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公开(公告)号:US20200321216A1
公开(公告)日:2020-10-08
申请号:US16907889
申请日:2020-06-22
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hongfa Luan , Yi-Fan Chen , Chun-Yen Peng , Cheng-Po Chau , Wen-Yu Ku , Huicheng Chang
IPC: H01L21/28 , H01L29/78 , H01L29/66 , H01L21/225 , H01L29/51 , H01L21/306 , H01L21/3105 , H01L21/8234 , H01L29/08 , H01L29/40 , H01L29/423
Abstract: Embodiment described herein provide a thermal treatment process following a high-pressure anneal process to keep hydrogen at an interface between a channel region and a gate dielectric layer in a field effect transistor while removing hydrogen from the bulk portion of the gate dielectric layer. The thermal treatment process can reduce the amount of threshold voltage shift caused by a high-pressure anneal. The high-pressure anneal and the thermal treatment process may be performed any time after formation of the gate dielectric layer, thus, causing no disruption to the existing process flow.
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公开(公告)号:US10283384B2
公开(公告)日:2019-05-07
申请号:US14696973
申请日:2015-04-27
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Manish Kumar Singh , Bo-Wei Chou , Jui-Ming Shih , Wen-Yu Ku , Ping-Jung Huang , Pi-Chun Yu
IPC: H01L21/67 , H01L21/311
Abstract: A method for etching an etch layer formed on a front side of a wafer and a wafer etching apparatus are provided. The wafer etching apparatus includes a first flow channel, a temperature-regulating module, and a second flow channel. The first flow channel is configured to carry a preheated/precooled liquid for controlling a temperature of a wafer. The temperature-regulating module is coupled to the first flow channel. The temperature-regulating module is configured to control a temperature of the liquid in the first flow channel. The second flow channel is configured to carry an etchant for etching an etch layer formed on a front side of the wafer. The method includes: controlling the temperature of the wafer by using the preheated/precooled liquid; and etching the etch layer with the etchant.
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