Abstract:
A digital communications test system and method for testing a plurality of devices under test (DUTs) in which multiple sets of a single vector signal analyzer (VSA) and single vector signal generator (VSG) can be used together to perform error vector magnitude (EVM) measurements for one or more DUTs in parallel, including one or more of composite, switched and multiple input multiple output (MIMO) EVM measurements. This allows N pairs of a VSA and VSG to test N DUTs with N×N MIMO in substantially the sane time as a single VSA and VSG pair can test a single DUT, thereby allowing a substantial increase in testing throughput as compared to that possible with only a single VSA and VSG set.
Abstract:
The present invention discloses a temperature insensitive testing device comprising: a transmission-end test sequence generating circuit to generate a test sequence; a transmission circuit to process the test sequence according to a transmission clock and thereby generate a test signal; a reception circuit to process an echo of the test signal and generate a digital echo signal; a correlation-value generating circuit to generate correlation values including a maximum correlation value according to the test sequence and the digital echo signal; and a decision circuit to determine whether a relation between the maximum correlation value and at least one threshold satisfies a predetermined condition and thereby generate a decision result, wherein the frequency of the transmission clock is lower than a predetermined frequency which confines the variation of the maximum correlation value to a predetermined range provided that the temperature variation of the transmission cable is within a temperature variation range.
Abstract:
Circuitry to facilitate testing of serial interfaces is described. Specifically, some embodiments of the present invention facilitate testing the clock and data recovery functionality of a receiver. A serial interface can include a multiplying phase locked loop (MPLL) clock generator, a transmitter, and a receiver. The MPLL clock generator can generate a first clock signal and a second clock signal, and can vary a phase and/or frequency difference between the first clock signal and the second clock signal. During test, the transmitter and the receiver can be directly or capacitively coupled to each another. Specifically, during test, the serial interface can be configured so that the transmitter transmits data using the first clock signal, and the receiver receives data using the second clock signal. The clock and data recovery functionality of the receiver can be tested by comparing the transmitted data with the received data.
Abstract:
A high-power induction-type power supply system includes a supplying-end module consisting of a supplying-end microprocessor, a power driver unit, a signal analysis circuit, a coil voltage detection circuit, a display unit, a power supplying unit, a resonant circuit and a supplying-end coil, and a receiving-end module consisting of a receiving-end microprocessor, a voltage detection circuit, a rectifier and filter circuit, an amplitude modulation circuit, a protection circuit breaker, a voltage stabilizer circuit, a DC-DC buck converter, a resonant circuit and a receiving-end coil. By means of single bit data analysis to start up power supply, sensing signal transmitting time during standby mode is minimized. Subject to asymmetric data signal data encoding and decoding system to recognize data code, power loss is minimized during synchronous transmission of power supply and data signal, and a high capacity of fault tolerance is achieved.
Abstract:
Methods, systems, and devices are described for calibrating a transmit path of a base station. A calibration symbol of a subframe may be generated for transmission on a downlink channel. The calibration symbol of the subframe may be transmitted. The calibration symbol may include a predefined waveform to calibrate the transmit path of the base station. At least part of the subframe including the calibration symbol may be received through a dedicated feedback receive path. The transmit path may be calibrated based at least in part on the received calibration symbol. The calibration symbols may replace one or more data symbols of the subframe. Control symbols may also be transmitted during the subframe. The control symbols may include reference signals and downlink control channels. The control symbols may signal to a mobile device a zero allocation of downlink resources during the subframe.
Abstract:
Disclosed is a loop-back apparatus in wireless communication systems, including: an MAC processing unit configured to transmit a user data and a control frame when a loop-back mode is established; a loop-back unit configured to generate a response frame of a receipt for the user data and the control message transmitted from the MAC processing unit and again feedbacks the generated response frame to the MAC processing unit.
Abstract:
Prediction of a channel capacity is accomplished based on a TDR echo without explicitly estimating the topology of the line. The prediction is based on obtaining a measured TDR echo, determining a theoretical TDR echo for a plurality of loop lengths, estimating the equivalent TDR length based on an optimization, updating the equivalent TDR length and utilizing the updated TDR length to predict one or more of the upstream and downstream data rates.
Abstract:
An interface for implementing a loopback configuration which offers improved calibration and/or testing of an electronic system is disclosed. More specifically, embodiments provide a bi-directional interface with at least two portions or partitions capable of communicating data in opposite directions and implementing a loopback configuration between components of an electronic system, thereby enabling more flexible, efficient and effective calibration and/or testing of the electronic system using a single interface. The loopback of the partitioned bi-directional interface may be used to perform data link training and/or electronic system testing. In one embodiment, the loopback configuration of the interface may be reversible. Additionally, the looped or coupled end of the partitions may be switched from one component to another, thereby reversing the configuration of the loopback in one embodiment. As such, embodiments enable different and/or additional calibration operations and/or tests to be performed when compared with conventional loopback configurations.
Abstract:
Data associated with at least one building condition or status is sensed by one or more sensors. The data from these sensors may be sent over a data bus and received by the central computer. In addition, a modulated signal may be transmitted by one or both of the transmitters across the data bus. The modulated signal is received at the receiver, which analyzes the received modulated signal, and determines whether an intermittent fault has occurred on the data bus based upon the analyzing. For example, the receiver may compare the received signal to an expected pattern and when a discrepancy exists, an intermittent fault is determined to exist. The receiver may also determine the location of the fault based upon the analysis.
Abstract:
A method for verifying compliance of a communication device with one or more requirement specifications is disclosed. The method comprises establishing a link between a test system and the communication device, wherein the establishing comprises configuring one or more bearers and one or more control channels; closing a test loop comprising the test system and the communication device, wherein the closing comprises activating a test loop function of the communication device; sending data in a downlink of the test loop from the test system to the communication device; receiving the data at the communication device; transferring at least some of the data to an uplink transmission arrangement of the communication device after a specific event has occurred; and verifying, at the test system, transmission in an uplink of the test loop from the communication device to the test system. Corresponding test system and test loop function arrangement are also disclosed.