreading the beam in instances where the path of the beam is altered by the sample between the source and the stationary detector. The detector, therefore, is held stationary. Adjustment mechanisms are provided for increasing the intensity characteristic of the light that reaches the detector to account for a decrease in intensity that occurs when the lens is in the path of the light beam to spread the beam.
Abstract:
A method of controlling a light beam in an optical system includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary detector. The method includes the step selectively moving a lens into the path of the light beam for spreading the beam in instances where the path of the beam is altered by the sample between the source and the stationary detector The detector, therefore, is held stationary. Adjustment means are provided for increasing the intensity characteristic of the light that reaches the detector to account for a decrease in intensity that occurs when the lens is in the path of the light beam to spread the beam.
Abstract:
A system for measuring linear or circular diattenuation in an optical element includes a sample rotation stage for securing an optical element sample; a light source module for generating a source light beam and a detector module. The light source module and detector module are arranged with the sample rotation stage between them, thereby permitting the source light beam to propagate through a sample that may be secured in the sample stage and to the detector module. Linear motion control of the light source module and the detector module, as well as tilt control of the light source module, the sample rotation stage and the detector module is provided, thereby to facilitate detection, by the detector module of the modulated light intensity information corresponding to a diattenuation characteristic of the optical sample secured in the sample stage.
Abstract:
An outer case of a LED module includes a top case and a bottom case to receive the LED module therebetween. The top case has a plurality of through holes and a plurality of blocks spacedly protruding from an inner side of the top case. The bottom case has a plurality of corresponding clip holes spacedly formed thereat, wherein the blocks are detachably engaged with the clip holes respectively to detachably couple the top case with the bottom case so as to form a cavity therebetween for receiving the LED module at a position that portions of LEDs are protruded through the through holes respectively. Two wire holes are formed at two sides of the top case when the top case is coupled with the bottom case for guiding wires of the LED module extending out of the cavity through the wire holes respectively.
Abstract:
A stabilized high power LED module includes a supporting frame and an illuminating unit. The supporting frame is made of thermal conductive material for radiating heat produced by the illuminating unit. The illuminating unit includes a light circuit supported by the radiating supporting frame, and a plurality of illuminators which are electrically mounted to the light circuit and spacedly aligned along the supporting frame, wherein the light circuit has a voltage regulation preset for the illuminators in series to stabilize a voltage supply of the light circuit for protecting the illuminators.
Abstract:
The amount of gain applied to a photodetector such as a photomultiplier tube (PMT) is limited to an amount that does not cause the applied PMT bias voltage to overdrive, hence damage, the PMT. Techniques for limiting the PMT gain are implemented in a way that does not interfere with the precision with which the PMT gain may be established (by selection of a reference level) below that limited level.
Abstract:
Provided are methods for determining the birefringence level of optical material such as polymeric film. In one embodiment, the method uses a setup of optical components that has known system reference angle. The sample may be a stretched polymeric film that has a fast axis angle that has a predetermined orientation in the sample. The system is operated to align the direction of the fast axis of the sample with the reference angle of the system and to measure the birefringence level at a location of the sample. As one aspect of the invention, embodiments and methods are described for accurately determining birefringence levels across a very wide range and up to tens of thousands of nanometers.
Abstract:
A system and method for precisely measuring low-level linear and circular birefringence properties (retardance and direction) of optical materials (26). The system incorporates a photoelastic modulator (24) for modulating polarized light that is then directed through a sample (26). The beam (“Bi”) propagating from the sample is separated into two parts, with one part (“B1”) having a polarization direction different than the polarization direction of the other beam part (“B2”). These separate beam parts are then processed as distinct channels. Detection mechanisms (32, 50) associated with each channel detect the time varying light intensity corresponding to each of the two parts of the beam. This information is combined for calculating a precise measure of the linear and/or circular retardance induced by the sample, as well as the sample's fast axis orientation and direction of circular retardance.