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    Virtual image type double focusing mass spectrometer
    11.
    发明授权
    Virtual image type double focusing mass spectrometer 失效
    虚拟图像双重聚焦质谱仪

    公开(公告)号：US3944827A

    公开(公告)日：1976-03-16

    申请号：US498078

    申请日：1974-08-16

    Applicant: Hisashi Matsuda

    Inventor： Hisashi Matsuda

    IPC: G01N27/62 ,  H01J49/32 ,  H01J39/42

    CPC classification number: H01J49/32

    Abstract: A virtual image type double focusing mass spectrometer having a diverging electrostatic field and a converging magnetic field, wherein parameters related to the fringing effects in the boundaries of said fields and to the distribution of the electrostatic field reduces image aberrations of the second order.

    Abstract translation: 具有发散静电场和会聚磁场的虚像图像双重聚焦质谱仪，其中与所述场的边界中的边缘效应和静电场的分布相关的参数减小了二阶的图像像差。

    Ion microprobe analyser
    12.
    发明授权
    Ion microprobe analyser 失效
    离子微探针分析仪

    公开(公告)号：US3930155A

    公开(公告)日：1975-12-30

    申请号：US43406174

    申请日：1974-01-17

    Applicant: HITACHI LTD

    Inventor： KANOMATA ICHIRO ,  DOI HIROSHI ,  TAMURA HIFUMI

    IPC: G01Q30/02 ,  G01Q30/10 ,  G01Q30/12 ,  H01J37/252 ,  H01J49/14 ,  H01J49/32 ,  H01J37/00

    CPC classification number: H01J49/322 ,  H01J37/252 ,  H01J49/142

    Abstract: An ion microprobe analyser in which a specimen to be analysed is irradiated with primary ions of non-reactive gas and the mass-tocharge ratio and intensity of secondary ions emitted from the specimen are measured for the qualitative and quantitative analysis of elements constituting the specimen. In the analyser, means for directing a reactive gas toward a desired spot on the surface of the specimen to be analysed is provided so as to eliminate serious limitations and undesirable side effects due to the use of the reactive gas atmosphere thereby improving the sensitivity and quantitativity of analysis.

    Abstract translation: 一种离子微探针分析仪，其中待分析样品用非反应性气体的一次离子照射，并且测量从样品发射的二次离子的质荷比和强度，用于定量和定量分析构成 标本。 在分析仪中，提供了将反应性气体引导到待分析试样的表面上的期望点的装置，以消除由于使用反应气体气氛引起的严重限制和不期望的副作用，从而提高灵敏度和定量性 的分析。

    Plural beam mass spectrometer and method of conducting plural beam studies
    13.
    发明授权
    Plural beam mass spectrometer and method of conducting plural beam studies 失效
    多光束质谱仪及其引导方法

    公开(公告)号：US3831026A

    公开(公告)日：1974-08-20

    申请号：US25879372

    申请日：1972-06-01

    Applicant: POWERS P

    Inventor： POWERS P

    IPC: H01J49/06 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32 ,  H01L21/02 ,  H01J39/34

    CPC classification number: H01J49/107 ,  H01J49/06 ,  H01J49/28 ,  H01J49/30 ,  H01J49/326 ,  H01L28/92

    Abstract: Plural ion beams emanating from one or more ion sources are conducted in multiplexed fashion through the magnetic analyzer of a mass spectrometer toward one or more collectors. In one embodiment, the beams traverse spaced paths and are received by separate collectors. In another embodiment, the beams are time division multiplexed along a common path and received by a single collector. The magnetic analyzer may be scanned during operation to simultaneously provide spectra for each of the beams and the mass spectral range of the beams compared.

    Abstract translation: 从一个或多个离子源发出的多个离子束以多种方式通过质谱仪的磁分析仪朝向一个或多个收集器进行。 在一个实施例中，光束横穿间隔开的路径并且由分开的收集器接收。 在另一个实施例中，波束沿着公共路径被时分复用并由单个收集器接收。 可以在操作期间扫描磁分析仪以同时提供每个光束的光谱和所比较的光束的质谱范围。

    Beam correcting device for mass spectrometers and method of operation
    14.
    发明授权
    Beam correcting device for mass spectrometers and method of operation 失效
    用于质谱仪的光束校正装置和操作方法

    公开(公告)号：US3657531A

    公开(公告)日：1972-04-18

    申请号：US3657531D

    申请日：1970-05-15

    Applicant: ASS ELECT IND

    Inventor： EVANS SYDNEY ,  GRAHAM REGINALD

    IPC: G01N27/62 ,  H01J49/06 ,  H01J49/32 ,  H01J39/34

    CPC classification number: H01J49/06 ,  H01J49/326

    Abstract: A beam correcting device which may be utilized with mass spectrometers for altering the configuration of the beam of ions passing through the mass spectrometer. The beam altering device may include at least four electrodes disposed at substantially equal positions around the beam of ions and positioned at substantially a point along the beam at which the beam is of a minimum thickness. An electrical control circuit is coupled to the electrodes for applying at least four electrical signals, each of a predetermined value, to the electrodes to establish an electrostatic field about the beam of ions. By varying the potentials applied to the various electrodes, a beam having an arcuate cross-sectional configuration may be altered to produce a beam having a generally rectangular cross-sectional configuration thereby compensating for the effect on the beam caused by undesirable fringing fields.

    Abstract translation: 光束校正装置，其可与质谱仪一起使用，以改变通过质谱仪的离子束的构型。 光束改变装置可以包括设置在围绕离子束的基本相等的位置处的至少四个电极，并且位于基本上沿着光束的光束处于最小厚度的点处。 电控制电路耦合到电极，用于向电极施加至少四个预定值的电信号，以建立围绕离子束的静电场。 通过改变施加到各种电极的电位，可以改变具有弓形横截面构型的梁，以产生具有大致矩形横截面构造的梁，从而补偿由不期望的边缘场引起的对梁的影响。

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