Abstract:
The present invention provides a small sized wide wave-range spectroscope with a simple structure which requires a short time to measure light for measurement over a wide wavelength spectrum. The small sized wide wave-range spectroscope has a collimator (43) for changing light for measurement (L) transmitted through a slit (41) into collimated light (L0), a plurality of diffraction gratings (44a, 44b) with different grating constants d supported rotatably around a rotational axis in parallel with the incident slit (41) and disposed side by side in the direction of the rotational axis in the optical path of the collimated light (L0), and a diffracted-light focusing members (45a, 45b) for focusing a plurality of diffracted light rays (L1 to L4) provided by the plurality of diffraction gratings (44a, 44b) by which the collimated light (L0) is diffracted, each of the diffracted-light focusing members (45a, 45b) being provided in association with each of the plurality of diffraction gratings (44a, 44b).
Abstract:
A robust, compact spectrometer apparatus for determining respective concentrations or partial pressures of multiple gases in a gas sample with single as well as multiple and even overlapping, absorption or emission spectra that span a wide spectral range.
Abstract:
This invention relates to a practical low cost method and devices which exploits the benefits of several photo-assisted analytical techniques involving controlled light sources. The method comprise the use of a program controlled display (like computer, mobile telephones to TV screens) used as a light source for illuminating a detector specially suited to capture the light interaction with a test environment, allowing to generate distinctive spectra and chemical or biochemical images of the environment. Additionally, the information can be acquired in situ but immediately analyzed on line via internet.
Abstract:
A spectrometer is configured by using a photodetector 1B which comprises a semiconductor substrate 10 having an upper surface 10a, a photodiode array 11 having a plurality of photodiodes 12 aligned on the upper surface 10a of the substrate 10, and a light input section 13 including an opening formed in a predetermined positional relationship to the photodiode array 11; and a main body 2 having a plate portion 20 and support portions 21 and 22 mounted on the substrate 10 of the photodetector 1B. The spectrometer is provided with a lens 23 protruded from a lower face 20b of the plate portion 20 and a planar aberration-reduced blazed reflection diffraction grating 24 provided on an upper face 20a of the plate portion 20 for separating incident light having entered through the light input section 13 and passed through the lens 23 into its spectral components, and configured to detect the spectral components with the photodiode array 11. Thus, a photodetector capable of improving the positioning accuracy of components when it is applied to a spectrometer and the spectrometer using the same are realized.
Abstract:
A compact spectrometer operable in a wavelength range of 4.5 or more microns includes an entrance slit, a collimating mirror, a grating, a focusing mirror and a first focal plane. At least some radiation passing through the slit follows an optical path in which at least some radiation passing through the slit is reflected by the collimating mirror onto the grating, which in turn reflects at least some radiation onto the focusing mirror, which in turn reflects and focuses at least some radiation at a first focal plane and onto the two-dimensional array of detectors. Each column in the two-dimensional array of detectors corresponds to a wavelength in the 4.5 or more micron range. The two-dimensional array includes a plurality of columns that collectively correspond to wavelengths spanning the 4.5 or more micron range, and each adjacent pair of columns in the two-dimensional array of detectors corresponds to two wavelengths that differ by an equal amount. The entrance slit, the collimating mirror, the grating, the focusing mirror and the first focal plane are positioned within a volume that is equal to or less than 192 cubic inches in size.
Abstract:
In a spectrophotometer, the following formula is stored in advance as a correction formula of a rotation angle in a correction formula storing portion; θ′=θ+A•sin (C1•θ+θa)+B•sin (C2•θ+θb)+θc, wherein C1, C2 represent coefficients theoretically determined in advance by a structure of a reduction mechanism, and A, B, θa, θb, θc are coefficients specific to the reduction device which are calculated based on measurement results of a plurality of bright line spectrums through fittings by a coefficient determining portion. In case a sample is measured actually, when a desired wavelength is set, a rotation angle correcting portion corrects a rotation angle θ corresponding to the desired wavelength to calculate θ′ by applying the above-stated correction formula, and then, controls a motor so that a diffraction grid is rotated by the angle θ′.
Abstract:
A hyper-spectral imaging system comprises imaging foreoptics to focus on a scene or object of interest and transfer the image of said scene or object onto the focal plane of a spatial light modulator, a spatial light modulator placed at a focal plane of said imaging foreoptics, an imaging dispersion device disposed to receive an output image of said spatial light modulator, and an image collecting device disposed to receive the output of said imaging dispersion device.
Abstract:
A spectrometer that provides the ability to combine the advantages of high resolution, compactness, ruggedness, and low-power consumption of Fabry-Perot (FP) tunable filter spectrometer, with the multi-channel multiplexing advantage of FT and/or grating/detector array. The key concept is to design and operate a tunable FP filter in a multiple-order condition. This filter is then followed by a “low-resolution” fixed grating, which disperses the filtered n-order signal into a preferably matched N-element detector array for parallel detection. The spectral resolution in this system is determined by the FP filter, which can be designed to have very high resolution. The N-order parallel detection scheme reduces the total integration or scan time by a factor of N to achieve the same signal to noise ratio (SNR) at the same resolution as the single channel tunable filter method. This design is also very flexible, allowing spectrometer systems with appropriate order N to thereby optimize the system performance for spectral resolution and scan integration time. In addition to the significant reduction in scan integration time, there are two other advantages to this approach. The first, because the FP tunable filter is designed and operated under n-orders, the fabrication tolerances of the FP filter cavity and operating conditions are significantly loosened.
Abstract:
A plurality of configurations is simultaneously formed in a material by a single laser beam having a desired distribution pattern of wavelengths. An input laser beam has an initial wavelength distribution pattern. The initial wavelength distribution pattern is adjusted or modified into a desired final wavelength distribution pattern. For example, the initial wavelength distribution pattern is a wide range of wavelengths in a single bell-curve distribution while the desired final wavelength distribution pattern has a specific number of sharp peaks each over a predetermined narrow range. The laser beam having the desired final wavelength distribution pattern is focused upon on a material. Because of the multiple peaks in the wavelength distribution, the laser beam is focused at a plurality of the focal distances. A number of structures is simultaneously formed in a material at the multiple focal points or at multiple locations/depths when the above laser beam is projected onto the material.
Abstract:
An optical reflection device for filtering and spatially positioning individual optical channels or wavelengths. The device includes a plurality of optical members with reflective surfaces and at least one reflective layer located on the reflective surface of each optical member. In addition, the plurality of optical members are interconnected in a manner such that the reflective surfaces are oriented at predetermined slopes with respect to one another. Each reflective layer is configured to reflect a particular wavelength or channel. The plurality of optical members are interconnected in a manner that allows each optical member to reflect an individual channel at a unique angle with respect to the other optical members. This configuration allows the optical reflection device to individually reflect and filter channels that are dispersed from some form of dispersing member, such as a prism or a diffraction grating.